MENEGHESSO, GAUDENZIO

MENEGHESSO, GAUDENZIO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 1284 (tempo di esecuzione: 0.043 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Changes in the extraction and collection efficiency of GaN-based MQW solar cells under optical step-stress 2025 Nicoletto M.Caria A.Roccato N.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Evidence for double degradation regime in off-state stressed 100 V GaN transistors: From dielectric failure to subthreshold current increase 2025 Fraccaroli R.Fregolent M.Boito M.De Santi C.Canato E.Rossetto I.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Hail Damage Investigation in Heterojunction Silicon Photovoltaic Modules: A Real-World Case Study 2025 Nicoletto M.Caria A.Trivellin N.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + IEEE JOURNAL OF PHOTOVOLTAICS - -
Impact of drain-source leakage on the dynamic Ron of power HEMTs with p-GaN gate 2025 Longato S. L.Favero D.Nardo A.Meneghesso G.Zanoni E.De Santi C.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Interface-related VTH shift of SiC MOSFETs during constant current stress extracted from charge pumping measurements 2025 Marcuzzi A.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Investigating the optical degradation of InAs quantum dot lasers on silicon through combined electro-optical characterization and gain measurements 2025 Zenari M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + JPHYS PHOTONICS - -
Long-term (8000 h) reliability and failures of high-power LEDs for outdoor lighting stressed at high ambient temperatures 2025 Caria A.Fraccaroli R.De Santi C.Buffolo M.Trivellin N.Zanoni E.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
OFF-state breakdown and threshold voltage stability of vertical GaN-on-Si trench MOSFETs 2025 Fregolent M.Favero D.De Santi C.Cester A.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Recoverable degradation of FAPbBr3 perovskite solar cells under reverse-bias: A combined electro-optical investigation 2025 Tormena N.Caria A.Buffolo M.De Santi C.Cester A.Meneghesso G.Zanoni E.Trivellin N.Meneghini M. + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Self-Induced Photoionization of Traps in Buffer-Free AlGaN/GaN HEMTs 2025 De Pieri F.Fornasier M.Gao Z.Fregolent M.De Santi C.Rampazzo F.Meneghesso G.Meneghini M.Zanoni E. + IEEE ELECTRON DEVICE LETTERS - -
Solid State Lighting Systems for horticulture: Impact of LED degradation on light spectrum and intensity 2025 Trivellin N.De Santi C.Meneghesso G.Buffolo M.Zanoni E.Caria A.Fraccaroli R.Meneghini M. + IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results 2024 Fregolent, ManuelPiva, FrancescoBuffolo, MatteoSanti, Carlo DeCester, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Ageing effects on optical power characteristics and defects in SQW UV-C LEDs 2024 F. PivaM. BuffoloM. PilatiN. RoccatoS. LongatoC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the GaN Marathon 2024
ANALYSIS OF REVERSE-BIAS STABILITY OF FAPbBr3 SEMI-TRANSPARENT PEROVSKITE SOLAR CELLS 2024 Noah TormenaAlessandro CariaMatteo BuffoloCarlo De SantiNicola TrivellinAndrea CesterGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the the 41st European Photovoltaic Solar Energy Conference
Antimony selenide solar cells: non-ideal deep level response and study of trap-filling transients 2024 De Santi, CarloBarrantes, Jessica Jazmine NicolePiva, FrancescoCaria, AlessandroBuffolo, MatteoTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of the SPIE Photonics West 2024
Catastrophic degradation of LEDs: failure analysis and perspective 2024 N. TrivellinA. CariaF. PivaM. BuffoloC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the IEEE LS24 Sustainable Smart Lighting Conference
Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements 2024 Marcuzzi, A.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM 2024 PROCEEDINGS
Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobility Transistors: Toward Zero Dispersion Effects 2024 Saro, Marcode Pieri, FrancescoCarlotto, AndreaFornasier, MirkoRampazzo, FabianaDe Santi, CarloMeneghesso, GaudenzioMeneghini, MatteoZanoni, EnricoBisi, Davide + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM 2024 PROCEEDINGS
Defects, performance, and reliability in UVC LEDs 2024 Meneghini, MatteoRoccato, NicolaPiva, FrancescoPilati, MarcoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proceedings of the SPIE Photonics West 2024
Degradation Mechanisms in High-Power LEDs: Thermal Analysis of Failure Modes 2024 Nicola TrivellinAlessandro CariaRiccardo FraccaroliCarlo De SantiMatteo BuffoloEnrico ZanoniGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of Therminic 2024 workshop