DE SANTI, CARLO

DE SANTI, CARLO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Hail Damage Investigation in Heterojunction Silicon Photovoltaic Modules: A Real-World Case Study 2025 Nicoletto M.Caria A.Trivellin N.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + IEEE JOURNAL OF PHOTOVOLTAICS - -
Recoverable degradation of FAPbBr3 perovskite solar cells under reverse-bias: A combined electro-optical investigation 2025 Tormena N.Caria A.Buffolo M.De Santi C.Cester A.Meneghesso G.Zanoni E.Trivellin N.Meneghini M. + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results 2024 Fregolent, ManuelPiva, FrancescoBuffolo, MatteoSanti, Carlo DeCester, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Ageing effects on optical power characteristics and defects in SQW UV-C LEDs 2024 F. PivaM. BuffoloM. PilatiN. RoccatoS. LongatoC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the GaN Marathon 2024
ANALYSIS OF REVERSE-BIAS STABILITY OF FAPbBr3 SEMI-TRANSPARENT PEROVSKITE SOLAR CELLS 2024 Noah TormenaAlessandro CariaMatteo BuffoloCarlo De SantiNicola TrivellinAndrea CesterGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the the 41st European Photovoltaic Solar Energy Conference
Antimony selenide solar cells: non-ideal deep level response and study of trap-filling transients 2024 De Santi, CarloBarrantes, Jessica Jazmine NicolePiva, FrancescoCaria, AlessandroBuffolo, MatteoTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of the SPIE Photonics West 2024
Catastrophic degradation of LEDs: failure analysis and perspective 2024 N. TrivellinA. CariaF. PivaM. BuffoloC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the IEEE LS24 Sustainable Smart Lighting Conference
Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements 2024 Marcuzzi, A.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM 2024 PROCEEDINGS
Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobility Transistors: Toward Zero Dispersion Effects 2024 Saro, Marcode Pieri, FrancescoCarlotto, AndreaFornasier, MirkoRampazzo, FabianaDe Santi, CarloMeneghesso, GaudenzioMeneghini, MatteoZanoni, EnricoBisi, Davide + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM 2024 PROCEEDINGS
Defects, performance, and reliability in UVC LEDs 2024 Meneghini, MatteoRoccato, NicolaPiva, FrancescoPilati, MarcoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proceedings of the SPIE Photonics West 2024
Degradation Mechanisms in High-Power LEDs: Thermal Analysis of Failure Modes 2024 Nicola TrivellinAlessandro CariaRiccardo FraccaroliCarlo De SantiMatteo BuffoloEnrico ZanoniGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of Therminic 2024 workshop
Degradation of 1.3 μm Quantum Dot Laser Diodes for silicon photonics: dependence on the number of dot-in-a-well layers 2024 Zenari, MicheleBuffolo, MatteoDe Santi, CarloMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS - -
Degradation Physics of UV LEDs: from experimental data to models 2024 Matteo MeneghiniNicola RoccatoFrancesco PivaMarco PilatiCarlo De SantiMatteo BuffoloNicola TrivellinGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the 7th International Workshop on Ultraviolet Materials and Devices 2024
Dynamic phenomena in 650V p-GaN technology 2024 A. NardoD. FaveroS. LongatoC. De SantiM. Meneghini + - - Proceedings of the GaN Marathon 2024
Effect of High Monochromatic Radiation on the Electrical Performance of CIGS Solar Cell 2024 Casu, C.Buffolo, M.Caria, A.De Santi, C.Trivellin, N.Cester, A.Meneghesso, G.Zanoni, E.Meneghini, M. + IEEE JOURNAL OF PHOTOVOLTAICS - -
Experimental and Numerical Analysis of OFFState Bias Induced Instabilities in Vertical GaNon-Si Trench MOSFETs 2024 Fregolent, ManuelFavero, DavideDe Santi, CarloMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON POWER ELECTRONICS - -
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Impact of the oxide aperture width on the degradation of 845 nm VCSELs for silicon photonics 2024 Zenari, MicheleBuffolo, MatteoRampazzo, FabianaDe Santi, CarloRossi, FrancescaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS - -
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 2024 Nicoletto, MarcoCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING PROCEEDINGS OF SPIE PHOTONICS WEST 2024
Investigation and modeling of the role of interface defects in the optical degradation of InGaN/GaN LEDs 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoSanti, Carlo DeTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -