ROCCATO, NICOLA

ROCCATO, NICOLA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 37 (tempo di esecuzione: 0.046 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Changes in the extraction and collection efficiency of GaN-based MQW solar cells under optical step-stress 2025 Nicoletto M.Caria A.Roccato N.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Ageing effects on optical power characteristics and defects in SQW UV-C LEDs 2024 F. PivaM. BuffoloM. PilatiN. RoccatoS. LongatoC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the GaN Marathon 2024
Defects, performance, and reliability in UVC LEDs 2024 Meneghini, MatteoRoccato, NicolaPiva, FrancescoPilati, MarcoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proceedings of the SPIE Photonics West 2024
Degradation Physics of UV LEDs: from experimental data to models 2024 Matteo MeneghiniNicola RoccatoFrancesco PivaMarco PilatiCarlo De SantiMatteo BuffoloNicola TrivellinGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the 7th International Workshop on Ultraviolet Materials and Devices 2024
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Investigation and modeling of the role of interface defects in the optical degradation of InGaN/GaN LEDs 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoSanti, Carlo DeTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Investigation of degradation dynamics of 265 nm LEDs assisted by EL measurements and numerical simulations 2024 Piva, FrancescoBuffolo, MatteoRoccato, NicolaPilati, MarcoLongato, SimoneSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs 2024 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE PHOTONICS JOURNAL - -
Modeling the degradation mechanisms of UV-C LEDs 2024 Nicola RoccatoFrancesco PivaCarlo De SantiMatteo BuffoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the GaN Marathon 2024
Modeling the optical degradation kinetics of UV-C LEDs 2024 N. RoccatoF. PivaC. De SantiM. BuffoloN. TrivellinG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of 2024 E-MRS fall meeting
Optical Power Degradation Related to Turn-On in Commercial 265 nm UV-C LEDs 2024 Francesco PivaMatteo BuffoloMarco PilatiNicola RoccatoCarlo De SantiNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the 31st IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
Physical processes leading to the degradation of UV-C LEDs and their modeling by defect reactions and numerical simulations 2024 C. De SantiM. BuffoloF. PivaN. RoccatoN. TrivellinG. MeneghessoE. ZanoniM. Meneghini - - Proceedings of the Photonics North 2024
Reliability analysis of high power LEDs for automotive: impact of current and temperature 2024 Alessandro CariaNicola TrivellinRiccardo FraccaroliNicola RoccatoMatteo BuffoloCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini - - Proceedings of ESREF 2024 conference
Reliability and efficiency-limiting mechanisms in III-N LEDs: an experimental analysis assisted by numerical simulations 2024 ROCCATO, NICOLA - - -
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 2023 Piva F.Buffolo M.De Santi C.Pilati M.Roccato N.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Degradation of AlGaN-based UV-C SQW LEDs analyzed by means of capacitance deep-level transient spectroscopy and numerical simulations 2023 Piva F.Pilati M.Buffolo M.Roccato N.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
III-N optoelectronic devices: understanding the physics of electro-optical degradation 2023 Meneghini, MatteoRoccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proc. SPIE 12441, Light-Emitting Devices, Materials, and Applications XXVII
Lifetime limiting degradation mechanisms of state-of-the-art UVC LEDs 2023 Enrico ZanoniFrancesco PivaMatteo BuffoloNicola TrivellinCarlo De SantiNicola RoccatoMarco PilatiGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of MRS fall 2023 conference
Modeling the electrical characteristic and degradation mechanisms of UV-C LEDs 2023 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations 2023 Roccato N.Piva F.De Santi C.Buffolo M.Fregolent M.Pilati M.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -