FRACCAROLI, RICCARDO

FRACCAROLI, RICCARDO  

Università di Padova  

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Risultati 1 - 10 di 10 (tempo di esecuzione: 0.025 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Evidence for double degradation regime in off-state stressed 100 V GaN transistors: From dielectric failure to subthreshold current increase 2025 Fraccaroli R.Fregolent M.Boito M.De Santi C.Canato E.Rossetto I.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Long-term (8000 h) reliability and failures of high-power LEDs for outdoor lighting stressed at high ambient temperatures 2025 Caria A.Fraccaroli R.De Santi C.Buffolo M.Trivellin N.Zanoni E.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Solid State Lighting Systems for horticulture: Impact of LED degradation on light spectrum and intensity 2025 Trivellin N.De Santi C.Meneghesso G.Buffolo M.Zanoni E.Caria A.Fraccaroli R.Meneghini M. + IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
Degradation Mechanisms in High-Power LEDs: Thermal Analysis of Failure Modes 2024 Nicola TrivellinAlessandro CariaRiccardo FraccaroliCarlo De SantiMatteo BuffoloEnrico ZanoniGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of Therminic 2024 workshop
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Reliability analysis of high power LEDs for automotive: impact of current and temperature 2024 Alessandro CariaNicola TrivellinRiccardo FraccaroliNicola RoccatoMatteo BuffoloCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini - - Proceedings of ESREF 2024 conference
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 2024 Caria, AlessandroFraccaroli, RiccardoDe Santi, CarloBuffolo, MatteoTrivellin, NicolaZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo + - - Proceedings of the SPIE Photonics West 2024
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: Role of silicone encapsulant 2023 Caria, A.Fraccaroli, R.De Santi, C.Buffolo, M.Trivellin, N.Zanoni, E.Meneghesso, G.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
On the importance of Fast and Accurate LED Optical and Thermal Characterization: from visible use cases to UV technologies 2023 Trivellin, NicolaRoccato, NicolaPiva, FrancescoBuffolo, MatteoDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo - - Proceedings of the 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Solid State Lighting for horticolture: impact of LED reliability on light spectrum and intensity 2023 Trivellin, NicolaBuffolo, MatteoCaria, AlessandroDe Santi, CarloFraccaroli, RiccardoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18)