FRACCAROLI, RICCARDO

FRACCAROLI, RICCARDO  

Università di Padova  

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Risultati 1 - 17 di 17 (tempo di esecuzione: 0.047 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Experimental Evidence of Sustainable Avalanche Operation in E-Mode GaN HEMTs 2026 Fraccaroli R.Dell'Andrea M.Fregolent M.Boito M.Longato S. L.De Santi C.Rossetto I.Zanoni E.Meneghesso G.Meneghini M. + IEEE ELECTRON DEVICE LETTERS - -
Analysis of extrinsic failure mechanisms of high-power blue, red, and white LEDs for horticulture and street lighting 2025 Caria, AlessandroFraccaroli, RiccardoDe Santi, CarloBuffolo, MatteoTrivellin, NicolaZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo + - PROCEEDINGS OF SPIE Proceedings of SPIE - The International Society for Optical Engineering
Evidence for Avalanche and its Role in Lateral and Vertical Gallium Nitride Devices 2025 C. De SantiR. FraccaroliM. FregolentI. RossettoM. BoitoE. CanatoM. BuffoloG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the International Conference on Materials and Systems for Sustainability 2025 (ICMaSS)
Evidence for Avalanche Operation in Sub-Micrometer Power GaN HEMTs with p-GaN Gate 2025 Fraccaroli, RiccardoDell'Andrea, MatteoFregolent, ManuelBoito, MircoDe Santi, CarloMeneghesso, GaudenzioEleonora CanatoEnrico ZanoniRossetto, IsabellaMeneghini, Matteo + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS IEEE International Reliability Physics Symposium Proceedings
Evidence for double degradation regime in off-state stressed 100 V GaN transistors: From dielectric failure to subthreshold current increase 2025 Fraccaroli R.Fregolent M.Boito M.De Santi C.Canato E.Rossetto I.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Experimental Demonstration of Avalanche operation in lateral normally-off 100 V GaN HEMTs 2025 Riccardo FraccaroliMatteo Dell’AndreaManuel FregolentMirco BoitoIsabella RossettoCarlo De SantiGaudenzio MeneghessoEnrico ZanoniEleonora CanatoMatteo Meneghini + - - Proceedings of the 15th International Conference on Nitride Semiconductors
Extrinsic Failure of High-Power Blue LEDs for Horticulture Applications Stressed in Hot Environments 2025 Caria A.Fraccaroli R.De Santi C.Buffolo M.Trivellin N.Zanoni E.Meneghesso G.Meneghini M. + - - Proceedings of the 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
GaN Devices: Technology, Reliability-Limiting Processes and ESD Failures 2025 M. MeneghiniS. LongatoM. FregolentR. FraccaroliI. RossettoC. De SantiM. BuffoloG. MeneghessoE. Zanoni - - Proceedings of the 47th Annual EOS/ESD Symposium 2025
Long-term (8000 h) reliability and failures of high-power LEDs for outdoor lighting stressed at high ambient temperatures 2025 Caria A.Fraccaroli R.De Santi C.Buffolo M.Trivellin N.Zanoni E.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Solid State Lighting Systems for horticulture: Impact of LED degradation on light spectrum and intensity 2025 Trivellin N.De Santi C.Meneghesso G.Buffolo M.Zanoni E.Caria A.Fraccaroli R.Meneghini M. + IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
Degradation Mechanisms in High-Power LEDs: Thermal Analysis of Failure Modes 2024 Nicola TrivellinAlessandro CariaRiccardo FraccaroliCarlo De SantiMatteo BuffoloEnrico ZanoniGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of Therminic 2024 workshop
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Reliability analysis of high power LEDs for automotive: impact of current and temperature 2024 Alessandro CariaNicola TrivellinRiccardo FraccaroliNicola RoccatoMatteo BuffoloCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini - - Proceedings of ESREF 2024 conference
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 2024 Caria, AlessandroFraccaroli, RiccardoDe Santi, CarloBuffolo, MatteoTrivellin, NicolaZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo + - - Proceedings of the SPIE Photonics West 2024
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: Role of silicone encapsulant 2023 Caria, A.Fraccaroli, R.De Santi, C.Buffolo, M.Trivellin, N.Zanoni, E.Meneghesso, G.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
On the importance of Fast and Accurate LED Optical and Thermal Characterization: from visible use cases to UV technologies 2023 Trivellin, NicolaRoccato, NicolaPiva, FrancescoBuffolo, MatteoDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo - - Proceedings of the 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Solid State Lighting for horticolture: impact of LED reliability on light spectrum and intensity 2023 Trivellin, NicolaBuffolo, MatteoCaria, AlessandroDe Santi, CarloFraccaroli, RiccardoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18)