BUFFOLO, MATTEO

BUFFOLO, MATTEO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 236 (tempo di esecuzione: 0.039 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Quantitative modeling of threshold instability in β-Ga2O3 finFETs through electro-optical investigation 2026 Fregolent M.Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + APL MATERIALS - -
Addressing the oxide-aperture dependency of the degradation of 845 nm VCSELs for silicon photonics 2025 Buffolo, MatteoZenari, MicheleDe Santi, CarloMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - PROCEEDINGS OF SPIE Proceedings of SPIE - The International Society for Optical Engineering
Analysis and modeling of the positive degradation mechanism observed in 265 nm UV-C LEDs 2025 F. PivaN. RoccatoM. BuffoloS. L. LongatoM. PilatiC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the International Conference on Materials and Systems for Sustainability 2025 (ICMaSS)
Analysis of extrinsic failure mechanisms of high-power blue, red, and white LEDs for horticulture and street lighting 2025 Caria, AlessandroFraccaroli, RiccardoDe Santi, CarloBuffolo, MatteoTrivellin, NicolaZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo + - PROCEEDINGS OF SPIE Proceedings of SPIE - The International Society for Optical Engineering
Changes in the extraction and collection efficiency of GaN-based MQW solar cells under optical step-stress 2025 Nicoletto M.Caria A.Roccato N.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Defects and reliability of UVC-LEDs 2025 Buffolo, MatteoPiva, FrancescoRoccato, NicolaDe Santi, CarloTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - PROCEEDINGS OF SPIE Proceedings of SPIE - The International Society for Optical Engineering
Defects in InGaN QW structures: microscopic properties and modeling 2025 Meneghini, MatteoPiva, FrancescoRoccato, NicolaCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoGasparotto, AndreaTrivellin, NicolaMeneghesso, GaudenzioZanoni, Enrico + - PROCEEDINGS OF SPIE Proceedings of SPIE - The International Society for Optical Engineering
Degradation Effects in UVC LEDs Analyzed by Single-Wavelength Photo-Capacitance Transients 2025 M. PilatiF. PivaM. BuffoloC. De SantiM. Meneghini - - Proceedings of the International Conference on Materials and Systems for Sustainability 2025 (ICMaSS)
Diffusion mechanism as cause of optical degradation in AlGaN-based UV-C leds investigated by TCAD simulations 2025 Roccato N.Piva F.Buffolo M.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. + SCIENTIFIC REPORTS - -
Efficiency- and lifetime-limiting effects of commercially available UVC LEDs: a review 2025 Piva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloMeneghini, Matteo + JPHYS PHOTONICS - -
Evidence for Avalanche and its Role in Lateral and Vertical Gallium Nitride Devices 2025 C. De SantiR. FraccaroliM. FregolentI. RossettoM. BoitoE. CanatoM. BuffoloG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the International Conference on Materials and Systems for Sustainability 2025 (ICMaSS)
Extrinsic Failure of High-Power Blue LEDs for Horticulture Applications Stressed in Hot Environments 2025 Caria A.Fraccaroli R.De Santi C.Buffolo M.Trivellin N.Zanoni E.Meneghesso G.Meneghini M. + - - Proceedings of the 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
GaN Devices: Technology, Reliability-Limiting Processes and ESD Failures 2025 M. MeneghiniS. LongatoM. FregolentR. FraccaroliI. RossettoC. De SantiM. BuffoloG. MeneghessoE. Zanoni - - Proceedings of the 47th Annual EOS/ESD Symposium 2025
Hail Damage Investigation in Heterojunction Silicon Photovoltaic Modules: A Real-World Case Study 2025 Nicoletto M.Caria A.Trivellin N.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + IEEE JOURNAL OF PHOTOVOLTAICS - -
Hotspot analysis on a flexible PV mini-modules based on IBC solar cells 2025 P. JakuzaC. CasuF. PivaA. CariaM. BuffoloC. De SantiN. TrivellinG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of rete italiana fotovoltaico (IFV) 2025
Identification of Boron-related traps via Capacitance Spectroscopy in Diamond Schottky diodes 2025 Giacomo BiasinManuel FregolentMatteo BuffoloCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of ICDCM 2025
Investigating the optical degradation of InAs quantum dot lasers on silicon through combined electro-optical characterization and gain measurements 2025 Zenari M.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + JPHYS PHOTONICS - -
Long-term (8000 h) reliability and failures of high-power LEDs for outdoor lighting stressed at high ambient temperatures 2025 Caria A.Fraccaroli R.De Santi C.Buffolo M.Trivellin N.Zanoni E.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes 2025 Buffolo, MatteoPiva, FrancescoMeneghini, Matteo + IEEE ACCESS - -
Modeling Cracks in Silicon-Heterojunction Photovoltaic Modules: A Real-World Case Study 2025 Nicoletto, MarcoCaria, AlessandroTrivellin, NicolaDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE JOURNAL OF PHOTOVOLTAICS - -