PIVA, FRANCESCO

PIVA, FRANCESCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 63 (tempo di esecuzione: 0.044 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results 2024 Fregolent, ManuelPiva, FrancescoBuffolo, MatteoSanti, Carlo DeCester, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Ageing effects on optical power characteristics and defects in SQW UV-C LEDs 2024 F. PivaM. BuffoloM. PilatiN. RoccatoS. LongatoC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the GaN Marathon 2024
Antimony selenide solar cells: non-ideal deep level response and study of trap-filling transients 2024 De Santi, CarloBarrantes, Jessica Jazmine NicolePiva, FrancescoCaria, AlessandroBuffolo, MatteoTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of the SPIE Photonics West 2024
Catastrophic degradation of LEDs: failure analysis and perspective 2024 N. TrivellinA. CariaF. PivaM. BuffoloC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the IEEE LS24 Sustainable Smart Lighting Conference
Defects, performance, and reliability in UVC LEDs 2024 Meneghini, MatteoRoccato, NicolaPiva, FrancescoPilati, MarcoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proceedings of the SPIE Photonics West 2024
Degradation Physics of UV LEDs: from experimental data to models 2024 Matteo MeneghiniNicola RoccatoFrancesco PivaMarco PilatiCarlo De SantiMatteo BuffoloNicola TrivellinGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the 7th International Workshop on Ultraviolet Materials and Devices 2024
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Investigation and modeling of the role of interface defects in the optical degradation of InGaN/GaN LEDs 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoSanti, Carlo DeTrivellin, NicolaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Investigation of degradation dynamics of 265 nm LEDs assisted by EL measurements and numerical simulations 2024 Piva, FrancescoBuffolo, MatteoRoccato, NicolaPilati, MarcoLongato, SimoneSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs 2024 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE PHOTONICS JOURNAL - -
Modeling the degradation mechanisms of UV-C LEDs 2024 Nicola RoccatoFrancesco PivaCarlo De SantiMatteo BuffoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the GaN Marathon 2024
Modeling the optical degradation kinetics of UV-C LEDs 2024 N. RoccatoF. PivaC. De SantiM. BuffoloN. TrivellinG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of 2024 E-MRS fall meeting
Optical Power Degradation Related to Turn-On in Commercial 265 nm UV-C LEDs 2024 Francesco PivaMatteo BuffoloMarco PilatiNicola RoccatoCarlo De SantiNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the 31st IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
Physical processes leading to the degradation of UV-C LEDs and their modeling by defect reactions and numerical simulations 2024 C. De SantiM. BuffoloF. PivaN. RoccatoN. TrivellinG. MeneghessoE. ZanoniM. Meneghini - - Proceedings of the Photonics North 2024
Semitransparent Perovskite Solar Cells for Si Tandem and Agrivoltaic Integration 2024 Trivellin N.Tormena N.Barrantes J. J. N.De Santi C.Piva F.Caria A.Buffolo M.Cester A.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Threshold Voltage Instability in Vertical β-Ga2O3 finFETs Investigated by Combined Electrical and Optical Techniques 2024 M. FregolentC. De SantiF. PivaG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 5th International Workshop on Gallium Oxide and Related Materials
Undestanding commercial UVC LEDs reliability to boost disinfection efficacy 2024 Trivellin, NicolaPiva, FrancescoDe Santi, CarloCaria, AlessandroBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo - - Proceedings of the SPIE Photonics West 2024
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode 2023 Casu, C.Buffolo, M.Caria, A.Piva, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Characterization and C-DLTS analysis of antimony selenide solar cells 2023 Jessica Jazmine Nicole BarrantesCarlo De SantiFrancesco PivaMatteo BuffoloAlessandro CariaNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 2023 Piva F.Buffolo M.De Santi C.Pilati M.Roccato N.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference