DE PIERI, FRANCESCO
DE PIERI, FRANCESCO
Università di Padova
Analysis of trapping and detrapping mechanisms in 0.15 μm-gate AlGaN/GaN High Electron Mobility Transistors: explanation of dynamic behaviour of threshold voltage and on-resistance
2023 DE PIERI, Francesco; Fornasier, Mirko; Gao, Zhan; Rampazzo, Fabiana; DE SANTI, Carlo; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico
Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobility Transistors: Toward Zero Dispersion Effects
2024 Saro, Marco; de Pieri, Francesco; Carlotto, Andrea; Fornasier, Mirko; Rampazzo, Fabiana; De Santi, Carlo; Meneghesso, Gaudenzio; Meneghini, Matteo; Zanoni, Enrico; Bisi, Davide; Guidry, Matthew; Keller, Stacia; Mishra, Umesh
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability
2023 Zanoni, Enrico; Santi, Carlo De; Gao, Zhan; Buffolo, Matteo; Fornasier, Mirko; Saro, Marco; Pieri, Francesco De; Rampazzo, Fabiana; Meneghesso, Gaudenzio; Meneghini, Matteo; Zagni, Nicolò; Chini, Alessandro; Verzellesi, Giovanni
Scaling of GaN HEMTs for microwave and millimeter-wave applications: achieving control of short-channel effects, deep levels and reliability
2024 Zanoni, Enrico; Buffolo, Matteo; Carlotto, Andrea; DE PIERI, Francesco; DE SANTI, Carlo; Meneghesso, Gaudenzio; Meneghini, Matteo; Rampazzo, Fabiana
Transconductance overshoot as a signature of trapping effects at backbarrier interface of GaN HEMTs : dependence on device epitaxial structure
2023 Gao, Zhan; Fornasier, Mirko; DE PIERI, Francesco; DE SANTI, Carlo; Rampazzo, Fabiana; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico