CASU, CLAUDIA

CASU, CLAUDIA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 14 di 14 (tempo di esecuzione: 0.023 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Effect of High Monochromatic Radiation on the Electrical Performance of CIGS Solar Cell 2024 Casu, C.Buffolo, M.Caria, A.De Santi, C.Trivellin, N.Cester, A.Meneghesso, G.Zanoni, E.Meneghini, M. + IEEE JOURNAL OF PHOTOVOLTAICS - -
Study of the efficiency and reliability of GaN-based visible light emitting diode 2024 CASU, CLAUDIA - - -
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode 2023 Casu, C.Buffolo, M.Caria, A.Piva, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Injection-limited efficiency of InGaN LEDs and impact on electro-optical performance and ageing: a case study 2023 Casu, ClaudiaBuffolo, MatteoCaria, AlessandroDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo - - Proceedings of SPIE Photonics West 2023 conference - Light-Emitting Devices, Materials, and Applications XXVII
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics 2022 Buffolo, MRoccato, NPiva, FDe Santi, CCasu, CCaria, AMukherjee, KMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Effects of the generation and relocation of defects during the aging process of InGaN-based multi quantum well light emitting diodes 2022 C. CasuM. BuffoloA. CariaC. De SantiE. ZanoniG. MeneghessoM. Meneghini - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
III-N optical devices: physical processes limiting efficiency and reliability 2022 M. MeneghiniC. De SantiM. BuffoloA. CariaF. PivaC. CasuN. RoccatoN. TrivellinG. MeneghessoE. Zanoni + - - Proceedings of the 8th International Symposium on Advanced Science and Technology of Silicon Materials (JSPS 2022)
III-N optoelectronics: defects, reliability and challenges 2022 M. MeneghiniC. De SantiM. BuffoloA. CariaF. PivaC. CasuN. RoccatoN. TrivellinG. MeneghessoE. Zanoni + - - Proceedings of ICOOPMA-EuroDIM 2022
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode 2022 Casu, ClaudiaBuffolo, MatteoCaria, AlessandroDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo MICROMACHINES - -
Investigation on the optical stability during ageing of InGaN-based light emitting diode 2022 C. CasuM. BuffoloA. CariaC. De SantiG. MeneghessoE. ZanoniM. Meneghini - - Proceedings of E-MRS fall 2022
Modeling the effect of spatial position and concentration of defects on optical degradation of InGaN/GaN multi quantum well light emitting diodes 2022 Casu, CBuffolo, MCaria, ADe Santi, CZanoni, EMeneghesso, GMeneghini, M - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Probing carrier transport and recombination processes in dichromatic GaN-based LEDs: a nonequilibrium Green’s function study 2022 C. CasuN. RoccatoC. De SantiM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Effect of indium content and carrier distribution on the efficiency and reliability of InGaN/GaN-based multi quantum well light emitting diode 2021 Casu C.Buffolo M.Caria A.De Santi C.Zanoni E.Meneghesso G.Meneghini M. MICROELECTRONICS RELIABILITY - -