CESTER, ANDREA

CESTER, ANDREA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 113 (tempo di esecuzione: 0.054 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches 2014 BARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
A correlational study between signature, writing abilities and decision-making capacity among people with initial cognitive impairment 2016 Gnoato, F.Albanese, P.Sartori, G.Cester, A. + AGING CLINICAL AND EXPERIMENTAL RESEARCH - -
A General Equivalent Circuit Model for a Metal/Organic/Liquid/Metal System 2018 Lago, NicoloBuonomo, MarcoWrachien, NicolaCester, Andrea + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems 2022 Galli A.Lago N.Tonello S.Bortolozzi M.Buonomo M.Pedersen M. G.Cester A.Giorgi G. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT - -
A Novel Algorithm for Lifetime Extrapolation, Prediction, and Estimation of Emerging PV Technologies 2018 Rizzo, AntonioCester, Andrea + SMALL METHODS - -
A physical-based equivalent circuit model for an organic/electrolyte interface 2016 LAGO, NICOLO'CESTER, ANDREAWRACHIEN, NICOLABARBATO, MARCORIZZO, ANTONIOMENEGHESSO, GAUDENZIO + ORGANIC ELECTRONICS - -
Accelerated constant current stress on triple cation perovskite solar cells 2023 Lago N.Cester A. + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 2003 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results 2024 Fregolent, ManuelPiva, FrancescoBuffolo, MatteoSanti, Carlo DeCester, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 2018 Buonomo, M.Torto, L.Barbato, M.Wrachien, N.Rizzo, A.Cester, A. + MICROELECTRONICS RELIABILITY - -
Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells 2018 TORTO, LORENZOCester, AndreaWrachien, NicolaRizzo, Antonio + IEEE JOURNAL OF PHOTOVOLTAICS - -
Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress 2016 RIZZO, ANTONIOTORTO, LORENZOWRACHIEN, NICOLACESTER, ANDREA + IEEE JOURNAL OF PHOTOVOLTAICS - -
Beyond the 2D Field-Effect Charge Transport Paradigm in Molecular Thin-Film Transistors 2023 Lago, NBuonomo, MCester, A + ADVANCED ELECTRONIC MATERIALS - -
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination 2016 RIZZO, ANTONIOCESTER, ANDREAWRACHIEN, NICOLALAGO, NICOLO'BARBATO, MARCO + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Characterization and Modeling of Reduced-Graphene Oxide Ambipolar Thin-Film Transistors 2022 Lago, NBuonomo, MSedona, FSambi, MCasalini, SCester, A + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Characterization and Modeling of Reduced-Graphene Oxide Ambipolar Thin-Film Transistors 2022 Lago, NicoloBuonomo, MarcoHensel, Rafael CintraSedona, FrancescoSambi, MauroCasalini, StefanoCester, Andrea IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Collapse of MOSFET Drain Current After Soft Breakdown 2004 CESTER, ANDREAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Comparison between positive and negative constant current stress on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Cu-modified electrolyte-gated transistors based on reduced graphene oxide 2023 Sedona, FSambi, MCester, ALago, NCasalini, S + JOURNAL OF MATERIALS CHEMISTRY. C - -
Degradation Dynamics of Ultrathin Gate Oxides Subjected to Electrical Stress 2003 CESTER, ANDREA + IEEE ELECTRON DEVICE LETTERS - -