BONALDO, STEFANO
BONALDO, STEFANO
Dipartimento di Ingegneria dell'Informazione - DEI
Enhancing Screen-Printed Electrode Performance Through Simulation-Driven Design Optimization for Wearable Applications
2026 Ploner, Moritz; Franchin, Lara; Altana, Antonio; Shkodra, Bajramshahe; Petrelli, Mattia; Angeli, Martina Aurora Costa; Pompilio, Michele; Elli, Giulia; Cacialli, Franco; Paccagnella, Alessandro; Resnati, Daniele; Lugli, Paolo; Bonaldo, Stefano; Petti, Luisa
High‐Yield Fabrication of Electrolyte‐Gated Transistors Based on Graphene Acetic Acid
2026 Ilie, Georgian Giani; Franchin, Lara; Pradetto Battel, Ludovica; Bonaldo, Stefano; Paccagnella, Alessandro; Di Vizio, Biagio; Agnoli, Stefano; C. Hensel, Rafael; Ricciardulli, Antonio Gaetano; Battiston, Simone; Sambi, Mauro; Sedona, Francesco; Samorì, Paolo; Casalini, Stefano
Impact of Proton Energy on Displacement Damage and Total Ionizing Dose in SiC Vertical Power MOSFETs
2026 Martinella, C.; Bonaldo, S.; Belanche, M.; Kupper, R.; Andreetta, G.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Grossner, U.
TID Degradation Mechanisms in Gate-All-Around Silicon Nanowire FETs
2026 Champagne, C. A.; Ball, D. R.; Trippe, J. M.; Ritzenthaler, R.; Mitard, J.; Linten, D.; Massengill, L. W.; Kosier, S. L.; Reed, R. A.; Zhang, E. X.; Alles, M. L.; Bonaldo, S.; Fleetwood, D. M.; Sierawski, B. D.
TID Effects in Vertical SiC Power MOSFETs Irradiated at Different Temperatures
2026 Andreetta, G.; Martinella, C.; Natzke, P.; Bagatin, M.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; Grossner, U.; Bonaldo, S.
Total-Ionizing-Dose Effects and Low-Frequency Noise in 90 nm, 3.3 V Input/Output CMOS Devices
2026 Neuendank, J.; Kirby, T.; Barnaby, H. J.; Fleetwood, D. M.; Bonaldo, S.; Loveless, T. D.; Westfall, S.; Muscat, P.; Nour, M.; Chambers, M.
COTS BJT Radiation Qualification Methodology for Highly Distributed Systems in Mixed-Field Environments
2025 Andreetta, G.; Ferraro, R.; Zimmaro, A.; Bonaldo, S.; Paccagnella, A.; Thurel, Y.; Masi, A.; Danzeca, S.
Dynamic Voltage-Dependent Modeling of Single Event Transients in CMOS Ring Oscillators
2025 Kampati, V. S.; Bonaldo, S.; Leroux, P.; Prinzie, J.
Flexible microfluidics-integrated electrochemical system for detection of tumor necrosis factor-alpha under continuous flow of sweat
2025 Ploner, M.; Shkodra, B.; Franchin, L.; Altana, A.; Petrelli, M.; Costa Angeli, M. A.; Ciccone, G.; Antrack, T.; Vanzetti, L.; Nair, R. R.; Canteri, R.; Bonaldo, S.; Paccagnella, A.; Kleemann, H.; Resnati, D.; Lugli, P.; Erten, A.; Petti, L.
Impact of Cryogenic Temperatures on Radiation-Induced Parameter Shifts in RADFETs
2025 Neuendank, J.; Kirby, T.; Barnaby, H. J.; Bonaldo, S.; Greer, E.; Wallace, T.; Vaidyam, L. N. N.; Spear, M.; Muscat, P.; Chen, J.; Giorno, Z.; Macabou, E.
Influence of Surface Morphology on the Electrochemical Response of Electrodes for Sensing Applications: A Multiphysics Simulation Study
2025 Franchin, L.; Paccagnella, A.; Bonaldo, S.
New Insights on Hydration Monitoring in Elderly Patients by Interdigitated Wearable Sensors
2025 Es Sebar, Leila; Bonaldo, Stefano; Cristaldi, Loredana; Franchin, Lara; Grassini, Sabrina; Iannucci, Leonardo; Lombardo, Luca; Mineo, Chiara; Neviani, Andrea; Restelli, Lorenzo; Sannino, Isabella; Tonello, Sarah; Svelto, Cesare
Plasmonic Biosensor of Cruzipain-Antibody Complexes Based on Gold Nano-gratings for Chagas Disease Screening
2025 Chain, C. Y.; Prieto, E. D.; Cisneros, J. S.; Daza Millone, M. A.; Ramirez, E. A.; Labriola, C. A.; Aniasi, V.; Villagra, A. P. M.; Franchin, L.; Paccagnella, A.; Bonaldo, S.
Single-Event Upset Characterization of a Shift Register in 16 nm FinFET Technology
2025 D'Aniello, F.; Tettamanti, M.; Shah, S. A. A.; Mattiazzo, S.; Bonaldo, S.; Vadalà, V.; Baschirotto, A.
The Effect of Number of Fins per Transistor on the TID Response of 12LP FinFET Technology
2025 Wallace, T.; Dodds, N. A.; Vidana, A. I.; Nathan Nowlin, R.; Dodd, B.; Barnaby, H. J.; Spear, M.; Neuendank, J.; Kauppila, J. S.; Haeffner, T. D.; Poe, G. D.; Vibbert, S. T.; Massengill, L. W.; Taggart, J. L.; Foran, B.; Bonaldo, S.
TID effects in the lateral STI oxide of planar CMOS transistors
2025 Bonaldo, S.; Borghello, G.; Faccio, F.; Bagatin, M.; Mattiazzo, S.; Gerardin, S.
Total Ionizing Dose in nano-scaled CMOS technologies
2025 Faccio, F.; Borghello, G.; Bonaldo, S.
Total-Ionizing-Dose and Displacement Damage Effects in Trench SiC Power MOSFETs
2025 Bonaldo, S.; Martinella, C.; Bagatin, M.; Gerardin, S.; Natzke, P.; Kupper, R.; Fur, N.; Mattiazzo, S.; Paccagnella, A.; Grossner, U.
A Portable Digital MUAC Bracelet for Assessing the Acute Malnutrition Degree of Children
2024 Bonaldo, S.; Dal Lago, F.; Cogo, T.; Comuzzi, F.; Dal Lago, L.; Putoto, G.; Carraro, D.; Paccagnella, A.
Bacteria-Based Biosensor for the Detection of Lactococcus Lactis Bacteriophage in Agrifood Industry
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Bertozzi, T.; Paccagnella, A.