BARBATO, MARCO

BARBATO, MARCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 70 (tempo di esecuzione: 0.054 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Analysis and design of SARS-CoV-2 disinfection chambers based on UVC LEDs 2022 Trivellin, NBuffolo, MBarbato, MDel Vecchio, CDughiero, FZanoni, EMeneghesso, GCrisanti, AMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
A new method for CdSexTe1-x band grading for high efficiency thin-absorber CdTe solar cells 2021 Gasparotto A.Barbato M.Meneghini M.Meneghesso G. + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
CdTe solar cells: Technology, operation and reliability 2021 Barbato M.Bertoncello M.Meneghini M.Trivellin N.Mantoan E.Zanoni E.Meneghesso G. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact 2021 Bertoncello M.Barbato M.Caria A.Buffolo M.De Santi C.Vogrig D.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and Validation 2021 Trivellin, NicolaBuffolo, MatteoOnelia, FrancescoPizzolato, AlbertoBarbato, MarcoDel Vecchio, ClaudiaDughiero, FabrizioZanoni, EnricoMeneghesso, GaudenzioCrisanti, AndreaMeneghini, Matteo + MATERIALS - -
Fast System to measure the dynamic onresistance of on-wafer 600 v normally off GaN HEMTs in hard-switching application conditions 2020 Barbato A.Barbato M.Meneghini M.Spiazzi G.Meneghesso G.Zanoni E. + IET POWER ELECTRONICS - -
Influence of CdTe solar cell properties on stability at high temperatures 2020 Bertoncello M.Barbato M.Trivellin N.Zanoni E.Meneghini M.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
Analysis of magnesium zinc oxide layers for high efficiency CdTe devices 2019 Barbato, MarcoMeneghini, MatteoMeneghesso, Gaudenzio + THIN SOLID FILMS - -
Degradation of GaN-Based Lateral and Vertical Devices—Challenges and Perspectives 2019 Matteo MeneghiniCarlo De SantiAlessandro BarbatoMatteo BorgaEleonora CanatoFrancesca ChiocchettaElena FabrisZhan GaoFabrizio MasinKalparupa MukherjeeArianna NardoFabiana RampazzoMaria RuzzarinMehdi RzinAlaleh TajalliMarco BarbatoGaudenzio MeneghessoEnrico Zanoni - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Degradation physics of GaN-based lateral and vertical devices 2019 Meneghini M.De Santi C.Barbato A.Borga M.Canato E.CHIOCCHETTA, FRANCESCAFabris E.Masin F.Nardo A.Rampazzo F.Ruzzarin M.Tajalli A.Barbato M.Meneghesso G.Zanoni E. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Difluorochloromethane treated thin CdS buffer layers for improved CdTe solar cells 2019 Barbato, MarcoMeneghini, MatteoMeneghesso, Gaudenzio + THIN SOLID FILMS - -
ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping 2019 Canato E.Meneghini M.Nardo A.Masin F.Barbato A.Barbato M.Zanoni E.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
Power GaN HEMT degradation: From time-dependent breakdown to hot-electron effects 2019 Meneghini, M.Barbato, A.Borga, M.De Santi, C.Barbato, M.Stoffels, S.Meneghesso, G.Zanoni, E. + - TECHNICAL DIGEST - INTERNATIONAL ELECTRON DEVICES MEETING Technical Digest - International Electron Devices Meeting, IEDM
Reliability investigation on CdTe solar cells submitted to short-term thermal stress 2019 Bertoncello M.Barbato M.Meneghini M.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 2018 Buonomo, M.Torto, L.Barbato, M.Wrachien, N.Rizzo, A.Cester, A. + MICROELECTRONICS RELIABILITY - -
On Wafer Application Testing for 600 V E-mode GaN HEMTs in Boost Regime 2018 A. BarbatoM. BarbatoM. MeneghiniG. SpiazziG. MeneghessoE. Zanoni + - - Proceedings of the GaN Marathon 2.0
Reliability Issues in Lateral and Vertical GaN FETs for Power Electronics 2018 G. MeneghessoM. MeneghiniC. De SantiA. BarbatoM. BarbatoM. BorgaE. CanatoE. FabrisF. MasinM. RuzzarinA. TajalliE. Zanoni - - Proceedings of the 2018 International Workshop on Nitride Semiconductors (IWN 2018)
A Novel System to Measure the Dynamic On‑Resistance of On‑Wafer 600 V Normally-Off GaN HEMTs in Real Application Conditions 2017 Alessandro BarbatoM. BarbatoM. MeneghiniM. SilvestriG. MeneghessoE. Zanoni + - - Proceedings of the 41th WOCSDICE - Workshop on Compound Semiconductor Devices and Integrated Circuits 2017
Effects of thermal stress on hybrid perovskite solar cells with different encapsulation techniques 2017 RIZZO, ANTONIOTORTO, LORENZOBARBATO, MARCOWRACHIEN, NICOLACESTER, ANDREADI CARLO, ALDO + - - IEEE International Reliability Physics Symposium Proceedings
Evidence of mechanical degradation in microelectromechanical switches subjected to long-Term stresses 2017 BARBATO, MARCOBARBATO, ALESSANDROSilvestrini, MatteoCESTER, ANDREAMENEGHESSO, GAUDENZIO + - - IEEE International Reliability Physics Symposium Proceedings