BARBATO, MARCO

BARBATO, MARCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 36 (tempo di esecuzione: 0.053 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches 2014 BARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures 2011 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + JOURNAL OF ELECTROSTATICS - -
A new method for CdSexTe1-x band grading for high efficiency thin-absorber CdTe solar cells 2021 Gasparotto A.Barbato M.Meneghini M.Meneghesso G. + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
A physical-based equivalent circuit model for an organic/electrolyte interface 2016 LAGO, NICOLO'CESTER, ANDREAWRACHIEN, NICOLABARBATO, MARCORIZZO, ANTONIOMENEGHESSO, GAUDENZIO + ORGANIC ELECTRONICS - -
Analysis of magnesium zinc oxide layers for high efficiency CdTe devices 2019 Barbato, MarcoMeneghini, MatteoMeneghesso, Gaudenzio + THIN SOLID FILMS - -
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 2018 Buonomo, M.Torto, L.Barbato, M.Wrachien, N.Rizzo, A.Cester, A. + MICROELECTRONICS RELIABILITY - -
CdTe solar cells: Technology, operation and reliability 2021 Barbato M.Bertoncello M.Meneghini M.Trivellin N.Mantoan E.Zanoni E.Meneghesso G. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination 2016 RIZZO, ANTONIOCESTER, ANDREAWRACHIEN, NICOLALAGO, NICOLO'BARBATO, MARCO + SOLAR ENERGY MATERIALS AND SOLAR CELLS - -
Demonstration of Field- and Power-Dependent ESD Failure in AlGaN/GaN RF HEMTs 2015 ROSSETTO, ISABELLAMENEGHINI, MATTEOBARBATO, MARCORAMPAZZO, FABIANAMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Difluorochloromethane treated thin CdS buffer layers for improved CdTe solar cells 2019 Barbato, MarcoMeneghini, MatteoMeneghesso, Gaudenzio + THIN SOLID FILMS - -
Double Control Gate Field-Effect Transistor for Area Efficient and Cost Effective Applications 2014 MARINO, FABIO ALESSIOSTOCCO, ANTONIOBARBATO, MARCOZANONI, ENRICOMENEGHESSO, GAUDENZIO IEEE ELECTRON DEVICE LETTERS - -
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells 2015 CESTER, ANDREARIZZO, ANTONIOLAGO, NICOLO'BARBATO, MARCOWRACHIEN, NICOLA + MICROELECTRONICS RELIABILITY - -
Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact 2021 Bertoncello M.Barbato M.Caria A.Buffolo M.De Santi C.Vogrig D.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
ESD characterization of multi-chip RGB LEDs 2013 VACCARI, SIMONEMENEGHINI, MATTEOBARBISAN, DAVIDEBARBATO, MARCOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements 2014 MENEGHINI, MATTEOVACCARI, SIMONEDAL LAGO, MATTEOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms 2014 DAL LAGO, MATTEOMENEGHINI, MATTEODE SANTI, CARLOBARBATO, MARCOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping 2019 Canato E.Meneghini M.Nardo A.Masin F.Barbato A.Barbato M.Zanoni E.Meneghesso G. + MICROELECTRONICS RELIABILITY - -
Fast System to measure the dynamic onresistance of on-wafer 600 v normally off GaN HEMTs in hard-switching application conditions 2020 Barbato A.Barbato M.Meneghini M.Spiazzi G.Meneghesso G.Zanoni E. + IET POWER ELECTRONICS - -
Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level 2017 Rossetto, I.Meneghini, M.Canato, E.Barbato, M.Stoffels, S.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and Validation 2021 Trivellin, NicolaBuffolo, MatteoOnelia, FrancescoPizzolato, AlbertoBarbato, MarcoDel Vecchio, ClaudiaDughiero, FabrizioZanoni, EnricoMeneghesso, GaudenzioCrisanti, AndreaMeneghini, Matteo + MATERIALS - -