TAJALLI, ALALEH
TAJALLI, ALALEH
Dipartimento di Ingegneria dell'Informazione - DEI
Evidence of Hot-Electron Effects during Hard Switching of AlGaN/GaN HEMTs
2017 Rossetto, I.; Meneghini, M.; Tajalli, A.; Dalcanale, S.; De Santi, C.; Moens, P.; Banerjee, A.; Zanoni, E.; Meneghesso, G.
Field and hot electron-induced degradation in GaN-based power MIS-HEMTs
2017 Tajalli, Alaleh; Meneghini, Matteo; Rossetto, Isabella; Moens, Peter; Banerjee, Abhishek; Zanoni, Enrico; Meneghesso, Gaudenzio
High breakdown voltage and low buffer trapping in superlattice gan-on-silicon heterostructures for high voltage applications
2020 Tajalli, A.; Meneghini, M.; Besendorfer, S.; Kabouche, R.; Abid, I.; Pusche, R.; Derluyn, J.; Degroote, S.; Germain, M.; Meissner, E.; Zanoni, E.; Medjdoub, F.; Meneghesso, G.
Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
2018 Tajalli, A.; Canato, E.; Nardo, Arianna; Meneghini, M.; Stockman, A.; Moens, P.; Zanoni, E.; Meneghesso, G.
Low On-Resistance and Low Trapping Effects in 1200 V Superlattice GaN-on-Silicon Heterostructures
2019 Kabouche, R.; Abid, I.; Pusche, R.; Derluyn, J.; Degroote, S.; Germain, M.; Tajalli, A.; Meneghini, M.; Meneghesso, G.; Medjdoub, F.
The Effect of Proton Irradiation in Suppressing Current Collapse in AlGaN/GaN High-Electron-Mobility Transistors
2019 Stockman, A.; Tajalli, A.; Meneghini, M.; Uren, M. J.; Mouhoubi, S.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Meneghesso, G.; Zanoni, E.; Moens, P.; Bakeroot, B.
Trapping phenomena and degradation mechanisms in GaN-based power HEMTs
2018 Meneghini, Matteo; Tajalli, Alaleh; Moens, Peter; Banerjee, Abhishek; Zanoni, Enrico; Meneghesso, Gaudenzio
Vertical breakdown of GaN on Si due to V-pits
2020 Besendorfer, S.; Meissner, E.; Tajalli, A.; Meneghini, M.; Freitas, J. A.; Derluyn, J.; Medjdoub, F.; Meneghesso, G.; Friedrich, J.; Erlbacher, T.
Vertical leakage in GaN-on-Si stacks investigated by a buffer decomposition experiment
2020 Tajalli, A.; Borga, M.; Meneghini, M.; Santi, C. D.; Benazzi, D.; Besendorfer, S.; Pusche, R.; Derluyn, J.; Degroote, S.; Germain, M.; Kabouche, R.; Abid, I.; Meissner, E.; Zanoni, E.; Medjdoub, F.; Meneghesso, G.