GERARDIN, SIMONE
GERARDIN, SIMONE
Dipartimento di Ingegneria dell'Informazione - DEI
Impact of Proton Energy on Displacement Damage and Total Ionizing Dose in SiC Vertical Power MOSFETs
2026 Martinella, C.; Bonaldo, S.; Belanche, M.; Kupper, R.; Andreetta, G.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Grossner, U.
Neutron-induced Single Event Effects in 3D Managed NAND Memories
2026 Peyronel, D.; Lama, G.; Valla, M.; Kastriotou, M.; Cazzaniga, C.; Bagatin, M.; Gerardin, S.
TID Effects in Vertical SiC Power MOSFETs Irradiated at Different Temperatures
2026 Andreetta, G.; Martinella, C.; Natzke, P.; Bagatin, M.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; Grossner, U.; Bonaldo, S.
Radiation Effects in Flash Memories: from Planar to 3D
2025 Bagatin, M.; Gerardin, S.
Radiation hardness properties and DCR reduction via laser annealing of InGaAs/InP SPADs for space applications
2025 Finazzi, L.; Signorelli, F.; Bagatin, M.; Gerardin, S.; Zahidy, M.; Vallone, G.; Jennewein, T.; Villoresi, P.; Tosi, A.
The Gamma-Flash Program: high-energy radiation and particles in thunderstorms, lightning, and terrestrial gamma-ray flashes
2025 Calabretto, Paolo; Ursi, Alessandro; Tiberia, Alessandra; Virgilli, Enrico; Argan, Andrea; Bulgarelli, Andrea; Castaldini, Luca; Fuschino, Fabio; Senesi, Roberto; Romanelli, Giovanni; Pietrosanti, Virginia; Levi, Giuseppe; Dietrich, Stefano; Federico, Stefano; Cairo, Francesco; Aboudan, Alessio; Gerardin, Simone; Campana, Riccardo; Marchesini, Ezequiel; Labanti, Claudio; Vagelli, Valerio; Donnarumma, Immacolata; D'Amico, Fabio; De Rosa, Clemente; Fiorini, Mauro; Pittori, Carlotta; Tavani, Marco
The HEARTS EU Project and Its Initial Results on Fragmented High-Energy Heavy-Ion Single-Event Effects Testing
2025 García Alía, Rubén; Waets, Andreas; Coronetti, Andrea; Bilko, Kacper; Delrieux, Marc; Emriskova, Natalia; Esposito, Luigi; Fraser, Matthew; Johnson, Eliott; Klimek, Karolina; Lucsanyi, David; Prelipcean, Daniel; Sacristán Barbero, Mario; Söderström, Daniel; Danzeca, Salvatore; Ravotti, Federico; Gilardoni, Simone; Cerutti, Francesco; Durante, Marco; Schuy, Christoph; Wagner, Tim; Weber, Ulrich; Bagatin, Marta; Gerardin, Simone; Francola, Stefano; Mancini, Roberta; Mangeret, Renaud; Rostewitz, Mirko
TID effects in the lateral STI oxide of planar CMOS transistors
2025 Bonaldo, S.; Borghello, G.; Faccio, F.; Bagatin, M.; Mattiazzo, S.; Gerardin, S.
Total-Dose-Induced Threshold Voltage Shift Dependence on Tier Pitch in 3-D nand Flash Memories
2025 Bagatin, Marta; Beltrami, Silvia; Paccagnella, Alessandro; Gerardin, Simone
Total-Ionizing-Dose and Displacement Damage Effects in Trench SiC Power MOSFETs
2025 Bonaldo, S.; Martinella, C.; Bagatin, M.; Gerardin, S.; Natzke, P.; Kupper, R.; Fur, N.; Mattiazzo, S.; Paccagnella, A.; Grossner, U.
X-Ray Effects on Alpha-Induced Soft Error Rate in 3-D NAND Replacement Gate Flash Memory Cells
2025 Bagatin, Marta; Beltrami, Silvia; Paccagnella, Alessandro; Gerardin, Simone
Displacement Damage and Total Ionizing Dose induced by 3-MeV Protons in SiC Vertical Power MOSFETs
2024 Martinella, C.; Bonaldo, S.; Bagatin, M.; Gerardin, S.; Fur, N.; Gassenmeier, V.; Goncalves De Medeiros, H.; Paccagnella, A.; Grossner, U.
Impact of Tier Pitch Scaling on Heavy-Ion Sensitivity of 3-D NAND Flash Memories
2024 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Benvenuti, A.; Beltrami, S.
Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs
2024 Bonaldo, S.; Wallace, T.; Barnaby, H.; Borghello, G.; Termo, G.; Faccio, F.; Fleetwood, D. M.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Gerardin, S.
Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh Doses
2024 Bonaldo, S.; Martinella, C.; Race, S.; Fur, N.; Mattiazzo, S.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Grossner, U.
RD53 pixel chips for the ATLAS and CMS Phase-2 upgrades at HL-LHC
2024 Loddo, F.; Andreazza, A.; Arteche, F.; Barbero, M. B.; Barillon, P.; Beccherle, R.; Bilei, G. M.; Bjalas, W.; Bonaldo, S.; Bortoletto, D.; Calderini, G.; Caratelli, A.; Christian, D. C.; Christiansen, J.; Conti, E.; Crescioli, F.; Daas, M.; De Robertis, G.; Demaria, N.; Deptuch, G. C.; Dieter, Y.; Dimitrievska, A.; Ding, L.; Esposito, S.; Exarchou, D.; Fahim, F.; Fioriti, A.; Fougeron, D.; Gaioni, L.; Garcia-Sciveres, M.; Gerardin, S.; Gnani, D.; Grippo, M.; Gromov, V.; Hamer, M.; Havranek, M.; Heim, T.; Hemperek, T.; Hinterkeuser, F.; Hoff, J.; Huiberts, S.; Janssen, J.; Jara Casas, L. M.; Jirsa, J.; John, J. J.; Kampkotter, J.; Karagounis, M.; Khwaira, Y.; Kluit, R.; Krieger, A.; Krueger, H.; Lalic, J.; Lauritzen, M.; Licciulli, F.; Lipton, R.; Liu, T.; Lopez Morillo, E.; Lounis, A.; Luongo, F.; Magazzu, G.; Marcisovsky, M.; Marconi, S.; Marquez Lasso, F.; Marzocca, C.; Mattiazzo, S.; Menouni, M.; Minuti, M.; Mironova, M.; Miryala, S.; Monteil, E.; Moustakas, K.; Muõz Chavero, F.; Neue, G.; Orfanelli, S.; Paccagnella, A.; Pacher, L.; Palla, F.; Palomo Pinto, F. R.; Papadopoulou, A.; Paterno, A.; Petri, A.; Placidi, P.; Pohl, D.; Pradas, A.; Prydderch, M. L.; Pulli, A.; Ratti, L.; Re, V.; Rehman, A.; Rymaszewski, P.; Solal, M. C.; Standke, M.; Stiller, A.; Strebler, T.; Stugu, B.; Thomas, S.; Traversi, G.; Vogrig, D.; Vogt, M.; Wang, T.; Yang, H.; Zdenko, J.; Zimmerman, T.
Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory Cells
2024 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.
Depth Dependence of Neutron-induced Errors in 3D NAND Floating Gate Cells
2023 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Beltrami, S.; Benvenuti, A.; Cazzaniga, C.
Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs
2023 Bonaldo, S.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Margutti, G.; Gerardin, S.
Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN HEMTs
2023 Bonaldo, S.; Zhang, E. X.; Mattiazzo, S.; Paccagnella, A.; Gerardin, S.; Schrimpf, R. D.; Fleetwood, D. M.