BAGATIN, MARTA

BAGATIN, MARTA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 136 (tempo di esecuzione: 0.059 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Radiation and particle effects on avionics induced by Terrestrial Gamma-Ray Flashes In corso di stampa PACCAGNELLA, ALESSANDROBagatin M.BENVENUTI, PIERO + PHYSICAL REVIEW LETTERS - -
Displacement Damage and Total Ionizing Dose induced by 3-MeV Protons in SiC Vertical Power MOSFETs 2024 Bonaldo S.Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Impact of Tier Pitch Scaling on Heavy-Ion Sensitivity of 3-D NAND Flash Memories 2024 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs 2024 Bonaldo S.Mattiazzo S.Bagatin M.Paccagnella A.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh Doses 2024 Bonaldo S.Mattiazzo S.Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
TID effects in the lateral STI oxide of planar CMOS transistors 2024 Bonaldo S.Bagatin M.Mattiazzo S.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory Cells 2024 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Depth Dependence of Neutron-induced Errors in 3D NAND Floating Gate Cells 2023 Gerardin S.Bagatin M.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs 2023 Bonaldo S.Mattiazzo S.Bagatin M.Paccagnella A.Gerardin S. + ELECTRONICS - -
Nuclear physics midterm plan at Legnaro National Laboratories (LNL) 2023 Caciolli, A.Cicerchia, M.Depalo, R.Galtarossa, F.Lenzi, S. M.Mengoni, D.Bagatin, M.Carraro, C.De Dominicis, L.De Salvador, D.Lunardon, M.Mazzocco, M.Montagnoli, G.Morselli, L.Piatti, D.Polettini, M.Recchia, F.Sgarbossa, F.Silvestrin, L. + THE EUROPEAN PHYSICAL JOURNAL PLUS - -
Energy Deposition by Ultrahigh Energy Ions in Large and Small Sensitive Volumes 2022 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing 2022 Jain A.Gerardin S.Bagatin M. + IEEE JOURNAL OF SOLID-STATE CIRCUITS - -
Secondary Particles Generated by Protons in 3D NAND Flash Memories 2022 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Single Event Effects in 3D NAND Flash Memory Cells with Replacement Gate Technology 2022 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultra-High Doses 2022 Bonaldo S.Ma T.Mattiazzo S.Bagatin M.Paccagnella A.Gerardin S. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories 2021 Gerardin S.Bagatin M.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Depth Dependence of Threshold Voltage Shift in 3-D Flash Memories Exposed to X-Rays 2021 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
First tests of a new facility for device-level, board-level and system-level neutron irradiation of microelectronics 2021 Bagatin, MartaGerardin, Simone + IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - -
A Heavy-Ion Detector Based on 3-D NAND Flash Memories 2020 Bagatin M.Gerardin S.Paccagnella A. + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology 2020 Abhishek JainS. GerardinM. Bagatin + - - Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology