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Mostrati risultati da 61 a 80 di 223
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures 2014 BARBATO, MARCOCESTER, ANDREAMENEGHESSO, GAUDENZIO + PROCEEDINGS OF THE EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE - 44th European Solid State Device Research Conference (ESSDERC)
Characterization of High-Voltage Charge-Trapping Effects in GaN-based Power HEMTs 2014 BISI, DAVIDESTOCCO, ANTONIOMENEGHINI, MATTEORAMPAZZO, FABIANACESTER, ANDREAMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Solid State Device Research Conference (ESSDERC), 2014 44th European
Study of the effects of UV-exposure on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + - - 2013 IEEE International Reliability Physics Symposium, IRPS 2013
Degradation of AlGaN/GaN HET devices: role of reverse vias and hot electron stress 2013 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOSTOCCO, ANTONIOBISI, DAVIDEDE SANTI, CARLOROSSETTO, ISABELLAZANANDREA, ALBERTOCESTER, ANDREARAMPAZZO, FABIANAZANONI, ENRICO - - 18th Conference of "Insulating Films on Semiconductors" (INFOS2013)
Comparison between positive and negative constant current stress on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Effects of positive and negative constant voltage stress on organic TFTs 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 2013 IEEE International Reliability Physics Symposium, IRPS 2013
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Trapping phenomena in AlGaN/GaN HEMTs: A study based on pulsed and transient measurements 2013 MENEGHESSO, GAUDENZIOMENEGHINI, MATTEOBISI, DAVIDEROSSETTO, ISABELLACESTER, ANDREAZANONI, ENRICO + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOBARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Enhanced Permanent Degradation of Organic TFT under electrical stress and visible light exposure 2012 WRACHIEN, NICOLABARI, DANIELEMENEGHESSO, GAUDENZIOCESTER, ANDREA + - - 23st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012
Improved Tolerance against UV and Alpha Irradiation of Encapsulated Organic TFTs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - 2012 IEEE Nuclear and Space Radiation Effects Conference - NSREC 2012
Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells 2012 BARI, DANIELECESTER, ANDREAWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + - - 2012 IEEE Nuclear and Space Radiation Effects Conference - NSREC 2012
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED 2012 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Effects of Channel Hot Carrier Stress on III-V Bulk Planar MOSFETs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - IEEE IRPS2012, International Reliability Physics Symposium
Study of the effect of stress-induced trap level on OLED characteristics by numerical model 2012 CESTER, ANDREABARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO - - IEEE IRPS2012, International Reliability Physics Symposium
Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure 2012 WRACHIEN, NICOLABARI, DANIELEMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Organic Thin Film Transistor Degradation Under Sunlight Exposure 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + - - IEEE IRPS2012, International Reliability Physics Symposium
Reliability Study of Dye-Sensitized Solar Cells by means of Solar Simulator and White LED 2012 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + - - -
Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs) 2012 BARI, DANIELECESTER, ANDREAWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + IEEE JOURNAL OF PHOTOVOLTAICS - -
Mostrati risultati da 61 a 80 di 223
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