We irradiated Organic Thin-Film Transistors with wavelengths ranging in the visible and near ultraviolet parts of the solar spectrum, reporting strong degradation in few hours. We modeled the sunlight-induced permanent degradation, taking into account the mobility reduction. The model closely fits the experimental data, allowing the prediction of the device permanent degradation under sunlight exposure.

Organic Thin Film Transistor Degradation Under Sunlight Exposure

WRACHIEN, NICOLA;CESTER, ANDREA;BARI, DANIELE;MENEGHESSO, GAUDENZIO;
2012

Abstract

We irradiated Organic Thin-Film Transistors with wavelengths ranging in the visible and near ultraviolet parts of the solar spectrum, reporting strong degradation in few hours. We modeled the sunlight-induced permanent degradation, taking into account the mobility reduction. The model closely fits the experimental data, allowing the prediction of the device permanent degradation under sunlight exposure.
2012
IEEE IRPS2012, International Reliability Physics Symposium
IEEE IRPS2012, International Reliability Physics Symposium
9781457716782
9781457716799
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2521041
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