We subjected OTFTs to electrical stress under various illumination conditions, in the visible-light range. Negligible intrinsic degradation is observed without stress and light. Without stress, the permanent effects of light are very modest. When light and stress are applied simultaneously, the degradation is much stronger, than stress alone.

Enhanced Permanent Degradation of Organic TFT under electrical stress and visible light exposure

WRACHIEN, NICOLA;BARI, DANIELE;MENEGHESSO, GAUDENZIO;CESTER, ANDREA
2012

Abstract

We subjected OTFTs to electrical stress under various illumination conditions, in the visible-light range. Negligible intrinsic degradation is observed without stress and light. Without stress, the permanent effects of light are very modest. When light and stress are applied simultaneously, the degradation is much stronger, than stress alone.
2012
23st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012
23st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2526950
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