CARIA, ALESSANDRO

CARIA, ALESSANDRO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 28 (tempo di esecuzione: 0.041 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode 2023 Casu, C.Buffolo, M.Caria, A.Piva, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Breakdown Walkout in Polarization-Doped Vertical GaN Diodes 2019 Fabris E.Meneghesso G.Zanoni E.Meneghini M.De Santi C.Caria A. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Comparison between Cu(In,Ga)Se2 solar cells with different back contacts submitted to current stress 2022 Caria, ABuffolo, MDe Santi, CTrivellin, NVogrig, DZanoni, EMeneghesso, GMeneghini, M + MICROELECTRONICS RELIABILITY - -
Defect incorporation in In-containing layers and quantum wells: Experimental analysis via deep level profiling and optical spectroscopy 2021 Piva F.De Santi C.Caria A.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance 2023 Caria, ADe Santi, CBuffolo, MNicoletto, MMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation of InGaN-based LEDs: Demonstration of a recombination-dependent defect-generation process 2020 Renso, NDe Santi, CCaria, AMeneghesso, GZanoni, EMeneghini, M + JOURNAL OF APPLIED PHYSICS - -
Degradation of InGaN-based MQW solar cells under 405 nm laser excitation 2017 De Santi, C.Meneghini, M.CARIA, ALESSANDROZanoni, E.Meneghesso, G. + MICROELECTRONICS RELIABILITY - -
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: Role of silicone encapsulant 2023 Caria, A.Fraccaroli, R.De Santi, C.Buffolo, M.Trivellin, N.Zanoni, E.Meneghesso, G.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
Effect of indium content and carrier distribution on the efficiency and reliability of InGaN/GaN-based multi quantum well light emitting diode 2021 Casu C.Buffolo M.Caria A.De Santi C.Zanoni E.Meneghesso G.Meneghini M. MICROELECTRONICS RELIABILITY - -
Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact 2021 Bertoncello M.Barbato M.Caria A.Buffolo M.De Santi C.Vogrig D.Meneghesso G.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Evidence of optically induced degradation in gallium nitride optoelectronic devices 2018 De Santi, CarloCaria, AlessandroRenso, NicolaMedjdoub, FaridMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + APPLIED PHYSICS EXPRESS - -
Excitation intensity and temperature-dependent performance of ingan/gan multiple quantum wells photodetectors 2020 Caria A.De Santi C.Zanoni E.Meneghesso G.Meneghini M. + ELECTRONICS - -
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 2024 Roccato, NicolaPiva, FrancescoBuffolo, MatteoTrivellin, NicolaDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo IEEE TRANSACTIONS ON ELECTRON DEVICES - -
GaN-based high-periodicity multiple quantum well solar cells: Degradation under optical and electrical stress 2020 Caria A.De Santi C.Zamperetti F.Zhao Y.Neviani A.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
GaN-based laser wireless power transfer system 2018 De Santi, CarloMeneghini, MatteoCARIA, ALESSANDROKalinic, BorisCesca, TizianaMeneghesso, GaudenzioZanoni, Enrico + MATERIALS - -
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode 2022 Casu, ClaudiaBuffolo, MatteoCaria, AlessandroDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo MICROMACHINES - -
Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction 2020 Fabris, ElenaDe Santi, CarloCaria, AlessandroMukherjee, KalparupaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 2023 Nicoletto, MCaria, ARampazzo, FDe Santi, CBuffolo, MMeneghesso, GZanoni, EMeneghini, M + IEEE JOURNAL OF PHOTOVOLTAICS - -
Optically Induced Degradation Due to Thermally Activated Diffusion in GaN-Based InGaN/GaN MQW Solar Cells 2023 Nicoletto, MarcoCaria, AlessandroSanti, Carlo DeBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -