PILATI, MARCO

PILATI, MARCO  

Università di Padova  

Mostra records
Risultati 1 - 14 di 14 (tempo di esecuzione: 0.009 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Ageing effects on optical power characteristics and defects in SQW UV-C LEDs 2024 F. PivaM. BuffoloM. PilatiN. RoccatoS. LongatoC. De SantiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the GaN Marathon 2024
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 2022 F. PivaN. RoccatoM. BuffoloC. De SantiM. PilatiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Defects, performance, and reliability in UVC LEDs 2024 Meneghini, MatteoRoccato, NicolaPiva, FrancescoPilati, MarcoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proceedings of the SPIE Photonics West 2024
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 2023 Piva F.Buffolo M.De Santi C.Pilati M.Roccato N.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Degradation of AlGaN-based UV-C SQW LEDs analyzed by means of capacitance deep-level transient spectroscopy and numerical simulations 2023 Piva F.Pilati M.Buffolo M.Roccato N.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Degradation Physics of UV LEDs: from experimental data to models 2024 Matteo MeneghiniNicola RoccatoFrancesco PivaMarco PilatiCarlo De SantiMatteo BuffoloNicola TrivellinGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the 7th International Workshop on Ultraviolet Materials and Devices 2024
DLTS-based defect analysis in UV-C single QW LEDs during a constant current stress 2022 F. PivaM. BuffoloC. De SantiM. PilatiN. RoccatoG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of E-MRS fall 2022
Impact of high-temperature operating lifetime tests on the stability of 0.15 μm AlGaN/GaN HEMTs: a temperature-dependent analysis 2023 Pilati, M.Buffolo, M.Rampazzo, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
Investigation of degradation dynamics of 265 nm LEDs assisted by EL measurements and numerical simulations 2024 Piva, FrancescoBuffolo, MatteoRoccato, NicolaPilati, MarcoLongato, SimoneSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
Lifetime limiting degradation mechanisms of state-of-the-art UVC LEDs 2023 Enrico ZanoniFrancesco PivaMatteo BuffoloNicola TrivellinCarlo De SantiNicola RoccatoMarco PilatiGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of MRS fall 2023 conference
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations 2023 Roccato N.Piva F.De Santi C.Buffolo M.Fregolent M.Pilati M.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
On the degradation mechanisms of state-of-the-art UV-C LEDs 2023 Matteo BuffoloFrancesco PivaNicola RoccatoCarlo De SantiNicola TrivellinMarco PilatiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of ICNS-14
Optical Power Degradation Related to Turn-On in Commercial 265 nm UV-C LEDs 2024 Francesco PivaMatteo BuffoloMarco PilatiNicola RoccatoCarlo De SantiNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of the 31st IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
UV LEDs: defects and physics of degradation 2023 M. MeneghiniC. De SantiM. BuffoloF. PivaN. RoccatoM. PilatiG. MeneghessoE. Zanoni + - - Proceedings of the International Conference on UV LED Technologies & Applications 2023