MONTI, DESIREE

MONTI, DESIREE  

Università di Padova  

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Risultati 1 - 20 di 25 (tempo di esecuzione: 0.042 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Challenges for highly reliable GaN-based LEDs 2019 Zanoni E.De Santi C.Trivellin N.Renso N.Buffolo M.Monti D.Caria A.Piva F.Meneghesso G.Meneghini M. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Degradation processes of 280 nm high power DUV LEDs: Impact on parasitic luminescence 2019 Trivellin N.Monti D.Piva F.Buffolo M.De Santi C.Zanoni E.Meneghesso G.Meneghini M. JAPANESE JOURNAL OF APPLIED PHYSICS - -
Demonstration of band-to-band tunneling and avalanche regime in InGaN LEDs 2019 N. RensoC. De SantiP. DalapatiD. MontiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Evidence for avalanche generation in reverse-biased InGaN LEDs 2019 Renso N.De Santi C.Dalapati P.Monti D.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
High-Current Stress of UV-B (In)AlGaN-Based LEDs: Defect-Generation and Diffusion Processes 2019 Monti D.De Santi C.DA RUOS, SARAPIVA, FRANCESCOMeneghesso G.Zanoni E.Meneghini M. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Modeling of Thermal Droop in InGaN layers and UV-A LEDs: contribution of SRH recombination and thermionic escape 2019 C. De SantiM. MeneghiniD. MontiG. MeneghessoE. Zanoni - - Proceedings of the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13)
Reliability of Ultraviolet Light-Emitting Diodes 2019 C. De SantiD. MontiDalapati, PradipM. MeneghiniG. MeneghessoE. Zanoni - - Solid State Lighting Technology and Application Series
Current induced degradation study on state of the art DUV LEDs 2018 Trivellin, N.Monti, D.De Santi, C.Buffolo, M.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Defect-generation and diffusion in (In)AlGaN-based UV-B LEDs submitted to constant current stress 2018 Monti, D.Meneghini, M.De Santi, C.DA RUOS, SILVIAMeneghesso, G.Zanoni, E. + PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering
Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes 2018 Monti, D.Meneghini, M.De Santi, C.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Investigation of the Thermal Droop in InGaN-based Layers and UVA LEDs 2018 C. De SantiM. MeneghiniD. MontiG. MeneghessoE. Zanoni + - - Proceedings of the 2018 International Symposium on Growth of III-Nitrides (ISGN-7)
Performances and reliability analysis of 280nm High Power DUV LEDs 2018 N. TrivellinD. MontiM. BuffoloC. De SantiM. MeneghiniE. ZanoniG. Meneghesso - - Proceedings of the 2018 International Workshop on Nitride Semiconductors (IWN 2018)
Study of the reliability of GaN-based optoelectronic devices: UV-LEDs and InGaN-based laser diodes 2018 Monti, Desiree - - -
Defect generation during constant current stress of InGaN laser diodes 2017 Desiree MontiMatteo MeneghiniCarlo De SantiGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the Compound Semiconductor Week 2017
Defect generation in deep-UV AlGaN-based LEDs investigated by electrical and spectroscopic characterisation 2017 Monti, DesireeMeneghini, MatteoDe Santi, CarloMeneghesso, GaudenzioZanoni, Enrico + PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering
Defect-related degradation in InGaN laser diodes 2017 Desiree MontiMatteo MeneghiniCarlo De SantiGaudenzio MeneghessoEnrico Zanoni + - - Proceedings of the 19th Convegno Italiano delle Tecnologie Fotoniche (FOTONICA2017)
Defect-Related Degradation of AlGaN-Based UV-B LEDs 2017 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Long-term degradation of InGaN-based laser diodes: Role of defects 2017 Monti, D.Meneghini, M.De Santi, C.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Recombination mechanisms and thermal droop in ALGaN-based UV-B LEDs 2017 DE SANTI, CARLOMENEGHINI, MATTEOMONTI, DESIREEMENEGHESSO, GAUDENZIOZANONI, ENRICO + PHOTONICS RESEARCH - -
Aging behavior, reliability, and failure physics of GaN-based optoelectronic components 2016 ZANONI, ENRICOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIODE SANTI, CARLOLA GRASSA, MARCOBUFFOLO, MATTEOTRIVELLIN, NICOLAMONTI, DESIREE - - Proc. SPIE 9768, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX