RUZZARIN, MARIA
 Distribuzione geografica
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Continente #
NA - Nord America 2.172
AS - Asia 730
EU - Europa 556
AF - Africa 213
SA - Sud America 136
OC - Oceania 18
Continente sconosciuto - Info sul continente non disponibili 9
Totale 3.834
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Nazione #
US - Stati Uniti d'America 2.097
SG - Singapore 235
CN - Cina 181
IT - Italia 129
HK - Hong Kong 98
BR - Brasile 87
DE - Germania 71
PL - Polonia 70
FI - Finlandia 37
SE - Svezia 28
RU - Federazione Russa 25
FR - Francia 20
GB - Regno Unito 18
JP - Giappone 18
KR - Corea 16
IN - India 15
AT - Austria 13
CI - Costa d'Avorio 13
TR - Turchia 12
VN - Vietnam 12
AR - Argentina 11
BE - Belgio 10
NL - Olanda 10
SN - Senegal 10
TW - Taiwan 10
AO - Angola 9
CH - Svizzera 9
UA - Ucraina 9
ZA - Sudafrica 9
BO - Bolivia 8
CA - Canada 8
DK - Danimarca 7
EE - Estonia 7
GA - Gabon 7
JM - Giamaica 7
MR - Mauritania 7
PH - Filippine 7
PT - Portogallo 7
RO - Romania 7
SO - Somalia 7
YT - Mayotte 7
ZM - Zambia 7
AD - Andorra 6
AM - Armenia 6
BJ - Benin 6
BW - Botswana 6
CV - Capo Verde 6
DZ - Algeria 6
EC - Ecuador 6
EG - Egitto 6
ET - Etiopia 6
GF - Guiana Francese 6
GM - Gambi 6
GP - Guadalupe 6
ID - Indonesia 6
IQ - Iraq 6
KG - Kirghizistan 6
KH - Cambogia 6
LA - Repubblica Popolare Democratica del Laos 6
LV - Lettonia 6
MZ - Mozambico 6
PS - Palestinian Territory 6
SD - Sudan 6
TJ - Tagikistan 6
UZ - Uzbekistan 6
AU - Australia 5
BB - Barbados 5
BF - Burkina Faso 5
BG - Bulgaria 5
CD - Congo 5
CM - Camerun 5
CO - Colombia 5
GH - Ghana 5
GN - Guinea 5
GR - Grecia 5
HT - Haiti 5
IE - Irlanda 5
IL - Israele 5
IR - Iran 5
LU - Lussemburgo 5
MN - Mongolia 5
MY - Malesia 5
NP - Nepal 5
PK - Pakistan 5
PR - Porto Rico 5
UG - Uganda 5
YE - Yemen 5
AF - Afghanistan, Repubblica islamica di 4
AZ - Azerbaigian 4
BY - Bielorussia 4
BZ - Belize 4
CL - Cile 4
CW - ???statistics.table.value.countryCode.CW??? 4
DO - Repubblica Dominicana 4
ES - Italia 4
HU - Ungheria 4
IS - Islanda 4
JO - Giordania 4
KE - Kenya 4
LB - Libano 4
Totale 3.675
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Città #
Fairfield 291
Ashburn 226
Woodbridge 156
Singapore 154
Chandler 138
Ann Arbor 135
Cambridge 129
Houston 124
Seattle 114
Santa Clara 110
Hong Kong 97
Wilmington 91
Beijing 72
Leesburg 68
Bytom 61
Boardman 56
Munich 42
Medford 33
Princeton 33
Padova 32
Des Moines 28
San Diego 26
Helsinki 22
Los Angeles 14
New York 14
Hefei 13
Nanjing 13
Abidjan 12
Washington 11
Chicago 10
Guangzhou 10
Vienna 10
Dakar 9
Seoul 9
São Paulo 9
Council Bluffs 8
Luanda 8
Turku 8
Buffalo 7
Lusaka 7
Mamoudzou 7
Andorra la Vella 6
Basel 6
Boston 6
Cotonou 6
Hebei 6
Hwaseong-si 6
Jinan 6
Libreville 6
London 6
Maputo 6
Nouakchott 6
Nuremberg 6
Phnom Penh 6
Tashkent 6
Tokyo 6
Vientiane 6
Warsaw 6
Accra 5
Bridgetown 5
Conakry 5
Dallas 5
Dushanbe 5
Johannesburg 5
Kampala 5
Kinshasa 5
Redondo Beach 5
Roxbury 5
Tallinn 5
Addis Ababa 4
Amman 4
Antananarivo 4
Baku 4
Bamako 4
Banjul 4
Bishkek 4
Brooklyn 4
Castries 4
Chennai 4
Dublin 4
Guayaquil 4
Harare 4
Hargeisa 4
Khartoum 4
Kingston 4
Managua 4
Nairobi 4
Nanchang 4
Noumea 4
Panama City 4
Praia 4
Riga 4
Rio de Janeiro 4
Shenyang 4
Sofia 4
Ulan Bator 4
Yerevan 4
Apia 3
Baghdad 3
Cayenne 3
Totale 2.695
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Nome #
Degradation physics of GaN-based lateral and vertical devices 185
Positive and negative threshold voltage instabilities in GaN-based transistors 171
Gate Reliability of p-GaN Gate AlGaN/GaN High Electron Mobility Transistors 164
Evidence of Hot-Electron Degradation in GaN-based MIS-HEMTs Submitted to High Temperature Constant Source Current Stress 151
Reliability and failure analysis in power GaN-HEMTs: An overview 151
Demonstration of UV-Induced Threshold Voltage Instabilities in Vertical GaN Nanowire Array-Based Transistors 150
Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs 147
Negative bias-induced threshold voltage instability in GaN-on-Si power HEMTs 144
Degradation Mechanisms of GaN HEMTs with p-Type Gate under Forward Gate Bias Overstress 135
Reliability of GaN-Based Power Devices 133
Exploration of gate trench module for vertical GaN devices 133
GaN-based MIS-HEMTs: Impact of cascode-mode high temperature source current stress on NBTI shift 131
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs) 130
Degradation of vertical GaN FETs under gate and drain stress 128
Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias 125
Reliability of Power Devices: Bias-Induced Threshold Voltage Instability and Dielectric Breakdown in GaN MIS-HEMTs 123
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis 120
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments 118
Degradation of GaN-Based Lateral and Vertical Devices—Challenges and Perspectives 106
Reliability Issues in Lateral and Vertical GaN FETs for Power Electronics 105
Dielectric related issues in GaN based MIS HEMTs 101
Degradation Mechanisms of GaN-Based Vertical Devices: A Review 100
Reliability and Dynamic Performance of Gallium Nitride-based Devices for Power Applications 99
Recent Advancements in Power GaN Reliability 95
Highly stable threshold voltage in GaN nanowire FETs: The advantages of p-GaN channel/Al2O3gate insulator 93
Gallium Nitride power devices: challenges and perspectives 92
Instability of Dynamic- RONand Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors 90
Role of deep levels and time-dependent breakdown effects in determining performances and reliability of power GaN devices 85
Positive and negative Vth instabilities in Vertical GaN-on-GaN FinFET 77
Reliability physics of GaN HEMTs for power switching applications: role of the gate structure 71
Threshold Voltage Variations in Semi-vertical GaN-on-Si FETs: A Comprehensive Study 69
Study of the stability of GaN-HEMTs with p-type Gate under forward Gate Bias 65
Study of trapping in GaN-based power HEMTs based on High-Voltage Double-Pulsed Backgating Measurement System 58
Ring-Gate Reliability of p-GaN gate AlGaN/GaN High Electron Mobility Transistors 33
Totale 3.878
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Categoria #
all - tutte 13.187
article - articoli 6.447
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 407
Totale 20.041
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021276 0 0 0 8 8 4 23 80 40 32 58 23
2021/2022441 12 55 113 33 30 13 8 41 16 8 15 97
2022/2023321 57 8 9 33 83 29 1 31 45 4 8 13
2023/2024205 11 26 31 14 16 51 6 1 2 11 19 17
2024/2025820 1 35 25 51 118 65 20 72 43 23 153 214
2025/2026909 160 258 312 179 0 0 0 0 0 0 0 0
Totale 3.878