ZENARI, MICHELE
ZENARI, MICHELE
Dipartimento di Ingegneria dell'Informazione - DEI
Investigating the optical degradation of InAs quantum dot lasers on silicon through combined electro-optical characterization and gain measurements
2025 Zenari, M.; Novarese, M.; Buffolo, M.; De Santi, C.; Norman, J.; Hughes, E. T.; Bowers, J. E.; Herrick, R. W.; Gioannini, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Degradation of 1.3 μm Quantum Dot Laser Diodes for silicon photonics: dependence on the number of dot-in-a-well layers
2024 Zenari, Michele; Gioannini, Mariangela; Buffolo, Matteo; Tibaldi, Alberto; De Santi, Carlo; Norman, Justin; Shang, Chen; Dumont, Mario; Bowers, John E.; Herrick, Robert W.; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Impact of the oxide aperture width on the degradation of 845 nm VCSELs for silicon photonics
2024 Zenari, Michele; Buffolo, Matteo; Rampazzo, Fabiana; De Santi, Carlo; Rossi, Francesca; Lazzarini, Laura; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan; Baets, Roel; Larsson, Anders; Roelkens, Günther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics
2024 Zenari, Michele; Buffolo, Matteo; Santi, Carlo De; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan; Baets, Roel; Larsson, Anders; Roelkens, Günther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization
2023 Zenari, Michele; Buffolo, Matteo; De Santi, Carlo; Norman, Justin; Hughes, Eamonn T.; Bowers, John E.; Herrick, Robert; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
2023 Zenari, M; Buffolo, M; Fornasier, M; De Santi, C; Goyvaerts, J; Grabowski, A; Gustavsson, J; Kumari, S; Stassren, A; Baets, R; Larsson, A; Roelkens, G; Meneghesso, G; Zanoni, E; Meneghini, M
Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon
2022 Zenari, M.; Buffolo, M.; De Santi, C.; Shang, C.; Hughes, E.; Wan, Y.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate
2022 Buffolo, M.; Lain, F.; Zenari, M.; Santi, C. D.; Norman, J.; Bowers, J. E.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate
2021 Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Bowers, J.; Meneghini, M.
Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications
2021 Zenari, M.; Buffolo, M.; De Santi, C.; Norman, J.; Meneghesso, G.; Bowers, J. E.; Zanoni, E.; Meneghini, M.