ROCCATO, NICOLA
 Distribuzione geografica
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Continente #
EU - Europa 416
NA - Nord America 367
AS - Asia 261
SA - Sud America 2
Totale 1.046
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Nazione #
US - Stati Uniti d'America 357
IT - Italia 306
SG - Singapore 93
CN - Cina 89
KR - Corea 30
DE - Germania 27
FR - Francia 24
JP - Giappone 23
GB - Regno Unito 11
RU - Federazione Russa 10
CH - Svizzera 9
FI - Finlandia 9
IN - India 7
CA - Canada 5
HK - Hong Kong 5
MX - Messico 5
PL - Polonia 5
TW - Taiwan 4
AT - Austria 3
HU - Ungheria 3
IE - Irlanda 3
IR - Iran 3
CL - Cile 2
MY - Malesia 2
PK - Pakistan 2
SA - Arabia Saudita 2
SE - Svezia 2
GR - Grecia 1
LT - Lituania 1
NL - Olanda 1
PH - Filippine 1
UA - Ucraina 1
Totale 1.046
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Città #
Padova 140
Riese Pio X 106
Singapore 81
Santa Clara 76
Ashburn 55
Boardman 38
Beijing 24
Chandler 21
Shanghai 20
New York 16
Tokyo 16
Los Angeles 12
Turin 12
Milan 8
Lausanne 7
Washington 7
Yongin-si 7
Helsinki 6
Suwon 6
Fairfield 5
Jena 5
New Delhi 5
Scorzè 5
Ube 5
Berlin 4
Raleigh 4
Treviso 4
Tuxtla Gutiérrez 4
Braunschweig 3
Budapest 3
Cambridge 3
Dallas 3
Grenoble 3
Lappeenranta 3
Liverpool 3
Medford 3
Ogden 3
Princeton 3
Prineville 3
Reggio Emilia 3
Taichung 3
Agordo 2
Ann Arbor 2
Antibes 2
Arzignano 2
Ascoli Piceno 2
Aţ Ţuwāl 2
Bagneux 2
Baldwin 2
Castel Gandolfo 2
Detmold 2
Duisburg 2
Hangzhou 2
Houston 2
Ithaca 2
Little Attock 2
London 2
Mahomet 2
Montbonnot-Saint-Martin 2
Montreal 2
Paderno Dugnano 2
Prescot 2
Pune 2
Pułtusk 2
Roxbury 2
Saint-Lambert 2
Saint-Martin-le-Vinoux 2
Santiago 2
Sassari 2
Seoul 2
Shah Alam 2
Traiskirchen 2
Wilmington 2
Żoliborz 2
Amsterdam 1
Birmingham 1
Bologna 1
Borgonovo Val Tidone 1
Bremblens 1
Chiswick 1
Columbia 1
Columbus 1
Cork 1
Davao City 1
Des Moines 1
Ferrara 1
Forlì 1
Fort Worth 1
Glasgow 1
Gothenburg 1
Guangzhou 1
Gwangju 1
Hamburg 1
Helixi 1
Kharkiv 1
Kilburn 1
Kochi 1
Kyoto 1
Las Vegas 1
Miami 1
Totale 830
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Nome #
Modeling the optical degradation kinetics of UV-C LEDs 115
Reliability and efficiency-limiting mechanisms in III-N LEDs: an experimental analysis assisted by numerical simulations 60
III-N optoelectronics: defects, reliability and challenges 55
Modeling the electrical characteristics of InGaN/GaN LED structures based on experimentally-measured defect characteristics 50
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 48
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 45
Effects of quantum-well indium content on deep defects and reliability of InGaN/GaN light-emitting diodes with under layer 43
Modeling of TAT-related forward leakage current in InGaN/GaN SQW LEDs based on experimentally-determined defects parameters 36
Degradation of AlGaN-based UV-C SQW LEDs analyzed by means of capacitance deep-level transient spectroscopy and numerical simulations 35
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics 35
Probing carrier transport and recombination processes in dichromatic GaN-based LEDs: a nonequilibrium Green’s function study 34
Deep defects in InGaN LEDs: modeling the impact on the electrical characteristics 34
Discriminating the effects of deep-levels in InGaN/GaN LEDs: impact on forward leakage current 34
DLTS-based defect analysis in UV-C single QW LEDs during a constant current stress 32
UV LED reliability: degradation mechanisms and challenges 32
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 30
III-N optoelectronic devices: understanding the physics of electro-optical degradation 28
III-N optical devices: physical processes limiting efficiency and reliability 28
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations 28
Fast Characterization of Power LEDs: Circuit Design and Experimental Results 24
On the degradation mechanisms of state-of-the-art UV-C LEDs 23
Optical Power Degradation Related to Turn-On in Commercial 265 nm UV-C LEDs 22
Ageing effects on optical power characteristics and defects in SQW UV-C LEDs 22
Modeling the electrical characteristic of InGaN/GaN blue-violet LED structure under electrical stress 20
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs 19
Lifetime limiting degradation mechanisms of state-of-the-art UVC LEDs 19
Degradation Physics of UV LEDs: from experimental data to models 17
Investigation of degradation dynamics of 265 nm LEDs assisted by EL measurements and numerical simulations 17
Investigation and modeling of the role of interface defects in the optical degradation of InGaN/GaN LEDs 17
On the importance of Fast and Accurate LED Optical and Thermal Characterization: from visible use cases to UV technologies 15
Modeling the electrical characteristic and degradation mechanisms of UV-C LEDs 14
Defects, performance, and reliability in UVC LEDs 12
Modeling the degradation mechanisms of UV-C LEDs 11
Reliability analysis of high power LEDs for automotive: impact of current and temperature 10
UV LEDs: defects and physics of degradation 9
Physical processes leading to the degradation of UV-C LEDs and their modeling by defect reactions and numerical simulations 7
Totale 1.080
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Categoria #
all - tutte 6.014
article - articoli 2.177
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 8.191
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/202235 0 0 6 0 0 1 4 3 1 0 14 6
2022/2023138 6 4 10 2 15 13 16 12 25 0 9 26
2023/2024334 34 28 19 31 38 40 31 9 27 18 24 35
2024/2025573 23 45 146 59 108 192 0 0 0 0 0 0
Totale 1.080