NICOLETTO, MARCO

NICOLETTO, MARCO  

Università di Padova  

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Risultati 1 - 8 di 8 (tempo di esecuzione: 0.059 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance 2023 Caria, ADe Santi, CBuffolo, MNicoletto, MMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Inclusive 7Be production cross section in the 8B + 208Pb system at the Coulomb barrier 2024 Mazzocco, M.Parascandolo, C.Torresi, D.Nicoletto, M.Pigliapoco, S.Soramel, F.Yang, Y. Y. + PHYSICAL REVIEW C - -
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 2023 Nicoletto, MCaria, ARampazzo, FDe Santi, CBuffolo, MMeneghesso, GZanoni, EMeneghini, M + IEEE JOURNAL OF PHOTOVOLTAICS - -
Optically Induced Degradation Due to Thermally Activated Diffusion in GaN-Based InGaN/GaN MQW Solar Cells 2023 Nicoletto, MarcoCaria, AlessandroSanti, Carlo DeBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Quantum efficiency of InGaN-GaN multi-quantum well solar cells: Experimental characterization and modeling 2022 Caria A.Nicoletto M.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Role of p-GaN layer thickness in the degradation of InGaN-GaN MQW solar cells under 405 nm laser excitation 2022 Nicoletto M.Caria A.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
TCAD Modeling and Simulation of Dark Current-Voltage Characteristics in High-Periodicity InGaN/GaN Multiple-Quantum-Wells (MQWs) Solar Cells 2024 Nicoletto, MarcoCaria, AlessandroDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE JOURNAL OF PHOTOVOLTAICS - -
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis 2024 Nicoletto, MarcoCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoGasparotto, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -