GRIFFONI, ALESSIO
GRIFFONI, ALESSIO
An Insight into effects Induced by Heavy-Ion Strikes in SCR ESD Protection Structures
2011 Griffoni, Alessio; S., Thijs; S. H., Chen; Tazzoli, Augusto; M., Cordoni; P., Colombo; Paccagnella, Alessandro; D., Linten; Meneghesso, Gaudenzio; G., Groeseneken
Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs
2010 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Electrical-Based ESD Characterization of Ultrathin-Body SOI MOSFETs
2010 Griffoni, Alessio; Thijs, S; Russ, C; Tremouilles, D; Linten, D; Scholz, M; Simoen, E; Claeys, C; Meneghesso, Gaudenzio; Groeseneken, G.
ESD and Ionizing Radiation Effects on Ultrathin Body SOI and Multiple Gate Technologies
2010 Griffoni, Alessio
Impact of radiation on the operation and reliability of deep submicron CMOS
2010 C., Claeys; S., Put; Griffoni, Alessio; Cester, Andrea; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen
Impact of radiation on the operation and reliability of deep submicron CMOS
2010 C., Claeys; S., Put; Griffoni, Alessio; Cester, Andrea; S., Gerardin; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen
A Statistical Approach to Microdose Induced Degradation in FinFET Devices
2009 Griffoni, Alessio; Gerardin, Simone; Roussel, Pj; Degraeve, R; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
An Insight into the Parasitic Capacitances of SOI and Bulk FinFET Devices
2009 Griffoni, Alessio; S., Thijs; D., Linten; M., Scholz; G., Groeseneken; Meneghesso, Gaudenzio
Angular and strain dependence of heavy-ions induced degradation in SOI FinFETs2009 European Conference on Radiation and Its Effects on Components and Systems
2009 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Eddy, Simoen; Cor, Claeys
Dose Enhancement Due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays
2009 Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Kaczer, B; DE TEN BROECK, Md; Verbeeck, R; Nackaerts, A.
ESD Constraints of Bulk FinFET in Comparison with SOI FinFET Structures
2009 Griffoni, Alessio; S., Thijs; C., Russ; D., Tremouilles; D., Linten; M., Scholz; N., Collaert; L., Witters; Meneghesso, Gaudenzio; G., Groeseneken
Next Generation FinFET Devices in Bulk Silicon Technology and Their Benefits for ESD Robustness
2009 Griffoni, Alessio; S., Thijs; C., Russ; D., Tremouilles; D., Linten; M., Scholz; N., Collaert; L., Witters; Meneghesso, Gaudenzio; G., Groeseneken
On-Wafer Human Metal Model Measurements for System-Level ESD Analysis on Component Level
2009 M., Scholz; D., Linten; S., Thijs; Griffoni, Alessio; M., Sawada; T., Nakaei; T., Hasebe; D., Lafonteese; V., Vashchenko; G., Vandersteen; P., Hopper; Meneghesso, Gaudenzio; G., Groeseneken
Dose Enhancement due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays
2008 Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; B., Kaczer; M., DE POTTER DE TEN BROECK; R., Verbeeck; AND A., Nackaerts
Electrostatic Discharge Effects In Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide and Different Strain-Inducing Techniques
2008 Griffoni, Alessio; Tazzoli, Augusto; Gerardin, Simone; E., Simoen; C., Claeys; Meneghesso, Gaudenzio
ESD Sensitivity of 65nm Fully Depleted SOI MOSFETs with Different Strain-Inducing Techniques
2008 Griffoni, Alessio; Tazzoli, Augusto; Gerardin, Simone; E., Simoen; C., Claeys; Meneghesso, Gaudenzio
Impact of Strain on ESD Robustness of FinFET Devices
2008 Griffoni, Alessio; S., Thijs; C., Russ; D., Tremouilles; M., Scholz; D., Linten; N., Collaert; R., Rooyackers; C., Duvvury; H., Gossner; Meneghesso, Gaudenzio; G., Groeseneken
Ionizing Radiation Effects on Advanced CMOS Devices and on ESD Protection Structures for CMOS Technology
2008 Griffoni, Alessio; Meneghesso, Gaudenzio; Paccagnella, Alessandro
Microdose and Breakdown Effects Induced by Heavy Ions on sub 20-nm Triple-Gate SOI FETs
2008 Griffoni, Alessio; S., Gerardin; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen; S., Put; C., Claeys
Microdose and Breakdown Effects Induced by Heavy Ions on sub 32-nm Triple-Gate SOI FETs
2008 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; E., Simoen; S., Put; C., Claeys