PACCAGNELLA, ALESSANDRO
PACCAGNELLA, ALESSANDRO
Dipartimento di Ingegneria dell'Informazione - DEI
1GigaRad TID impact on 28 nm HEP analog circuits
2018 Resta, F.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; De Matteis, M.; Enz, C.; Baschirotto, A.
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories
2021 Gerardin, S.; Bagatin, M.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Santin, G.; Pesce, A.; Ferlet-Cavrois, V.; Voss, K.
A Heavy-Ion Detector Based on 3-D NAND Flash Memories
2020 Bagatin, M.; Frost, C.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Costantino, A.; Poivey, C.; Santin, G.; Ferlet-Cavrois, V.; Cazzaniga, C.
A MODEL OF RADIATION INDUCED LEAKAGE CURRENT (RILC) IN ULTRA-THIN OXIDES
1999 Larcher, L.; Paccagnella, Alessandro; Ceschia, M.; Ghidini, G.
A new experimental technique to evaluate the plasma induced damage at wafer level testing
1998 L., Pantisano; Paccagnella, Alessandro; L., Pettarin; A., Scarpa; G., Valentini; L., Baldi; S., Alba
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility
2007 Violante, M; Sterpone, L.; Manuzzato, Andrea; Gerardin, Simone; Rech, Paolo; Bagatin, Marta; Paccagnella, Alessandro; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Pontarelli, S.; Frost, C.
A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics
2022 Rosati, G.; Urban, M.; Zhao, L.; Yang, Q.; de Carvalho Castro e Silva, C.; Bonaldo, S.; Parolo, C.; Nguyen, E. P.; Ortega, G.; Fornasiero, P.; Paccagnella, A.; Merkoci, A.
A SPICE model for Si microstrip detectors and read-out electronics
1996 N., Bacchetta; Bisello, Dario; C., Calgarotto; Candelori, Andrea; Paccagnella, Alessandro
A SPICE model of the ohmic side of double-sided Si microstrip detectors
1997 Candelori, Andrea; Paccagnella, Alessandro; F., Bonin; N., Bacchetta; M., Darold; Bisello, Dario
A Statistical Approach to Microdose Induced Degradation in FinFET Devices
2009 Griffoni, Alessio; Gerardin, Simone; Roussel, Pj; Degraeve, R; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation
2003 Cester, Andrea; S., Cimino; Paccagnella, Alessandro; G., Ghibaudo; G., Ghidini; J., Wyss
Alignment of the CMS silicon strip tracker during stand-alone commissioning
2009 Adam, W; Bergauer, T; Dragicevic, M; Friedl, M; Fruhwirth, R; Hansel, S; Hrubec, J; Krammer, M; Oberegger, M; Pernicka, M; Schmid, S; Stark, R; Steininger, H; Uhl, D; Waltenberger, W; Widl, E; VAN MECHELEN, P; Cardaci, M; Beaumont, W; DE LANGHE, E; DE WOLF, Ea; Delmeire, E; Hashemi, M; Bouhali, O; Charaf, O; Clerbaux, B; Dewulf, Jp; Elgammal, S; Hammad, G; DE LENTDECKER, G; Marage, P; Velde, Cv; Vanlaer, P; Wickens, J; Adler, V; Devroede, O; DE WEIRDT, S; D'Hondt, J; Goorens, R; Heyninck, J; Maes, J; Mozer, M; Tavernier, S; VAN LANCKER, L; VAN MULDERS, P; Villella, I; Wastiels, C; Bonnet, Jl; Bruno, G; DE CALLATAY, B; Florins, B; Giammanco, A; Gregoire, G; Keutgen, T; Kcira, D; Lemaitre, V; Michotte, D; Militaru, O; Piotrzkowski, K; Quertermont, L; Roberfroid, V; Rouby, X; Teyssier, D; Daubie, E; Anttila, E; Czellar, S; Engstrom, P; Harkonen, J; Karimaki, V; Kostesmaa, J; Kuronen, A; Lampen, T; Linden, T; Luukka, Pr; Maenaa, T; Michal, S; Tuominen, E; Tuominiemi, J; Ageron, M; Baulieu, G; Bonnevaux, A; Boudoul, G; Chabanat, E; Chabert, E; Chierici, R; Contardo, D; DELLA NEGRA, R; Dupasquier, T; Gelin, G; Giraud, N; Guillot, G; Estre, N; Haroutunian, R; Lumb, N; Perries, S; Schirra, F; Trocme, B; Vanzetto, S; Agram, Jl; Blaes, R; Drouhin, F; Ernenwein, Jp; Fontaine, Jc; Berst, Jd; Brom, Jm; Didierjean, F; Goerlach, U; Graehling, P; Gross, L; Hosselet, J; Juillot, P; Lounis, A; Maazouzi, C; Olivetto, C; Strub, R; VAN HOVE, P; Anagnostou, G; Brauer, R; Esser, H; Feld, L; Karpinski, W; Klein, K; Kukulies, C; Olzem, J; Ostapchuk, A; Pandoulas, D; Pierschel, G; Raupach, F; Schael, S; Schwering, G; Sprenger, D; Thomas, M; Weber, M; Wittmer, B; Wlochal, M; Beissel, F; Bock, E; Flugge, G; Gillissen, C; Hermanns, T; Heydhausen, D; Jahn, D; Kaussen, G; Linn, A; Perchalla, L; Poettgens, M; Pooth, O; Stahl, A; Zoeller, Mh; Buhmann, P; Butz, E; Flucke, G; Hamdorf, R; Hauk, J; Klanner, R; Pein, U; Schleper, P; Steinbruck, G; Blum, P; DE BOER, W; Dierlamm, A; Dirkes, G; Fahrer, M; Frey, M; Furgeri, A; Hartmann, F; Heier, S; Hoffmann, Kh; Kaminski, J; Ledermann, B; Liamsuwan, T; Muller, S; Muller, T; Schilling, Fp; Simonis, Hj; Steck, P; Zhukov, V; Cariola, P; DE ROBERTIS, G; Ferorelli, R; Fiore, L; Preda, M; Sala, G; Silvestris, L; Tempesta, P; Zito, G; Creanza, D; DE FILIPPIS, N; DE PALMA, M; Giordano, D; Maggi, G; Manna, N; My, S; Selvaggi, G; Albergo, S; Chiorboli, M; Costa, S; Galanti, M; Giudice, N; Guardone, N; Noto, F; Potenza, R; Saizu, Ma; Sparti, V; Sutera, C; Tricomi, A; Tuve, C; Brianzi, M; Civinini, C; Maletta, F; Manolescu, F; Meschini, M; Paoletti, S; Sguazzoni, G; Broccolo, B; Ciulli, V; Focardi, Rde; Frosali, S; Genta, C; Landi, G; Lenzi, P; Macchiolo, A; Magini, N; Parrini, G; Scarlini, E; Cerati, G; Azzi, P; Bacchetta, N; Candelori, A; Dorigo, T; Kaminsky, A; Karaevski, S; Khomenkov, V; Reznikov, S; Tessaro, M; Bisello, Dario; DE MATTIA, M; Giubilato, Piero; Loreti, M; Mattiazzo, Serena; Nigro, M; Paccagnella, Alessandro; Pantano, D; Pozzobon, Nicola; Tosi, M; Bilei, Gm; Checcucci, B; Fano, L; Servoli, L; Ambroglini, F; Babucci, E; Benedetti, D; Biasini, M; Caponeri, B; Covarelli, R; Giorgi, M; Lariccia, P; Mantovani, G; Marcantonini, M; Postolache, V; Santocchia, A; Spiga, D; Bagliesi, G; Balestri, G; Berretta, L; Bianucci, S; Boccali, T; Bosi, F; Bracci, F; Castaldi, R; Ceccanti, M; Cecchi, R; Cerri, C; Cucoanes, As; Dell'Orso, R; Dobur, D; Dutta, S; Giassi, A; Giusti, S; Kartashov, D; Kraan, A; Lomtadze, T; Lungu, Ga; Magazzu, G; Mammini, P; Mariani, F; Martinelli, G; Moggi, A; Palla, F; Palmonari, F; Petragnani, G; Profeti, A; Raffaelli, F; Rizzi, D; Sanguinetti, G; Sarkar, S; Sentenac, D; Serban, At; Slav, A; Soldani, A; Spagnolo, P; Tenchini, R; Tolaini, S; Venturi, A; Verdini, Pg; Vos, M; Zaccarelli, L; Avanzini, C; Basti, A; Benucci, L; Bocci, A; Cazzola, U; Fiori, F; Linari, S; Massa, M; Messineo, A; Segneri, G; Tonelli, G; Azzurri, P; Bernardini, J; Borrello, L; Calzolari, F; Foa, L; Gennai, S; Ligabue, F; Petrucciani, G; Rizzi, A; Yang, Z; Benotto, F; Demaria, N; Dumitrache, F; Farano, R; Borgia, Ma; Castello, R; Costa, M; Migliore, E; Romero, A; Abbaneo, D; Abbas, M; Ahmed, I; Akhtar, I; Albert, E; Bloch, C; Breuker, H; Butt, S; Buchmuller, O; Cattai, A; Delaere, C; Delattre, M; Edera, Lm; Engstrom, P; Eppard, M; Gateau, M; Gill, K; GIOLO NICOLLERAT, As; Grabit, R; Honma, A; Huhtinen, M; Kloukinas, K; Kortesmaa, J; Kottelat, Lj; Kuronen, A; Leonardo, N; Ljuslin, C; Mannelli, M; Masetti, L; Marchioro, A; Mersi, S; Michal, S; Mirabito, L; MUFFAT JOLY, J; Onnela, A; Paillard, C; Pal, I; Pernot, Jf; Petagna, P; Petit, P; Piccut, C; Pioppi, M; Postema, H; Ranieri, R; Ricci, D; Rolandi, G; Ronga, F; Sigaud, C; Syed, A; Siegrist, P; Tropea, P; Troska, J; Tsirou, A; Donckt, Mv; Vasey, F; Alagoz, E; Amsler, C; Chiochia, V; Regenfus, C; Robmann, P; Rochet, J; Rommerskirchen, T; Schmidt, A; Steiner, S; Wilke, L; Church, I; Cole, J; Coughlan, J; Gay, A; Taghavi, S; Tomalin, I; Bainbridge, R; Cripps, N; Fulcher, J; Hall, G; Noy, M; Pesaresi, M; Radicci, V; Raymond, Dm; Sharp, P; Stoye, M; Wingham, M; Zorba, O; Goitom, I; Hobson, Pr; Reid, I; Teodorescu, L; Hanson, G; Jeng, Gy; Liu, H; Pasztor, G; Satpathy, A; Stringer, R; Mangano, B; Affolder, K; Affolder, T; Allen, A; Barge, D; Burke, S; Callahan, D; Campagnari, C; Crook, A; D'Alfonso, M; Dietch, J; Garberson, J; Hale, D; Incandela, H; Incandela, J; Jaditz, S; Kalavase, P; Kreyer, S; Kyre, S; Lamb, J; MC GUINNESS, C; Mills, C; Nguyen, H; Nikolic, M; Lowette, S; Rebassoo, F; Ribnik, J; Richman, J; Rubinstein, N; Sanhueza, S; Shah, Y; Simms, L; Staszak, D; Stoner, J; Stuart, D; Swain, S; Vlimant, Jr; White, D; Ulmer, Ka; Wagner, Sr; Bagby, L; Bhat, Pc; Burkett, K; Cihangir, S; Gutsche, O; Jensen, H; Johnson, M; Luzhetskiy, N; Mason, D; Miao, T; Moccia, S; Noeding, C; Ronzhin, A; Skup, E; Spalding, Wj; Spiegel, L; Tkaczyk, S; Yumiceva, F; Zatserklyaniy, A; Zerev, E; Anghel, I; Bazterra, Ve; Gerber, Ce; Khalatian, S; Shabalina, E; Baringer, P; Bean, A; Chen, J; Hinchey, C; Martin, C; Moulik, T; Robinson, R; Gritsan, Av; Lae, Ck; Tran, Nv; Everaerts, P; Hahn, Ka; Harris, P; Nahn, S; Rudolph, M; Sung, K; Betchart, B; Demina, R; Gotra, Y; Korjenevski, S; Miner, D; Orbaker, D; Christofek, L; Hooper, R; Landsberg, G; Nguyen, D; Narain, M; Speer, T; Tsang, Kv
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications
2022 Tonello, S.; Fapanni, T.; Bonaldo, S.; Giorgi, G.; Narduzzi, C.; Paccagnella, A.; Serpelloni, M.; Sardini, E.; Carrara, S.
Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation
2014 Lili, Ding; Hongxia, Guo; Wei, Chen; Zhibin, Yao; Yihua, Yan; Dongliang, Chen; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Lei, Chen; Huabo, Sun; Ruyu, Fan
Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs
2010 Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, E; Claeys, C.
Angular dependence of heavy ion effects in Floating Gate memory arrays
2007 Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Bonanomi, M; HARBOE SORENSEN, R; Virtanen, A.
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate Memories
2011 Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; A., Visconti; M., Bonanomi; S., Beltrami
Annealing of Heavy-Ion Induced Floating Gate Errors: LET and Feature Size Dependence
2010 Bagatin, Marta; Gerardin, Simone; Cellere, Giorgio; Paccagnella, Alessandro; Visconti, A; Beltrami, S; Bonanomi, M; HARBOE SORENSEN, R.
Aspect ratio calculation in n-channel MOSFET with a gate-enclosed layout
2000 A., Giraldo; Paccagnella, Alessandro; A., Minzoni
Atmospheric Neutron Soft Errors in 3D NAND Flash Memories
2019 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.; Cazzaniga, C.; Frost, C. D.