PACCAGNELLA, ALESSANDRO
PACCAGNELLA, ALESSANDRO
Dipartimento di Ingegneria dell'Informazione - DEI
Radiation and particle effects on avionics induced by Terrestrial Gamma-Ray Flashes
In corso di stampa Tavani, M.; Argan, A.; Paccagnella, Alessandro; Pesoli, A.; Palma, F.; Gerardin, S.; Bagatin, M.; Trois, A.; Picozza, P.; Benvenuti, Piero; Flamini, E.
COTS BJT Radiation Qualification Methodology for Highly Distributed Systems in Mixed-Field Environments
2025 Andreetta, G.; Ferraro, R.; Zimmaro, A.; Bonaldo, S.; Paccagnella, A.; Thurel, Y.; Masi, A.; Danzeca, S.
Flexible microfluidics-integrated electrochemical system for detection of tumor necrosis factor-alpha under continuous flow of sweat
2025 Ploner, M.; Shkodra, B.; Franchin, L.; Altana, A.; Petrelli, M.; Costa Angeli, M. A.; Ciccone, G.; Antrack, T.; Vanzetti, L.; Nair, R. R.; Canteri, R.; Bonaldo, S.; Paccagnella, A.; Kleemann, H.; Resnati, D.; Lugli, P.; Erten, A.; Petti, L.
Plasmonic Biosensor of Cruzipain-Antibody Complexes Based on Gold Nano-gratings for Chagas Disease Screening
2025 Chain, C. Y.; Prieto, E. D.; Cisneros, J. S.; Daza Millone, M. A.; Ramirez, E. A.; Labriola, C. A.; Aniasi, V.; Villagra, A. P. M.; Franchin, L.; Paccagnella, A.; Bonaldo, S.
Total-Dose-Induced Threshold Voltage Shift Dependence on Tier Pitch in 3-D nand Flash Memories
2025 Bagatin, Marta; Beltrami, Silvia; Paccagnella, Alessandro; Gerardin, Simone
Total-Ionizing-Dose and Displacement Damage Effects in Trench SiC Power MOSFETs
2025 Bonaldo, S.; Martinella, C.; Bagatin, M.; Gerardin, S.; Natzke, P.; Kupper, R.; Fur, N.; Mattiazzo, S.; Paccagnella, A.; Grossner, U.
X-Ray Effects on Alpha-Induced Soft Error Rate in 3-D NAND Replacement Gate Flash Memory Cells
2025 Bagatin, Marta; Beltrami, Silvia; Paccagnella, Alessandro; Gerardin, Simone
Bacteria-Based Biosensor for the Detection of Lactococcus Lactis Bacteriophage in Agrifood Industry
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Bertozzi, T.; Paccagnella, A.
Displacement Damage and Total Ionizing Dose induced by 3-MeV Protons in SiC Vertical Power MOSFETs
2024 Martinella, C.; Bonaldo, S.; Bagatin, M.; Gerardin, S.; Fur, N.; Gassenmeier, V.; Goncalves De Medeiros, H.; Paccagnella, A.; Grossner, U.
Electrochemical Biosensor for the Monitoring of Phages of in Milk-Based Samples
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Paccagnella, A.
Impact of Tier Pitch Scaling on Heavy-Ion Sensitivity of 3-D NAND Flash Memories
2024 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Benvenuti, A.; Beltrami, S.
Impedimetric Screen-Printed Immunosensor for the Rapid Detection of Chagas Disease
2024 Chain, C. Y.; Franchin, L.; Cisneros, J. S.; Villagra, A. P. M.; Labriola, C. A.; Paccagnella, A.; Bonaldo, S.
Influence of Surface Passivation on Campylobacter jejuni Specificity of an Impedimetric Genosensor for Poultry Infection Monitoring in Agri-food Industry
2024 Franchin, L.; Paccagnella, A.; Bonaldo, S.
Monitoring of Lactococcus lactis growth based on Reduced-Graphene Oxide TFT for Dairy Industry Applications
2024 Franchin, L.; Casalini, S.; Cester, A.; Paccagnella, A.; Bonaldo, S.
Multiphysics modeling of the electrochemical response of screen-printed electrodes for sensing applications
2024 Bonaldo, S.; Franchin, L.; Rosati, G.; Merkoci, A.; Paccagnella, A.
Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs
2024 Bonaldo, S.; Wallace, T.; Barnaby, H.; Borghello, G.; Termo, G.; Faccio, F.; Fleetwood, D. M.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Gerardin, S.
Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh Doses
2024 Bonaldo, S.; Martinella, C.; Race, S.; Fur, N.; Mattiazzo, S.; Bagatin, M.; Gerardin, S.; Paccagnella, A.; Grossner, U.
RD53 pixel chips for the ATLAS and CMS Phase-2 upgrades at HL-LHC
2024 Loddo, F.; Andreazza, A.; Arteche, F.; Barbero, M. B.; Barillon, P.; Beccherle, R.; Bilei, G. M.; Bjalas, W.; Bonaldo, S.; Bortoletto, D.; Calderini, G.; Caratelli, A.; Christian, D. C.; Christiansen, J.; Conti, E.; Crescioli, F.; Daas, M.; De Robertis, G.; Demaria, N.; Deptuch, G. C.; Dieter, Y.; Dimitrievska, A.; Ding, L.; Esposito, S.; Exarchou, D.; Fahim, F.; Fioriti, A.; Fougeron, D.; Gaioni, L.; Garcia-Sciveres, M.; Gerardin, S.; Gnani, D.; Grippo, M.; Gromov, V.; Hamer, M.; Havranek, M.; Heim, T.; Hemperek, T.; Hinterkeuser, F.; Hoff, J.; Huiberts, S.; Janssen, J.; Jara Casas, L. M.; Jirsa, J.; John, J. J.; Kampkotter, J.; Karagounis, M.; Khwaira, Y.; Kluit, R.; Krieger, A.; Krueger, H.; Lalic, J.; Lauritzen, M.; Licciulli, F.; Lipton, R.; Liu, T.; Lopez Morillo, E.; Lounis, A.; Luongo, F.; Magazzu, G.; Marcisovsky, M.; Marconi, S.; Marquez Lasso, F.; Marzocca, C.; Mattiazzo, S.; Menouni, M.; Minuti, M.; Mironova, M.; Miryala, S.; Monteil, E.; Moustakas, K.; Muõz Chavero, F.; Neue, G.; Orfanelli, S.; Paccagnella, A.; Pacher, L.; Palla, F.; Palomo Pinto, F. R.; Papadopoulou, A.; Paterno, A.; Petri, A.; Placidi, P.; Pohl, D.; Pradas, A.; Prydderch, M. L.; Pulli, A.; Ratti, L.; Re, V.; Rehman, A.; Rymaszewski, P.; Solal, M. C.; Standke, M.; Stiller, A.; Strebler, T.; Stugu, B.; Thomas, S.; Traversi, G.; Vogrig, D.; Vogt, M.; Wang, T.; Yang, H.; Zdenko, J.; Zimmerman, T.
Technical Design Report for the LUXE experiment
2024 Abramowicz, H.; Almanza Soto, M.; Altarelli, M.; Aßmann, R.; Athanassiadis, A.; Avoni, G.; Behnke, T.; Benettoni, M.; Benhammou, Y.; Bhatt, J.; Blackburn, T.; Blanch, C.; Bonaldo, S.; Boogert, S.; Borysov, O.; Borysova, M.; Boudry, V.; Breton, D.; Brinkmann, R.; Bruschi, M.; Burkart, F.; Büßer, K.; Cavanagh, N.; Dal Corso, F.; Decking, W.; Deniaud, M.; Diner, O.; Dosselli, U.; Elad, M.; Epshteyn, L.; Esperante, D.; Ferber, T.; Firlej, M.; Fiutowski, T.; Fleck, K.; Fuster-Martinez, N.; Gadow, K.; Gaede, F.; Gallas, A.; Garcia Cabrera, H.; Gerstmayr, E.; Ghenescu, V.; Giorato, M.; Golubeva, N.; Grojean, C.; Grutta, P.; Grzelak, G.; Hallford, J.; Hartman, L.; Heinemann, B.; Heinzl, T.; Helary, L.; Hendriks, L.; Hoffmann, M.; Horn, D.; Huang, S.; Huang, X.; Idzik, M.; Irles, A.; Jacobs, R.; King, B.; Klute, M.; Kropf, A.; Kroupp, E.; Lahno, H.; Lasagni Manghi, F.; Lawhorn, J.; Levanon, A.; Levi, A.; Levinson, L.; Levy, A.; Levy, I.; Liberman, A.; Liss, B.; List, B.; List, J.; Lohmann, W.; Maalmi, J.; Madlener, T.; Malka, V.; Marsault, T.; Mattiazzo, S.; Meloni, F.; Miron, D.; Morandin, M.; Moroń, J.; Nanni, J.; Neagu, A. T.; Negodin, E.; Paccagnella, A.; Pantano, D.; Pietruch, D.; Pomerantz, I.; Pöschl, R.; Potlog, P. M.; Prasad, R.; Quishpe, R.; Ranken, E.; Ringwald, A.; Roich, A.
Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory Cells
2024 Bagatin, M.; Gerardin, S.; Paccagnella, A.; Beltrami, S.