CESTER, ANDREA
 Distribuzione geografica
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Continente #
NA - Nord America 14.533
EU - Europa 1.461
AS - Asia 1.074
Continente sconosciuto - Info sul continente non disponibili 6
AF - Africa 4
OC - Oceania 4
Totale 17.082
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Nazione #
US - Stati Uniti d'America 14.521
CN - Cina 574
SG - Singapore 340
IT - Italia 290
FI - Finlandia 286
DE - Germania 211
UA - Ucraina 209
SE - Svezia 177
FR - Francia 114
GB - Regno Unito 106
VN - Vietnam 38
IN - India 36
KR - Corea 27
JP - Giappone 22
NL - Olanda 17
HK - Hong Kong 14
GR - Grecia 13
TW - Taiwan 13
CA - Canada 12
IE - Irlanda 9
RU - Federazione Russa 8
EU - Europa 6
TR - Turchia 6
CH - Svizzera 4
MY - Malesia 3
PL - Polonia 3
AU - Australia 2
BE - Belgio 2
ES - Italia 2
HR - Croazia 2
LT - Lituania 2
MA - Marocco 2
NZ - Nuova Zelanda 2
RO - Romania 2
AT - Austria 1
BG - Bulgaria 1
CZ - Repubblica Ceca 1
DK - Danimarca 1
IR - Iran 1
NG - Nigeria 1
SC - Seychelles 1
Totale 17.082
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Città #
Fairfield 2.251
Woodbridge 1.761
Ann Arbor 1.471
Houston 1.317
Ashburn 1.003
Seattle 828
Jacksonville 797
Cambridge 781
Wilmington 771
Chandler 650
Princeton 284
Singapore 249
San Diego 210
Roxbury 158
Medford 153
Beijing 150
Nanjing 133
Des Moines 126
Boardman 99
Helsinki 94
Padova 66
Shenyang 48
New York 40
Guangzhou 39
Dong Ket 38
Hebei 38
Santa Clara 35
Norwalk 32
Nanchang 30
Indiana 29
London 28
Jiaxing 24
Tianjin 21
Milan 19
Ogden 17
Munich 16
Rome 15
Washington 15
Changsha 14
Mestre 14
Arzignano 13
Thessaloniki 13
Chiampo 11
Dallas 11
Redwood City 10
Dublin 9
Kilburn 9
Venice 9
Borås 8
Jinan 8
Kharkiv 7
Marseille 7
San Francisco 7
Chicago 6
Seongnam-si 6
Shanghai 6
Tappahannock 6
Yellow Springs 6
Candelo 5
Chengdu 5
Gorizia 5
Moscow 5
New Bedfont 5
Olgiate Molgora 5
Porto Sant'elpidio 5
Southwark 5
Yenibosna 5
Zhengzhou 5
Akiruno 4
Eindhoven 4
Frankfurt am Main 4
Hong Kong 4
Los Angeles 4
Ningbo 4
Palermo 4
Prescot 4
Vicenza 4
Wandsworth 4
Yokohama 4
Brahmapur 3
Castelfranco Veneto 3
Central 3
Chiswick 3
Denver 3
Falkenstein 3
Falls Church 3
Geislingen an der Steige 3
Hefei 3
Kyoto 3
Las Vegas 3
Livorno 3
Paris 3
Rockville 3
Seongbuk-gu 3
Seoul 3
Somma Lombardo 3
Springfield 3
Stockholm 3
Taizhou 3
Tokyo 3
Totale 14.173
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Nome #
Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide 721
Semi-Transparent Perovskite Solar Cells: Performance and Perspectives 231
A General Equivalent Circuit Model for a Metal/Organic/Liquid/Metal System 149
Time decay of stress induced leakage current in thin gate oxides by low-field electron injection 142
Systematic characterization of soft- and hard-breakdown spots using techniques with nanometer resolution 135
MOSFET drain current reduction under Fowler-Nordheim and channel hot carrier injection before gate oxide breakdown 128
Low-field current on thin oxides after constant current or radiation stresses 126
Understanding lead iodide perovskite hysteresis and degradation causes by extensive electrical characterization 126
A physical-based equivalent circuit model for an organic/electrolyte interface 125
Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells 123
From Radiation Induced Leakage Current to soft-breakdown in irradiated MOS devices with ultra-thin gate oxide 121
Using AFM related techniques for the nanoscale electrical characterization of irradiated ultrathin gate oxides 118
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination 117
Wear-out and breakdown of ultra-thin gate oxides after irradiation 114
Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides 114
Electrical Stresses on Ultra-Thin Gate Oxide SOI MOSFETs after Irradiation 112
Investigation of Mobility Transient on Organic Transistor by Means of DLTS Technique 112
Light, Bias, And Temperature Effects On Organic TFTs 111
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 110
Model of Organic Solar Cell Photocurrent Including the Effect of Charge Accumulation at Interfaces and Non-Uniform Carrier Generation 110
Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs 110
Time Decay of Stress Induced Leakage Current in Thin Gate Oxides by Low-Field Electron Injection 108
Circuiti Integrati Digitali: l'ottica del progettista - Seconda Edizione 107
A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches 106
Radiation-Induced Breakdown in 1.7 nm Oxynitrided Gate Oxides 105
Low-Energy UV Effects on Organic Thin-Film-Transistors 105
Logistic Modeling of Progressive Breakdown in Ultrathin Gate Oxides 104
Total Ionizing Dose Effects on 4Mbit Phase Change Memory Arrays 104
Simulation of the time-dependent breakdown characteristics of heavy ion irradiated gate oxides using a mean-reverting poisson-gaussian process 104
Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress 104
Degradation Dynamics of Ultrathin Gate Oxides Subjected to Electrical Stress 103
Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays 103
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 102
Comparison between positive and negative constant current stress on dye-sensitized solar cells 102
Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress 101
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells 101
Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress 101
Radiation Induced Leakage Current and Stress Induced Leakage Current in Ultra-Thin Gate Oxides 100
Simple and accurate single transistor technique for parameters extraction from organic and inorganic thin film devices 100
Drain Current Decrease in MOSFETs After Heavy Ion Irradiation 99
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states 99
Optical Stress and Reliability Study of Ruthenium-based Dye-Sensitized Solar Cells (DSSC) 98
Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors 98
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics 98
Trapping phenomena in AlGaN/GaN HEMTs: A study based on pulsed and transient measurements 97
Electrostatic discharge effects in ultrathin gate oxide MOSFETs 97
Impact of Fowler-Nordheim and channel hot carrier stresses on MOSFETs with 2.2nm gate oxide 97
Ionising radiation and electrical stress on nanocrystal memory cell array 97
Reliability study of organic complementary logic inverters using constant voltage stress 97
TIPS-Pentacene as Biocompatible Material for Solution Processed High-Performance Electronics Operating in Water 97
Drift-diffusion and analytical modeling of the recombination mechanisms in organic solar cells: Effect of the nonconstant charge distribution inside the active layer 97
Degradation of Low Frequency Noise and DC characteristics on MOSFETs and its correlation with SILC 96
Worldwide outdoor round robin study of organic photovoltaic devices and modules 95
A Novel Approach to Quantum Point Contact for Post Soft Breakdown Conduction 95
Study of the effects of UV-exposure on dye-sensitized solar cells 95
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 95
Reverse bias degradation of metal wrap through silicon solar cells 94
Improved Reliability of Organic Light-Emitting Diodes with Indium-Zinc-Oxide Anode Contact 93
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs) 93
On the Pulsed and Transient Characterization of Organic Field-Effect Transistors 93
Ionizing radiation effects on MOSFET thin and ultra-thin gate oxides 92
Collapse of MOSFET Drain Current After Soft Breakdown 92
Organic TFT with SiO2-Parylene Gate Dielectric Stack and Optimized Pentacene Growth Temperature 89
A Novel Algorithm for Lifetime Extrapolation, Prediction, and Estimation of Emerging PV Technologies 89
Readout drain current dependence of programming window in nanocrystal memory cells 88
Statistical Model for Radiation Induced Wear-Out of Ultra-Thin Gate Oxides after Exposure to Heavy Ion Irradiation 88
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs 87
Detrended fluctuation analysis of the soft breakdown current 87
Effects of positive and negative constant voltage stress on organic TFTs 87
Preconditioning Procedure for the Better Estimation of the Long-Term Lifetime in Microelectromechanical Switches 87
Simultaneous stimulation and recording of cell activity with reference-less sensors: Is it feasible? 87
Near-Uv Irradiation Effects On Pentacene Based Organic Thin Film Transistors 86
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects 86
Stress Induced Leakage Current under pulsed voltage stress 85
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs 85
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 85
Stochastic modeling of progressive breakdown in ultrathin SiO2 films 85
Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs) 85
A correlational study between signature, writing abilities and decision-making capacity among people with initial cognitive impairment 85
Radiation-Induced Modifications of the Electrical Characteristics of Nanocrystal Memory Cells and Arrays 84
Time decay of stress induced leakage current in thin gate oxides by low-field electron injection 84
Threshold Voltage Instabilities in D-Mode GaN HEMTs for Power Switching Applications 84
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures 84
Effects of soft-UV irradiation on organic thin film transistors with different gate dielectrics 83
Thermal and electrical stress effects of electrical and optical characteristics of Alq(3)/NPD OLED 83
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure 83
Stress induced leakage current under pulsed voltage stress 82
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells 82
ESD induced damage on ultra-thin gate oxide MOSFETs and its impact on device reliability 82
Viscoelasticity Recovery Mechanism in Radio Frequency Microelectromechanical Switches 82
Pulsed Voltage Stress on thin oxides 82
Reliability Study of Dye-Sensitized Solar Cells by means of Solar Simulator and White LED 81
Threshold Voltage Instability in Organic TFT with SiO2 and SiO2/Parylene-Stack Dielectrics 80
Improved Tolerance against UV and Alpha Irradiation of Encapsulated Organic TFTs 80
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 80
Radiation Tolerance of Nanocrystal-Based Flash Memory Arrays Against Heavy Ion Irradiation 80
Ionising Radiation Effects on MOSFET Drain Current 80
Enhanced Permanent Degradation of Organic TFT under electrical stress and visible light exposure 80
Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell 80
Evidence of mechanical degradation in microelectromechanical switches subjected to long-Term stresses 80
Totale 10.506
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Categoria #
all - tutte 56.763
article - articoli 30.940
book - libri 0
conference - conferenze 0
curatela - curatele 189
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 4.241
Totale 92.133
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20202.857 0 0 69 218 394 305 338 448 386 306 248 145
2020/20212.300 103 162 113 193 145 244 87 225 412 172 288 156
2021/20222.664 75 344 372 137 96 158 137 289 144 58 304 550
2022/20231.737 352 6 15 168 367 287 13 146 248 8 91 36
2023/20241.101 57 172 124 97 51 141 79 49 43 52 133 103
2024/20251.015 600 298 117 0 0 0 0 0 0 0 0 0
Totale 17.195