CESTER, ANDREA
 Distribuzione geografica
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Continente #
NA - Nord America 21.334
AS - Asia 10.458
EU - Europa 4.810
AF - Africa 1.791
SA - Sud America 1.625
OC - Oceania 171
Continente sconosciuto - Info sul continente non disponibili 71
Totale 40.260
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Nazione #
US - Stati Uniti d'America 20.414
SG - Singapore 3.326
CN - Cina 1.786
VN - Vietnam 1.331
HK - Hong Kong 1.232
BR - Brasile 908
IT - Italia 746
DE - Germania 415
FR - Francia 398
FI - Finlandia 395
PL - Polonia 383
IN - India 346
UA - Ucraina 286
RU - Federazione Russa 234
SE - Svezia 233
GB - Regno Unito 217
BD - Bangladesh 208
IQ - Iraq 171
JP - Giappone 162
AR - Argentina 150
TR - Turchia 147
NL - Olanda 146
KR - Corea 122
PH - Filippine 121
CA - Canada 110
ZA - Sudafrica 105
MX - Messico 104
PK - Pakistan 98
SA - Arabia Saudita 98
EC - Ecuador 96
ID - Indonesia 96
ES - Italia 91
CO - Colombia 90
AT - Austria 85
MA - Marocco 83
UZ - Uzbekistan 73
BJ - Benin 70
CI - Costa d'Avorio 70
VE - Venezuela 70
CL - Cile 66
MY - Malesia 66
PS - Palestinian Territory 63
TW - Taiwan 63
AE - Emirati Arabi Uniti 62
AO - Angola 61
IE - Irlanda 61
JM - Giamaica 61
PE - Perù 60
TN - Tunisia 59
HU - Ungheria 58
EG - Egitto 57
JO - Giordania 57
LA - Repubblica Popolare Democratica del Laos 57
PY - Paraguay 57
TH - Thailandia 57
LB - Libano 56
MK - Macedonia 54
GT - Guatemala 52
IL - Israele 52
KZ - Kazakistan 52
BG - Bulgaria 51
GR - Grecia 51
DZ - Algeria 50
LU - Lussemburgo 50
RS - Serbia 50
EE - Estonia 49
AL - Albania 48
AZ - Azerbaigian 48
BB - Barbados 48
BO - Bolivia 48
CR - Costa Rica 48
DK - Danimarca 48
LV - Lettonia 48
MD - Moldavia 48
NP - Nepal 48
CH - Svizzera 47
CY - Cipro 47
ET - Etiopia 47
HR - Croazia 47
MU - Mauritius 47
MR - Mauritania 46
PT - Portogallo 46
RO - Romania 46
PA - Panama 45
SI - Slovenia 45
ZM - Zambia 45
GF - Guiana Francese 44
GE - Georgia 43
GN - Guinea 43
IR - Iran 43
KG - Kirghizistan 43
ML - Mali 43
NE - Niger 43
PR - Porto Rico 43
TJ - Tagikistan 43
BY - Bielorussia 42
BZ - Belize 42
MZ - Mozambico 42
ZW - Zimbabwe 42
AU - Australia 41
Totale 38.285
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Città #
Fairfield 2.251
Ashburn 2.132
Singapore 2.011
Woodbridge 1.761
San Jose 1.716
Ann Arbor 1.471
Houston 1.331
Hong Kong 1.099
Seattle 834
Jacksonville 798
Cambridge 781
Wilmington 776
Chandler 650
Santa Clara 546
Ho Chi Minh City 397
Boardman 336
Beijing 326
Los Angeles 311
Hanoi 304
Bytom 286
Princeton 284
San Diego 212
Lauterbourg 204
Roxbury 158
Medford 153
New York 148
Nanjing 138
Des Moines 128
Helsinki 125
Padova 107
Tokyo 94
Da Nang 90
Munich 89
Chicago 82
Baghdad 74
Guangzhou 74
São Paulo 74
Tashkent 72
Abidjan 67
Cotonou 64
Orem 64
Haiphong 60
Milan 59
Hefei 55
Amman 53
Luanda 53
Warsaw 53
Shenyang 52
Vienna 51
Buffalo 50
Dublin 49
London 48
Amsterdam 47
Vientiane 47
Baku 45
Bridgetown 44
Dallas 44
Lusaka 44
Rome 44
Frankfurt am Main 43
Kingston 43
Turku 43
Conakry 42
Johannesburg 42
Nouakchott 41
Bamako 40
Riga 40
Bishkek 39
Dushanbe 39
Harare 39
Managua 39
Panama City 39
San José 39
Seoul 39
Dong Ket 38
Hebei 38
Lima 38
Nuremberg 38
Libreville 37
Montreal 37
Phnom Penh 37
Addis Ababa 36
Antananarivo 36
Niamey 36
Riyadh 36
Castries 35
Dakar 35
Lahore 35
Stockholm 35
The Dalles 35
Tianjin 35
Accra 34
Guatemala City 34
Denver 33
Djibouti 33
Guayaquil 33
Jeddah 33
Kigali 33
Maputo 33
Praia 33
Totale 25.039
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Nome #
Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide 803
Semi-Transparent Perovskite Solar Cells: Performance and Perspectives 508
A correlational study between signature, writing abilities and decision-making capacity among people with initial cognitive impairment 378
Monitoring of Lactococcus lactis growth based on Reduced-Graphene Oxide TFT for Dairy Industry Applications 294
Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results 293
A physical-based equivalent circuit model for an organic/electrolyte interface 283
Understanding lead iodide perovskite hysteresis and degradation causes by extensive electrical characterization 278
A General Equivalent Circuit Model for a Metal/Organic/Liquid/Metal System 278
TIPS-Pentacene as Biocompatible Material for Solution Processed High-Performance Electronics Operating in Water 277
A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems 271
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 270
Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells 263
Recoverable degradation of FAPbBr3 perovskite solar cells under reverse-bias: A combined electro-optical investigation 257
Single‐Cell Membrane Potential Stimulation and Recording by an Electrolyte‐Gated Organic Field‐Effect Transistor 255
A Novel Approach to Quantum Point Contact for Post Soft Breakdown Conduction 247
Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs 246
Cu-modified electrolyte-gated transistors based on reduced graphene oxide 236
Graphene Acetic Acid‐Based Hybrid Supercapacitor and Liquid‐Gated Transistor 235
Threshold Voltage Instabilities in D-Mode GaN HEMTs for Power Switching Applications 233
Optical Stress and Reliability Study of Ruthenium-based Dye-Sensitized Solar Cells (DSSC) 232
Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination 229
Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique 229
Time decay of stress induced leakage current in thin gate oxides by low-field electron injection 229
High open-circuit voltage Cs2AgBiBr6 carbon-based perovskite solar cells via green processing of ultrasonic spray-coated carbon electrodes from waste tire sources 224
Simple and accurate single transistor technique for parameters extraction from organic and inorganic thin film devices 219
Beyond the 2D Field-Effect Charge Transport Paradigm in Molecular Thin-Film Transistors 218
Model of Organic Solar Cell Photocurrent Including the Effect of Charge Accumulation at Interfaces and Non-Uniform Carrier Generation 218
Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress 218
A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches 216
Reverse bias degradation of metal wrap through silicon solar cells 216
OFF-state breakdown and threshold voltage stability of vertical GaN-on-Si trench MOSFETs 216
MOSFET drain current reduction under Fowler-Nordheim and channel hot carrier injection before gate oxide breakdown 214
Design and in-vitro Characterization of a Wearable Multi-Sensing System for Hydration Monitoring 214
Systematic characterization of soft- and hard-breakdown spots using techniques with nanometer resolution 213
Evidence of mechanical degradation in microelectromechanical switches subjected to long-Term stresses 212
Semitransparent Perovskite Solar Cells for Si Tandem and Agrivoltaic Integration 212
Total Ionizing Dose Effects on 4Mbit Phase Change Memory Arrays 209
On the Nature of Charge-Injecting Contacts in Organic Field-Effect Transistors 209
Trapping phenomena in AlGaN/GaN HEMTs: A study based on pulsed and transient measurements 208
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells 208
Characterization and Modeling of Reduced-Graphene Oxide Ambipolar Thin-Film Transistors 207
Drift-diffusion and analytical modeling of the recombination mechanisms in organic solar cells: Effect of the nonconstant charge distribution inside the active layer 206
Accelerated constant current stress on triple cation perovskite solar cells 205
Nanocrystal Memories: An Evolutionary Approach to Flash Memory Scaling and a Class of Radiation-Tolerant Devices 205
Light, Bias, And Temperature Effects On Organic TFTs 205
Ionizing radiation effects on MOSFET thin and ultra-thin gate oxides 205
Low-Energy UV Effects on Organic Thin-Film-Transistors 205
Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides 205
A Novel Algorithm for Lifetime Extrapolation, Prediction, and Estimation of Emerging PV Technologies 202
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs 201
Ionising radiation and electrical stress on nanocrystal memory cell array 201
Low-field current on thin oxides after constant current or radiation stresses 201
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 200
Simultaneous stimulation and recording of cell activity with reference-less sensors: Is it feasible? 200
Investigation of Mobility Transient on Organic Transistor by Means of DLTS Technique 199
Reliability study of organic complementary logic inverters using constant voltage stress 199
Circuiti Integrati Digitali: l'ottica del progettista - Seconda Edizione 199
Characterization and Modeling of Reduced-Graphene Oxide Ambipolar Thin-Film Transistors 196
ANALYSIS OF REVERSE-BIAS STABILITY OF FAPbBr3 SEMI-TRANSPARENT PEROVSKITE SOLAR CELLS 195
Wear-out and breakdown of ultra-thin gate oxides after irradiation 193
Role of buffer doping and pre-existing trap states in the current collapse and degradation of AlGaN/GaN HEMTs 193
Electrostatic discharge effects in ultrathin gate oxide MOSFETs 192
Real-time threshold voltage compensation on dual-gate electrolyte-gated organic field-effect transistors 191
Study of the effects of UV-exposure on dye-sensitized solar cells 191
Improved Reliability of Organic Light-Emitting Diodes with Indium-Zinc-Oxide Anode Contact 190
Logistic Modeling of Progressive Breakdown in Ultrathin Gate Oxides 189
Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays 188
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects 188
Comparison between positive and negative constant current stress on dye-sensitized solar cells 187
Readout drain current dependence of programming window in nanocrystal memory cells 186
Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell 186
Degradation Dynamics of Ultrathin Gate Oxides Subjected to Electrical Stress 185
Effects of Channel Hot Carrier Stress on III-V Bulk Planar MOSFETs 185
Effects of thermal stress on hybrid perovskite solar cells with different encapsulation techniques 185
Using AFM related techniques for the nanoscale electrical characterization of irradiated ultrathin gate oxides 184
Electrical Stresses on Ultra-Thin Gate Oxide SOI MOSFETs after Irradiation 184
Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics 184
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics 184
IONIZING RADIATION EFFECTS ON ULTRA-THIN OXIDE MOS STRUCTURES 182
ESD induced damage on ultra-thin gate oxide MOSFETs and its impact on device reliability 182
From Radiation Induced Leakage Current to soft-breakdown in irradiated MOS devices with ultra-thin gate oxide 180
Analysis of ESD effects on organic thin-film-transistors by means of TLP technique 179
Impact of radiation on the operation and reliability of deep submicron CMOS 178
Accelerated Wear-out of Ultra-thin Gate Oxides After Irradiation 178
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states 177
Preconditioning Procedure for the Better Estimation of the Long-Term Lifetime in Microelectromechanical Switches 177
Time Decay of Stress Induced Leakage Current in Thin Gate Oxides by Low-Field Electron Injection 176
On the Pulsed and Transient Characterization of Organic Field-Effect Transistors 176
Organic substrates for novel printed sensors in neural interfacing: A measurement method for cytocompatibility analysis 175
Quality Assessment of Perovskite Solar Cells: An Industrial Point of View 174
Worldwide outdoor round robin study of organic photovoltaic devices and modules 174
Drain Current Decrease in MOSFETs After Heavy Ion Irradiation 174
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 174
Degradation of Low Frequency Noise and DC characteristics on MOSFETs and its correlation with SILC 173
Characterization of High-Voltage Charge-Trapping Effects in GaN-based Power HEMTs 173
Thermal Stress Effects on Organic-Thin-Film-Transistors 173
Conductive atomic force microscope characterization of weak spots in irradiated ultra-thin gate oxides 172
Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress 171
Radiation Induced Leakage Current and Stress Induced Leakage Current in Ultra-Thin Gate Oxides 171
Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress 171
Totale 21.729
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Categoria #
all - tutte 110.461
article - articoli 59.961
book - libri 0
conference - conferenze 0
curatela - curatele 396
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 8.886
Totale 179.704
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20222.664 75 344 372 137 96 158 137 289 144 58 304 550
2022/20231.737 352 6 15 168 367 287 13 146 248 8 91 36
2023/20241.101 57 172 124 97 51 141 79 49 43 52 133 103
2024/20255.251 600 298 173 200 713 174 208 373 327 174 832 1.179
2025/202618.535 631 1.525 2.663 2.969 1.609 839 2.690 1.675 1.891 1.015 631 397
2026/2027451 451 0 0 0 0 0 0 0 0 0 0 0
Totale 40.417