We have addressed the problem of the gate current fluctuations after soft breakdown in thin gate oxides, mainly focused on the intrinsic instability of SB conductance. We found that heavily degraded oxides exhibit large instability and more complex fluctuations. Finally we have developed a model to describe the gate distribution of the gate current fluctuations by taking in account such conductance instability. (C) 2001 Elsevier Science B.V. All rights reserved.
Detrended fluctuation analysis of the soft breakdown current
CESTER, ANDREA;PACCAGNELLA, ALESSANDRO;
2001
Abstract
We have addressed the problem of the gate current fluctuations after soft breakdown in thin gate oxides, mainly focused on the intrinsic instability of SB conductance. We found that heavily degraded oxides exhibit large instability and more complex fluctuations. Finally we have developed a model to describe the gate distribution of the gate current fluctuations by taking in account such conductance instability. (C) 2001 Elsevier Science B.V. All rights reserved.
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