GASPERIN, ALBERTO

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GASPERIN, ALBERTO

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Advanced Non-Volatile Memories: Reliability and Ionizing Radiation Effects

2008 Gasperin, Alberto

Effects of the Localization of the Charge in Nanocrystal Memory Cells

2009 Gasperin, Alberto; Amat, E; Porti, M; MARTIN MARTINEZ, J; Nafria, M; Aymerich, X; Paccagnella, Alessandro

EOS/ESD Sensitivity of Phase-Change-Memories

2009 Tazzoli, Augusto; Gasperin, Alberto; Paccagnella, Alessandro; Meneghesso, Gaudenzio

Fourier Signature in Log-Polar Images

2007 Gasperin, Alberto; C., Ardito; Grisan, Enrico; Menegatti, Emanuele

Heavy Ion Irradiation Effects on Capacitors With SiO2 and ONO as Dielectrics

2009 Gasperin, Alberto; Paccagnella, Alessandro; Ghidini, G; Sebastiani, A.

Ionising radiation and electrical stress on nanocrystal memory cell array

2007 Cester, Andrea; Gasperin, Alberto; Wrachien, Nicola; Paccagnella, Alessandro; Ancarani, V; Gerardi, C.

Oxide-nitride-oxide capacitor reliability under heavy-ion irradiation

2007 Gasperin, Alberto; Ghidini, G; Cester, Andrea; Paccagnella, Alessandro

Peculiar characteristics of nanocrystal memory cells programming window

2009 Gasperin, Alberto; Amat, E; Martin, J; Porti, M; Nafria, M; Paccagnella, Alessandro

Radiation Tolerance of Nanocrystal-Based Flash Memory Arrays Against Heavy Ion Irradiation

2007 Cester, Andrea; Wrachien, N; Gasperin, Alberto; Paccagnella, Alessandro; Portoghese, R; Gerardi, C.

Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics

2007 Gasperin, Alberto; Cester, Andrea; Wrachien, Nicola; Paccagnella, Alessandro; C., Gerardi; V., Ancarani

Total Ionizing Dose Effects on 4Mbit Phase Change Memory Arrays

2007 Gasperin, Alberto; Wrachien, Nicola; Cester, Andrea; Paccagnella, Alessandro; F., Ottogalli; U., Corda; P., Fuochi; M., Lavalle

Titolo	Data di pubblicazione	Autori	Rivista	Serie	Titolo libro
Advanced Non-Volatile Memories: Reliability and Ionizing Radiation Effects	2008	Gasperin, Alberto	-	-	-
Effects of the Localization of the Charge in Nanocrystal Memory Cells	2009	GASPERIN, ALBERTOAMAT EPORTI MMARTIN MARTINEZ JNAFRIA MAYMERICH XPACCAGNELLA, ALESSANDRO + -	IEEE TRANSACTIONS ON ELECTRON DEVICES	-	-
EOS/ESD Sensitivity of Phase-Change-Memories	2009	TAZZOLI, AUGUSTOGASPERIN, ALBERTOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO	-	-	-
Fourier Signature in Log-Polar Images	2007	GASPERIN, ALBERTOC. ArditoGRISAN, ENRICOMENEGATTI, EMANUELE + -	-	-	Proc. of International Workshop on Robot Vision
Heavy Ion Irradiation Effects on Capacitors With SiO2 and ONO as Dielectrics	2009	GASPERIN, ALBERTOPACCAGNELLA, ALESSANDROGHIDINI GSEBASTIANI A. + -	IEEE TRANSACTIONS ON NUCLEAR SCIENCE	-	-
Ionising radiation and electrical stress on nanocrystal memory cell array	2007	CESTER, ANDREAGASPERIN, ALBERTOWRACHIEN, NICOLAPACCAGNELLA, ALESSANDROANCARANI VGERARDI C. + -	MICROELECTRONICS RELIABILITY	-	-
Oxide-nitride-oxide capacitor reliability under heavy-ion irradiation	2007	GASPERIN, ALBERTOGHIDINI GCESTER, ANDREAPACCAGNELLA, ALESSANDRO + -	IEEE TRANSACTIONS ON NUCLEAR SCIENCE	-	-
Peculiar characteristics of nanocrystal memory cells programming window	2009	GASPERIN, ALBERTOAMAT EMARTIN JPORTI MNAFRIA MPACCAGNELLA, ALESSANDRO + -	JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B	-	-
Radiation Tolerance of Nanocrystal-Based Flash Memory Arrays Against Heavy Ion Irradiation	2007	CESTER, ANDREAWRACHIEN NGASPERIN, ALBERTOPACCAGNELLA, ALESSANDROPORTOGHESE RGERARDI C. + -	IEEE TRANSACTIONS ON NUCLEAR SCIENCE	-	-
Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics	2007	GASPERIN, ALBERTOCESTER, ANDREAWRACHIEN, NICOLAPACCAGNELLA, ALESSANDROC. GERARDIV. ANCARANI + -	-	-	Proceedings of IEEE - International Reliability Physics Symposium - IRPS 2007
Total Ionizing Dose Effects on 4Mbit Phase Change Memory Arrays	2007	GASPERIN, ALBERTOWRACHIEN, NICOLACESTER, ANDREAPACCAGNELLA, ALESSANDROF. OTTOGALLIU. CORDAP. FUOCHIM. LAVALLE + -	-	ESA SP	Radiation and Its Effects on Components and Systems, 2007.