GASPERIN, ALBERTO
GASPERIN, ALBERTO
Advanced Non-Volatile Memories: Reliability and Ionizing Radiation Effects
2008 Gasperin, Alberto
Effects of the Localization of the Charge in Nanocrystal Memory Cells
2009 Gasperin, Alberto; Amat, E; Porti, M; MARTIN MARTINEZ, J; Nafria, M; Aymerich, X; Paccagnella, Alessandro
EOS/ESD Sensitivity of Phase-Change-Memories
2009 Tazzoli, Augusto; Gasperin, Alberto; Paccagnella, Alessandro; Meneghesso, Gaudenzio
Fourier Signature in Log-Polar Images
2007 Gasperin, Alberto; C., Ardito; Grisan, Enrico; Menegatti, Emanuele
Heavy Ion Irradiation Effects on Capacitors With SiO2 and ONO as Dielectrics
2009 Gasperin, Alberto; Paccagnella, Alessandro; Ghidini, G; Sebastiani, A.
Ionising radiation and electrical stress on nanocrystal memory cell array
2007 Cester, Andrea; Gasperin, Alberto; Wrachien, Nicola; Paccagnella, Alessandro; Ancarani, V; Gerardi, C.
Oxide-nitride-oxide capacitor reliability under heavy-ion irradiation
2007 Gasperin, Alberto; Ghidini, G; Cester, Andrea; Paccagnella, Alessandro
Peculiar characteristics of nanocrystal memory cells programming window
2009 Gasperin, Alberto; Amat, E; Martin, J; Porti, M; Nafria, M; Paccagnella, Alessandro
Radiation Tolerance of Nanocrystal-Based Flash Memory Arrays Against Heavy Ion Irradiation
2007 Cester, Andrea; Wrachien, N; Gasperin, Alberto; Paccagnella, Alessandro; Portoghese, R; Gerardi, C.
Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics
2007 Gasperin, Alberto; Cester, Andrea; Wrachien, Nicola; Paccagnella, Alessandro; C., Gerardi; V., Ancarani
Total Ionizing Dose Effects on 4Mbit Phase Change Memory Arrays
2007 Gasperin, Alberto; Wrachien, Nicola; Cester, Andrea; Paccagnella, Alessandro; F., Ottogalli; U., Corda; P., Fuochi; M., Lavalle