BONALDO, STEFANO
BONALDO, STEFANO
Dipartimento di Ingegneria dell'Informazione - DEI
A Mach-Zehnder interferometer for the fine control of the polarization status of a beam
2014 Tessarolo, E.; Corso, A. J.; Bonaldo, S.; Zuppella, P.; Pelizzo, M. G.
A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics
2022 Rosati, G.; Urban, M.; Zhao, L.; Yang, Q.; de Carvalho Castro e Silva, C.; Bonaldo, S.; Parolo, C.; Nguyen, E. P.; Ortega, G.; Fornasiero, P.; Paccagnella, A.; Merkoci, A.
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications
2022 Tonello, S.; Fapanni, T.; Bonaldo, S.; Giorgi, G.; Narduzzi, C.; Paccagnella, A.; Serpelloni, M.; Sardini, E.; Carrara, S.
An Electrochemical Biosensor for the Detection of Bacteriophage of Lactococcus Lactis
2023 Bonaldo, S.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Franchin, L.; Poggi, S.; Paccagnella, A.
Bacteria-Based Biosensor for the Detection of Lactococcus Lactis Bacteriophage in Agrifood Industry
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Bertozzi, T.; Paccagnella, A.
Charge buildup and spatial distribution of interface traps in 65-nm pMOSFETs irradiated to ultrahigh doses
2019 Bonaldo, S.; Gerardin, S.; Jin, X.; Paccagnella, A.; Faccio, F.; Borghello, G.; Fleetwood, D. M.
DC response, low-frequency noise, and TID-induced mechanisms in 16-nm FinFETs for high-energy physics experiments
2022 Bonaldo, S.; Ma, T.; Mattiazzo, S.; Baschirotto, A.; Enz, C.; Fleetwood, D. M.; Paccagnella, A.; Gerardin, S.
Design implementation and test results of the RD53A, a 65 nm large scale chip for next generation pixel detectors at the HL-LHC
2018 Marconi, S.; Barbero, M. B.; Fougeron, D.; Godiot, S.; Menouni, M.; Pangaud, P.; Rozanov, A.; Breugnon, P.; Bomben, M.; Calderini, G.; Crescioli, F.; Dortz, O. L.; Marchiori, G.; Dzahini, D.; Rarbi, F. E.; Gaglione, R.; Kruger, H.; Daas, M.; Dieter, Y.; Hemperek, T.; Hugging, F.; Moustakas, K.; Pohl, D.; Rymaszewski, P.; Standke, M.; Vogt, M.; Wang, T.; Wermes, N.; Karagounis, M.; Stiller, A.; Marzocca, C.; De Robertis, G.; Loddo, F.; Licciulli, F.; Andreazza, A.; Liberali, V.; Stabile, A.; Frontini, L.; Bagatin, M.; Bisello, D.; Gerardin, S.; Mattiazzo, S.; Paccagnella, A.; Vogrig, D.; Bonaldo, S.; Bacchetta, N.; Gaioni, L.; De Canio, F.; Manghisoni, M.; Re, V.; Riceputi, E.; Traversi, G.; Ratti, L.; Vacchi, C.; Androsov, K.; Beccherle, R.; Magazzu, G.; Minuti, M.; Morsani, F.; Palla, F.; Poulios, S.; Bilei, G. M.; Menichelli, M.; Placidi, P.; Dellacasa, G.; Demaria, N.; Mazza, G.; Monteil, E.; Pacher, L.; Paterno, A.; Rivetti, A.; Da Rocha Rolo, M. D.; Gajanana, D.; Gromov, V.; Van Eijk, B.; Kluit, R.; Vitkovskiy, A.; Benka, T.; Havranek, M.; Janoska, Z.; Marcisovsky, M.; Neue, G.; Tomasek, L.; Kafka, V.; Vrba, V.; Lopez-Morillo, E.; Palomo, F. R.; Munoz, F.; Vila, I.; Jimenez, E. M. S.; Abbaneo, D.; Christiansen, J.; Orfanelli, S.; Jara Casas, L. M.; Conti, E.; Bell, S.; Prydderch, M. L.; Thomas, S.; Christian, D. C.; Deptuch, G.; Fahim, F.; Hoff, J.; Lipton, R.; Liu, T.; Zimmerman, T.; Miryala, S.; Garcia-Sciveres, M.; Gnani, D.; Krieger, A.; Papadopoulou, K.; Heim, T.; Carney, R.; Nachman, B.; Renteira, C.; Wallangen, V.; Hoeferkamp, M.; Seidel, S.
Development of a Large Pixel Chip Demonstrator in RD53 for ATLAS and CMS Upgrades
2018 Conti, Elia; Barbero, Marlon; Fougeron, Denis; Godiot, Stéphanie; Menouni, Mohsine; Pangaud, Patrick; Alexandre, Rozanov; Breugnon, Patrick; Bomben, Marco; Calderini, Giovanni; Crescioli, Francesco; Le Dortz, Olivier; Marchiori, Giovanni; Dzahini, Daniel; Rarbi, Fatah Ellah; Gaglione, Renaud; Hemperek, Tomasz; Huegging, Fabian; Krueger, Hans; Rymaszewski, Piotr; Vogt, Marco; Wang, Tienyang; Norbert, Wermes; Karagounis, Michael; Ciciriello, Fabio; Corsi, Francesco; Marzocca, Cristoforo; De Robertis, Giuseppe; Loddo, Flavio; Licciulli, Francesco; Andreazza, Attilio; Liberali, Valentino; Stabile, Alberto; Frontini, Luca; Bagatin, Marta; Bisello, Dario; Gerardin, Simone; Mattiazzo, Serena; Paccagnella, Alessandro; Vogrig, Daniele; Bonaldo, Stefano; Bacchetta, Nicola; De Canio, Francesco; Gaioni, Luigi; Manghisoni, Massimo; Re, Valerio; Riceputi, Elisa; Traversi, Gianluca; Ratti, Lodovico; Vacchi, Carla; Androsov, Konstantin; Beccherle, Roberto; Magazzu, Guido; Minuti, Massimo; Morsani, Fabio; Palla, Fabrizio; Poulios, Stamatis; Bilei, Gian Mario; Menichelli, Mauro; Placidi, Pisana; Marconi, Sara; Dellacasa, Giulio; Demaria, Natale; Mazza, Giovanni; Monteil, Ennio; Pacher, Luca; Rivetti, Angelo; Da Rocha Rolo, Manuel Dionisio; Paternò, Andrea; Gajanna, Deepak; Gromov, Vladimir; Van Eijk, Bob; Kluit, Ruud; Vitkovskiy, Arseniy; Benka, Tomas; Havranek, Miroslav; Janoska, Zdenko; Marcisovsky, Michal; Neue, Gordon; Tomasek, Lukas; Kafka, Vratislav; Vrba, Vaclav; Lopez-Morillo, Enrique; Palomo, Francisco Rogelio; Munoz, Fernando; Vila, Ivan; Jiménez, Esther; Abbaneo, Duccio; Christiansen, Jorgen; Orfanelli, Stella; Jara Casas, Luis Miguel; Bell, Stephen Jean-Marc; Prydderch, Mark; Thomas, Stephen; Christian, David Charles; Deptuch, Grzegorz; Fahim, Farah; Hoff, James; Zimmerman, Tom; Miryala, Sandeep; Garcia-Sciveres, Maurice; Gnani, Dario; Krieger, Amanda; Papadopoulou, Katerini; Heim, Timon; Carney, Rebecca; Nachman, Benjamin Philip; Renteira, Cesar; Wallangen, Veronica; Hoeferkamp, Martin Robert; Seidel, Sally
Dose-rate sensitivity of 65-nm MOSFETs Exposed to ultrahigh doses
2018 Borghello, G.; Faccio, F.; Lerario, E.; Michelis, S.; Kulis, S.; Fleetwood, D. M.; Schrimpf, R. D.; Gerardin, S.; Paccagnella, A.; Bonaldo, S.
Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices
2024 Fleetwood, D. M.; Zhang, E. X.; Schrimpf, R. D.; Pantelides, S. T.; Bonaldo, S.
Electrochemical Biosensor for the Monitoring of Phages of in Milk-Based Samples
2024 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Paccagnella, A.
Electrochemical Biosensor for Timely Detection of Lactococcus Lactis Bacteriophage in Milk Samples
2023 Bonaldo, S.; Franchin, L.; Cretaio, E.; Pasqualotto, E.; Scaramuzza, M.; Paccagnella, A.
Gate Bias and Length Dependences of Total-Ionizing-Dose Effects in InGaAs FinFETs on Bulk Si
2019 Zhao, S. E.; Bonaldo, S.; Wang, P.; Jiang, R.; Gong, H.; Zhang, E. X.; Waldron, N.; Kunert, B.; Mitard, J.; Collaert, N.; Sioncke, S.; Linten, D.; Schrimpf, R. D.; Reed, R. A.; Gerardin, S.; Paccagnella, A.; Fleetwood, D. M.
Impedimetric Screen-Printed Immunosensor for the Rapid Detection of Chagas Disease
2024 Chain, C. Y.; Franchin, L.; Cisneros, J. S.; Villagra, A. P. M.; Labriola, C. A.; Paccagnella, A.; Bonaldo, S.
Increased Device Variability Induced by Total Ionizing Dose in 16-nm Bulk nFinFETs
2022 Ma, T; Bonaldo, S; Mattiazzo, S; Baschirotto, A; Enz, C; Paccagnella, A; Gerardin, S
Influence of BSA Protein on Electrochemical Response of Genosensors
2023 Bonaldo, S.; Franchin, L.; Pasqualotto, E.; Cretaio, E.; Losasso, C.; Peruzzo, A.; Paccagnella, A.
Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs
2023 Bonaldo, S.; Mattiazzo, S.; Bagatin, M.; Paccagnella, A.; Margutti, G.; Gerardin, S.
Influence of Fin- and Finger-Number on TID Degradation of 16 nm Bulk FinFETs Irradiated to Ultra-High Doses
2022 Ma, T.; Bonaldo, S.; Mattiazzo, S.; Baschirotto, A.; Enz, C.; Paccagnella, A.; Gerardin, S.
Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses
2019 Bonaldo, S.; Mattiazzo, S.; Enz, C.; Baschirotto, A.; Paccagnella, A.; Jin, X.; Gerardin, S.