LBIC ANALYSIS OF HETEROJUNCTION SILICON SOLAR CELLS FOR PHOTOCURRENT MAPPING AND SURFACE RECOMBINATION DETECTION

Laser Beam-Induced Current (LBIC) analysis is a powerful technique for the spatial characterization of solar cells, enabling high-resolution photocurrent mapping and surface recombination detection. This study focuses on the development and optimization of an LBIC setup on heterojunction silicon solar cells. By fine-tuning, the system is able to provide detailed maps of local photogenerated carrier dynamics, offering insights into the uniformity of the device and revealing defects that lead to performance degradation. A comparative study between LBIC and Electron Beam-Induced Current (EBIC) techniques is also presented to evaluate issues related to recombination and conduction near the edges of the device caused by mechanical damage. The results showed a compatibility between the two procedures in detecting recombination and conduction issues, particularly near damaged edges. Additionally, results from preliminary stress tests and the impact of surface recombination will be discussed.