JAIN, ABHISHEK
JAIN, ABHISHEK
Università di Padova
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Risultati 1 - 5 di 5 (tempo di esecuzione: 0.015 secondi).
Architettura di Flip Flip efficiente e resistente ai "soft-errors" e metofologia di progettazione per sistemi digitali CMOS,
2022 Jain, Abhishek
Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing
2022 Jain, A.; Veggetti, A. M.; Crippa, D.; Benfante, A.; Gerardin, S.; Bagatin, M.
Three-step colloidal gelation revealed by time-resolved x-ray photon correlation spectroscopy
2022 Jain, A.; Schulz, F.; Dallari, F.; Markmann, V.; Westermeier, F.; Zhang, Y.; Grubel, G.; Lehmkuhler, F.
Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology
2020 Jain, Abhishek; Veggetti, Andrea; Crippa, D.; Benfante, A.; Gerardin, S.; Bagatin, M.; Cazzaniga, C.
Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit
2020 Jain, A.; Veggetti, A.; Crippa, D.; Benfante, A.; Gerardin, S.; Bagatin, M.
| Titolo | Data di pubblicazione | Autori | Rivista | Serie | Titolo libro |
|---|---|---|---|---|---|
| Architettura di Flip Flip efficiente e resistente ai "soft-errors" e metofologia di progettazione per sistemi digitali CMOS, | 2022 | JAIN, ABHISHEK | - | - | - |
| Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing | 2022 | Jain A.Gerardin S.Bagatin M. + | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - | - |
| Three-step colloidal gelation revealed by time-resolved x-ray photon correlation spectroscopy | 2022 | Jain A.Dallari F. + | THE JOURNAL OF CHEMICAL PHYSICS | - | - |
| Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology | 2020 | Abhishek JainS. GerardinM. Bagatin + | - | - | Alpha, Heavy Ion and Neutron Test Results On 90nm ST BCD-CMOS technology |
| Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit | 2020 | Jain A.Gerardin S.Bagatin M. + | - | - | Proceedings - 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020 |