AMANO, HIROSHI
AMANO, HIROSHI
Dipartimento di Ingegneria dell'Informazione - DEI
Modeling the degradation mechanisms of AlGaN-based UV-C LEDs: From injection efficiency to mid-gap state generation
2020 Piva, F.; DE SANTI, C.; Deki, M.; Kushimoto, M.; Amano, H.; Tomozawa, H.; Shibata, N.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Stability and degradation of AlGaN-based UV-B LEDs: Role of doping and semiconductor defects
2019 Piva, F.; De Santi, C.; Deki, M.; Kushimoto, M.; Amano, H.; Tomozawa, H.; Shibata, N.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
The 2018 GaN power electronics roadmap
2018 Amano, Hiroshi; Baines, Y.; Beam, E.; Borga, Matteo; Bouchet, T.; Chalker, Paul R; Geurts, CHARLES - MICHEL LOUIS - MARIE GHISLAIN; Chen, Kevin J; Chowdhury, Nadim; Chu, Rongming; De Santi, Carlo; De Souza, Maria Merlyne; Decoutere, Stefaan; Di Cioccio, L.; Eckardt, Bernd; Egawa, Takashi; Fay, P.; Freedsman, Joseph J; Guido, L.; Häberlen, Oliver; Haynes, Geoff; Heckel, Thomas; Hemakumara, Dilini; Houston, Peter; Hu, Jie; Hua, Mengyuan; Huang, Qingyun; Huang, Alex; Jiang, Sheng; Kawai, H.; Kinzer, Dan; Kuball, Martin; Kumar, Ashwani; Lee, Kean Boon; Li, Xu; Marcon, Denis; März, Martin; Mccarthy, R.; Meneghesso, Gaudenzio; Meneghini, Matteo; Morvan, E.; Nakajima, A.; Narayanan, E. M. S.; Oliver, Stephen; Palacios, Tomás; Piedra, Daniel; Plissonnier, M.; Reddy, R.; Sun, Min; Thayne, Iain; Torres, A.; Trivellin, Nicola; Unni, V.; Uren, Michael J; Van Hove, Marleen; Wallis, David J; Wang, J.; Xie, J.; Yagi, S.; Yang, Shu; Youtsey, C.; Yu, Ruiyang; Zanoni, Enrico; Zeltner, Stefan; Zhang, Yuhao