Degradation of GaN-on-GaN vertical diodes submitted to high current stress

Fabris, E.;Meneghini, M.;De Santi, C.;Hu, Z.;Li, W.;Nomoto, K.;Gao, X.;Jena, D.;Xing, H. G.;Meneghesso, G.;Zanoni, E.

2018