ZENARI, MICHELE
 Distribuzione geografica
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Continente #
NA - Nord America 211
AS - Asia 187
EU - Europa 124
AF - Africa 2
Totale 524
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Nazione #
US - Stati Uniti d'America 206
SG - Singapore 110
CN - Cina 49
IT - Italia 47
DE - Germania 21
HK - Hong Kong 14
FR - Francia 12
FI - Finlandia 10
PL - Polonia 8
RU - Federazione Russa 8
CA - Canada 5
JP - Giappone 5
TW - Taiwan 5
GB - Regno Unito 4
AT - Austria 3
IE - Irlanda 3
IL - Israele 3
BE - Belgio 2
BG - Bulgaria 2
ES - Italia 2
GR - Grecia 2
EG - Egitto 1
IN - India 1
KE - Kenya 1
Totale 524
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Città #
Singapore 83
Santa Clara 42
Padova 28
Beijing 24
Fairfield 21
Boardman 19
Chandler 12
Ashburn 9
Hong Kong 9
Warsaw 8
Helsinki 7
San Jose 6
Turin 6
Albuquerque 5
Berlin 4
Cambridge 4
Taipei City 4
Des Moines 3
Kwun Hang 3
Lappeenranta 3
Medford 3
Neustadt in Holstein 3
Princeton 3
Santa Barbara 3
Shanghai 3
Stuttgart 3
Abano Terme 2
Athens 2
Buffalo 2
Casier 2
Central 2
Dublin 2
Guangzhou 2
Houston 2
Montreal 2
Nuremberg 2
Pittsburgh 2
Ronse 2
Santander 2
Sofia 2
Tel Aviv 2
Toronto 2
Venice 2
Woodbridge 2
Ann Arbor 1
Bologna 1
Cairo 1
Cork 1
Duisburg 1
Falkenstein 1
Goleta 1
Hamburg 1
Hounslow 1
Jerusalem 1
Kaohsiung City 1
Kochi 1
Los Angeles 1
Milan 1
Minatomirai 1
Nairobi 1
Nakanobu 1
Osaka 1
Palo Alto 1
Pune 1
San Diego 1
Spring 1
Tokyo 1
Vicenza 1
Vigonovo 1
Voiron 1
Waterloo 1
Wilmington 1
Totale 382
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Nome #
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs 72
Degradation mechanisms of 1.3 μm C-doped quantum dot lasers grown on native substrate 49
Identification of dislocation-related and point-defects in III-As layers for silicon photonics applications 48
Degradation Processes and Aging in Quantum Dot Lasers on Silicon 43
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate 43
Advanced Characterization and Modeling of Laser Diodes for Silicon Photonics 35
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study 29
Impact of a defect trapping layer on the reliability of 1.3 μm quantum dot laser diodes grown on silicon 29
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits 25
Optical Degradation of InAs Quantum-Dot lasers on Silicon: Dependence on Temperature and on Diffusion Processes 24
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics 22
Improving the Reliability of InAs Quantum-Dot Laser Diodes for Silicon Photonics: the Role of Trapping Layers and Misfit-Dislocation Density 20
Degradation mechanisms of laser diodes for silicon photonics applications 20
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization 19
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits 18
Impact of the oxide aperture width on the degradation of 845 nm VCSELs for silicon photonics 14
Degradation of 1.3 μm Quantum Dot Laser Diodes for silicon photonics: dependence on the number of dot-in-a-well layers 12
Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations 11
Lifetime-limiting mechanisms of integrated IR sources for silicon photonics 11
Totale 544
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Categoria #
all - tutte 3.982
article - articoli 1.908
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.890
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202113 0 0 0 0 0 0 0 0 0 0 0 13
2021/202237 0 0 0 0 0 3 11 7 3 0 6 7
2022/2023109 7 1 1 0 6 5 4 2 8 0 55 20
2023/2024116 19 11 6 5 8 2 18 2 13 8 13 11
2024/2025269 3 76 32 26 43 44 34 11 0 0 0 0
Totale 544