DANESIN, FRANCESCA
DANESIN, FRANCESCA
Characterization and Analysis of Trap-Related Effects in AlGaN-GaN HEMTs
2007 Faqir, M; Verzellesi, G; Fantini, F; Danesin, Francesca; Rampazzo, Fabiana; Meneghesso, Gaudenzio; Zanoni, Enrico; Cavallini, A; Castaldini, A; Labat, N; Dua, C.
Degradation induced by 2-MeV alpha particles on AlGaN/GaN High Electron Mobility Transistors
2006 Danesin, Francesca; Zanon, Franco; Gerardin, Simone; Rampazzo, Fabiana; Meneghesso, Gaudenzio; Zanoni, Enrico; Paccagnella, Alessandro
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields
2008 Tazzoli, Augusto; Meneghesso, Gaudenzio; Zanon, Franco; Danesin, Francesca; Zanoni, Enrico; Bove, P; Langer, R; Thorpe, J.
Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing
2009 Zanoni, Enrico; Danesin, Francesca; Meneghini, Matteo; Cetronio, A; Lanzieri, C; Peroni, M; Meneghesso, Gaudenzio
Mechanisms of RF current collapse in AlGaN-GaN high electron mobility transistors
2008 Faqir, M; Verzellesi, G; Chini, A; Fantini, F; Danesin, Francesca; Meneghesso, Gaudenzio; Zanoni, Enrico; Dua, C.
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives
2008 Meneghesso, Gaudenzio; Verzellesi, G; Danesin, Francesca; Rampazzo, Fabiana; Zanon, Franco; Tazzoli, Augusto; Meneghini, Matteo; Zanoni, Enrico
Thermal storage effects on AlGaN/GaN HEMT
2008 Danesin, Francesca; Tazzoli, Augusto; Zanon, Franco; Meneghesso, Gaudenzio; Zanoni, Enrico; Cetronio, A; Lanzied, C; Lavanga, S; Peroni, M; Romanini, P.