In this paper we present a detailed characterization of kink effects in AlGaN/GaN HEMTs. Our data suggest that kink is due to a shift in the device pinch-off voltages resulting from electron trapping in the GaN buffer layer. The presence of the kink is fully correlated with the appearance of the ???yellow luminescence??? broad peak in cathodolumine-scence spectra taken on the device active area, thus confirming that cathodoluminescence and photolumi-nescence spectroscopy may represent valuable techniques for the screening of this parasitic effect.

Kink and Cathodoluminescence in AlGaN/GaN HEMTs

MENEGHESSO, GAUDENZIO;STOCCO, ANTONIO;RONCHI, NICOLO';ZANONI, ENRICO;
2010

Abstract

In this paper we present a detailed characterization of kink effects in AlGaN/GaN HEMTs. Our data suggest that kink is due to a shift in the device pinch-off voltages resulting from electron trapping in the GaN buffer layer. The presence of the kink is fully correlated with the appearance of the ???yellow luminescence??? broad peak in cathodolumine-scence spectra taken on the device active area, thus confirming that cathodoluminescence and photolumi-nescence spectroscopy may represent valuable techniques for the screening of this parasitic effect.
2010
WOCSDICE 2010 34rd Workshop on Compound Semiconductor Devices and Integrated Circuits,
WOCSDICE 2010 34rd Workshop on Compound Semiconductor Devices and Integrated Circuits,
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2437618
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