MAGGIPINTO, MARCO
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 824
EU - Europa 78
AS - Asia 71
OC - Oceania 1
Totale 974
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 824
CN - Cina 38
SE - Svezia 18
SG - Singapore 18
IT - Italia 13
VN - Vietnam 12
FI - Finlandia 11
GB - Regno Unito 11
DE - Germania 9
IE - Irlanda 9
FR - Francia 6
KR - Corea 2
AU - Australia 1
CZ - Repubblica Ceca 1
TW - Taiwan 1
Totale 974
Salva come PNG Salva come JPEG
Città #
Fairfield 191
Ashburn 89
Cambridge 76
Woodbridge 71
Houston 63
Seattle 51
Chandler 42
Wilmington 39
Ann Arbor 36
San Diego 27
Medford 19
Princeton 19
Des Moines 17
Beijing 13
Dong Ket 12
Singapore 12
Helsinki 9
Dublin 7
Jinan 5
London 5
Washington 5
Gavirate 4
Redmond 4
Shenyang 4
Nanjing 3
Boardman 2
Hounslow 2
Norwalk 2
Oulu 2
Padova 2
Sindelfingen 2
Zhengzhou 2
Acton 1
Borås 1
Brendola 1
Brisbane 1
Chiswick 1
Guangzhou 1
Hangzhou 1
Huzhou 1
Jiaxing 1
Las Vegas 1
Limena 1
Napoli 1
Prague 1
Rockville 1
Taipei 1
Taizhou 1
Totale 853
Salva come PNG Salva come JPEG
Nome #
Deep learning for virtual metrology: Modeling with optical emission spectroscopy data 87
A Computer Vision-inspired Deep Learning Architecture for Virtual Metrology modeling with 2-Dimensional Data 81
A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology 73
Laundry Fabric Classification in Vertical Axis Washing Machines Using Data-Driven Soft Sensors 72
Probabilistic Word Embeddings in Neural IR: A Promising Model That Does Not Work as Expected (For Now) 70
Machine Learning-based Laundry Weight Estimation for Vertical Axis Washing Machines 69
A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing 68
A deep learning-based approach to anomaly detection with 2-dimensional data in manufacturing 65
DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology 62
What are the most informative data for virtual metrology? a use case on multi-stage processes fault prediction 56
Induced Start Dynamic Sampling for Wafer Metrology Optimization 55
Proximal Deterministic Policy Gradient 37
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing 33
Adversarial training reduces information and improves transferability 31
ß-variational classifiers under attack 31
Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images 31
IntroVAC: Introspective Variational Classifiers for learning interpretable latent subspaces 29
A Deep Convolutional Autoencoder-Based Approach for Anomaly Detection With Industrial, Non-Images, 2-Dimensional Data: A Semiconductor Manufacturing Case Study 28
On Optimising Spatial Sampling Plans for Wafer Profile Reconstruction 24
Totale 1.002
Salva come PNG Salva come JPEG
Categoria #
all - tutte 5.131
article - articoli 2.470
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 295
Totale 7.896
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020219 12 8 0 19 16 10 12 34 37 42 24 5
2020/2021178 20 10 14 2 7 16 7 16 26 16 20 24
2021/2022312 11 35 20 22 7 32 56 19 9 26 20 55
2022/2023102 30 0 0 2 19 24 0 11 7 0 5 4
2023/2024122 5 19 22 19 17 15 6 1 0 0 10 8
Totale 1.002