MAGGIPINTO, MARCO
 Distribuzione geografica
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Continente #
NA - Nord America 968
AS - Asia 255
EU - Europa 132
SA - Sud America 26
AF - Africa 2
OC - Oceania 1
Totale 1.384
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Nazione #
US - Stati Uniti d'America 965
SG - Singapore 128
CN - Cina 59
HK - Hong Kong 46
DE - Germania 27
BR - Brasile 25
SE - Svezia 18
FI - Finlandia 15
VN - Vietnam 15
FR - Francia 14
GB - Regno Unito 13
IT - Italia 13
PL - Polonia 10
IE - Irlanda 9
RU - Federazione Russa 7
BE - Belgio 3
CA - Canada 3
KR - Corea 3
TH - Thailandia 2
AR - Argentina 1
AU - Australia 1
CH - Svizzera 1
CI - Costa d'Avorio 1
CZ - Repubblica Ceca 1
NL - Olanda 1
TR - Turchia 1
TW - Taiwan 1
ZA - Sudafrica 1
Totale 1.384
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Città #
Fairfield 191
Ashburn 89
Santa Clara 84
Cambridge 76
Singapore 74
Woodbridge 71
Houston 63
Seattle 51
Hong Kong 46
Chandler 42
Wilmington 39
Ann Arbor 36
San Diego 27
Boardman 21
Medford 19
Princeton 19
Des Moines 17
Beijing 13
Helsinki 13
Dong Ket 12
Bytom 10
Dublin 7
London 7
Falkenstein 5
Jinan 5
Washington 5
Gavirate 4
Redmond 4
Shenyang 4
Brussels 3
Ho Chi Minh City 3
Nanjing 3
Nuremberg 3
Bang Lamung 2
Hounslow 2
Norwalk 2
Ottawa 2
Oulu 2
Padova 2
Sete Lagoas 2
Sindelfingen 2
São João del Rei 2
Zhengzhou 2
Abidjan 1
Acton 1
Adapazarı 1
Agrolândia 1
Alta Floresta 1
Amsterdam 1
Assis 1
Bagé 1
Belo Horizonte 1
Borås 1
Brendola 1
Brisbane 1
Cachoeiras de Macacu 1
Caxias do Sul 1
Chiswick 1
Frankfurt am Main 1
Garanhuns 1
Guangzhou 1
Guapimirim 1
Hangzhou 1
Huzhou 1
Indaiatuba 1
Intendente Alvear 1
Jacareí 1
Jiaxing 1
Johannesburg 1
Las Vegas 1
Limena 1
Maceió 1
Napoli 1
Palmas 1
Petrolina 1
Porto Seguro 1
Prague 1
Rio Claro 1
Rockville 1
Salvador 1
Santo André 1
Seoul 1
São Vicente 1
Taipei 1
Taizhou 1
Tavares 1
The Dalles 1
Toronto 1
Zurich 1
Totale 1.132
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Nome #
Deep learning for virtual metrology: Modeling with optical emission spectroscopy data 114
A Computer Vision-inspired Deep Learning Architecture for Virtual Metrology modeling with 2-Dimensional Data 107
A Convolutional Autoencoder Approach for Feature Extraction in Virtual Metrology 94
Probabilistic Word Embeddings in Neural IR: A Promising Model That Does Not Work as Expected (For Now) 92
A Dynamic Sampling Approach for Cost Reduction in Semiconductor Manufacturing 89
Machine Learning-based Laundry Weight Estimation for Vertical Axis Washing Machines 86
Laundry Fabric Classification in Vertical Axis Washing Machines Using Data-Driven Soft Sensors 84
A deep learning-based approach to anomaly detection with 2-dimensional data in manufacturing 84
DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology 82
What are the most informative data for virtual metrology? a use case on multi-stage processes fault prediction 78
Induced Start Dynamic Sampling for Wafer Metrology Optimization 75
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing 60
Proximal Deterministic Policy Gradient 59
Adversarial training reduces information and improves transferability 56
IntroVAC: Introspective Variational Classifiers for learning interpretable latent subspaces 54
ß-variational classifiers under attack 51
Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images 50
A Deep Convolutional Autoencoder-Based Approach for Anomaly Detection With Industrial, Non-Images, 2-Dimensional Data: A Semiconductor Manufacturing Case Study 50
On Optimising Spatial Sampling Plans for Wafer Profile Reconstruction 49
Totale 1.414
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Categoria #
all - tutte 7.138
article - articoli 3.413
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 396
Totale 10.947
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202029 0 0 0 0 0 0 0 0 0 0 24 5
2020/2021178 20 10 14 2 7 16 7 16 26 16 20 24
2021/2022312 11 35 20 22 7 32 56 19 9 26 20 55
2022/2023102 30 0 0 2 19 24 0 11 7 0 5 4
2023/2024122 5 19 22 19 17 15 6 1 0 0 10 8
2024/2025412 0 46 13 23 107 10 13 66 52 24 58 0
Totale 1.414