MAGNONE, PAOLO
MAGNONE, PAOLO
Dipartimento di Tecnica e Gestione dei Sistemi Industriali - DTG
1/f Noise in Drain and Gate Current of MOSFETs With High-k Gate Stacks
2009 Magnone, P; Crupi, F; Giusi, G; Pace, C; Simoen, E; Claeys, C; Pantisano, L; Maji, D; Rao, V R; Srinivasan, P
A Comparative Study of MWT Architectures by Means of Numerical Simulations
2013 Magnone, Paolo; Tonini, Diego; De Rose, Raffaele; Frei, Michel; Crupi, Felice; Lanuzza, Marco; Sangiorgi, Enrico; Fiegna, Claudio
A Distributed Electrical Model for Interdigitated back Contact Silicon Solar Cells
2014 Daniele, Giaffreda; Maarten, Debucquoy; Magnone, Paolo; Niels, Posthuma; Claudio, Fiegna
A methodology to account for the finger interruptions in solar cell performance
2012 DE ROSE, Raffaele; Malomo, A.; Magnone, Paolo; Crupi, F.; Cellere, G.; Martire, M.; Tonini, D.; Sangiorgi, Enrico
A Methodology to Account for the Finger Non-Uniformity in Photovoltaic Solar Cell
2012 Magnone, Paolo; G., Napoletano; DE ROSE, Raffaele; F., Crupi; D., Tonini; G., Cellere; M., Galiazzo; Sangiorgi, Enrico; Fiegna, Claudio
Analysis of an On-Line Stability Monitoring Approach for DC Microgrid Power Converters
2019 Khodamoradi, Aram; Liu, Guangyuan; Mattavelli, Paolo; Caldognetto, Tommaso; Magnone, Paolo
Analysis of the impact of doping levels on performance of back contact - back junction solar cells
2014 Procel, Paul; Maccaronio, Vincenzo; Crupi, Felice; Cocorullo, Giuseppe; Zanuccoli, Mauro; Magnone, Paolo; Fiegna, Claudio
Analysis of the impact of geometrical and technological parameters on recombination losses in interdigitated back-contact solar cells
2015 Mauro, Zanuccoli; Magnone, Paolo; Enrico, Sangiorgi; Claudio, Fiegna
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
2009 Crupi, F; Giusi, G; Iannaccone, G; Magnone, P; Pace, C; Simoen, E; Claeys, C
Assessment of paper-based MoS2 FET for Physically Unclonable Functions
2022 Vatalaro, M.; De Rose, R.; Lanuzza, M.; Magnone, P.; Conti, S.; Iannaccone, G.; Crupi, F.
Buried silicon-germanium pMOSFETs: Eanalysis in VLSI logic circuits under aggressive voltage scaling
2012 Crupi, Felice; Alioto, Massimo; Franco, Jacopo; Magnone, Paolo; Kaczer, Ben; Groeseneken, Guido; Mitard, Jéröme; Witters, Liesbeth; Hoffmann, Thomas Y.
Characterization and modeling of hot carrier-induced variability in subthreshold region
2012 Magnone, Paolo; Crupi, Felice; Wils, Nicole; Tuinhout, Hans P.; Fiegna, Claudio
Criticisms on and comparison of experimental channel backscattering extraction methods
2011 Giusi, G; Crupi, F; Magnone, P
Enhanced Level-Shifted Modulation for a Three-Phase Five-level Modified Modular Multilevel Converter (MMC)
2021 Younis, T.; Mattavelli, P.; Magnone, P.; Toigo, I.; Corradin, M.
Experimental analysis of variability in WS2-based devices for hardware security
2023 Vatalaro, M.; Neill, H.; Gity, F.; Magnone, P.; Maccaronio, V.; Marquez, C.; Galdon, J. C.; Gamiz, F.; Crupi, F.; Hurley, P.; De Rose, R.
Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment
2014 Magnone, Paolo; Traverso, Pier Andrea; Barletta, Giacomo; Fiegna, Claudio
Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices
2017 Magnone, Paolo; Traverso, Pier Andrea; Fiegna, Claudio
Fabrication, characterization and modeling of a silicon solar cell optimized for concentrated photovoltaic applications
2015 G., Paternoster; M., Zanuccoli; P., Bellutti; L., Ferrario; F., Ficorella; C., Fiegna; Magnone, Paolo; F., Mattedi; E., Sangiorgi
Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
2007 Magnone, P; Crupi, F; Pantisano, L; Pace, C
FinFET Mismatch in Subthreshold Region: Theory and Experiments
2010 Magnone, P; Crupi, F; Mercha, A; Andricciola, P; Tuinhout, H; Lander, R J P