BARI, DANIELE

BARI, DANIELE  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Comparison between positive and negative constant current stress on dye-sensitized solar cells 2013 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric 2013 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure 2012 WRACHIEN, NICOLABARI, DANIELEMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Improved Tolerance Against UV and Alpha Irradiation of Encapsulated Organic TFTs 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Near-UV Irradiation Effects on Pentacene-Based Organic Thin Film Transistors 2011 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED 2012 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs) 2012 BARI, DANIELECESTER, ANDREAWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + IEEE JOURNAL OF PHOTOVOLTAICS - -
Thermal and electrical stress effects of electrical and optical characteristics of Alq(3)/NPD OLED 2010 CESTER, ANDREABARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs) 2011 BARI, DANIELEWRACHIEN, NICOLAMENEGHESSO, GAUDENZIOCESTER, ANDREA + MICROELECTRONICS RELIABILITY - -
Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors 2012 WRACHIEN, NICOLACESTER, ANDREABARI, DANIELEMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -