GENTNER, NATALIE
 Distribuzione geografica
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Continente #
AS - Asia 134
NA - Nord America 130
EU - Europa 84
AF - Africa 3
SA - Sud America 1
Totale 352
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Nazione #
US - Stati Uniti d'America 129
KR - Corea 39
CN - Cina 37
IT - Italia 23
DE - Germania 16
SG - Singapore 14
HK - Hong Kong 12
GB - Regno Unito 11
JP - Giappone 8
TW - Taiwan 8
BD - Bangladesh 5
NL - Olanda 5
SE - Svezia 5
BA - Bosnia-Erzegovina 4
CZ - Repubblica Ceca 4
FI - Finlandia 4
FR - Francia 4
IN - India 4
ES - Italia 3
IR - Iran 3
TN - Tunisia 3
IE - Irlanda 2
LK - Sri Lanka 2
CA - Canada 1
DK - Danimarca 1
RO - Romania 1
SA - Arabia Saudita 1
UA - Ucraina 1
VE - Venezuela 1
VN - Vietnam 1
Totale 352
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Città #
Fairfield 25
Houston 11
Beijing 9
Suwon 9
Ann Arbor 8
New Haven 7
Ashburn 6
Seogwipo 6
Singapore 6
Wilmington 6
Cambridge 5
Chandler 5
Dhaka 5
San Diego 5
San Jose 5
Seattle 5
Banbridge 4
Cagliari 4
College Park 4
Des Moines 4
Helsinki 4
London 4
Medford 4
Milan 4
Princeton 4
Sarajevo 4
Guangzhou 3
Hong Kong 3
Hsinchu 3
Naples 3
New York 3
Paderno Dugnano 3
Paris 3
Zabreh 3
Ōtemae 3
Bad Soden-Salmuenster 2
Bucheon-si 2
Central 2
Colombo 2
Darmstadt 2
Dresden 2
Dublin 2
Franeker 2
Hamburg 2
Las Palmas de Gran Canaria 2
Munich 2
New Taipei 2
Ongole 2
Seongnam-si 2
Shiraz 2
Tainan City 2
Venice 2
Aarhus 1
Amsterdam 1
Belfast 1
Boardman 1
Bryan 1
Busan 1
Bushehr 1
Caracas 1
Castelnuovo Rangone 1
Chennai 1
Coimbatore 1
Eichenau 1
Erlangen 1
Gangnam-gu 1
Ho Chi Minh City 1
Incheon 1
Kharkiv 1
Lafayette 1
Montreal 1
Muglinov 1
Nam-gu 1
Nantes 1
Padova 1
Portland 1
Pyeongtaek-si 1
Riyadh 1
Salamanca 1
Sejong 1
Shanghai 1
Short Hills 1
Taipei City 1
Tokyo 1
Toyonaka 1
Woodbridge 1
Totale 258
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Nome #
Enhancing Scalability of Deep Learning Based Approaches in Semiconductor Manufacturing 195
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing 33
Enhancing Scalability of Virtual Metrology: A Deep Learning-Based Approach for Domain Adaptation 31
Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images 31
DBAM: Making Virtual Metrology/Soft sensing with time series data scalable through Deep Learning 28
Predictive Maintenance in the Industry: A Comparative Study on Deep Learning-based Remaining Useful Life Estimation 27
A Scalable Deep Learning-Based Approach for Anomaly Detection in Semiconductor Manufacturing 6
Deep Learning-based Sequence Modeling for Advanced Process Control in Semiconductor Manufacturing 5
Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS) 4
Totale 360
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Categoria #
all - tutte 1.856
article - articoli 589
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.445
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202114 0 0 0 0 0 0 0 0 0 0 14 0
2021/202267 0 0 0 11 0 11 18 3 2 11 0 11
2022/202354 7 0 0 0 1 6 0 1 1 12 9 17
2023/2024219 14 11 27 11 12 23 43 27 17 10 12 12
2024/20256 6 0 0 0 0 0 0 0 0 0 0 0
Totale 360