Efficient decision-making is paramount in manufacturing industries, particularly in sectors like semiconductor manufacturing, which operate within high-demand environments. The semiconductor manufacturing domain, driven by the pervasive utilization of electronics in computing and sensing devices, confronts escalating challenges related to quality control and productivity optimization. This work centers on predicting Overall Equipment Efficiency (OEE), a pivotal metric for pinpointing production efficiency hurdles and refining decision-making processes. Despite its widespread adoption across various industrial domains, there exists a dearth of literature concerning OEE prediction methodologies, with no literature in the context of semiconductor manufacturing. In this work, we propose Deep Learning-based Sequential Learning approaches for OEE estimations. Specifically, we employ the CEEMDAN-GRU model, a deep learning architecture that amalgamates modeling techniques with signal filtering...

Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation

N. Gentner;G. A. Susto
2024

Abstract

Efficient decision-making is paramount in manufacturing industries, particularly in sectors like semiconductor manufacturing, which operate within high-demand environments. The semiconductor manufacturing domain, driven by the pervasive utilization of electronics in computing and sensing devices, confronts escalating challenges related to quality control and productivity optimization. This work centers on predicting Overall Equipment Efficiency (OEE), a pivotal metric for pinpointing production efficiency hurdles and refining decision-making processes. Despite its widespread adoption across various industrial domains, there exists a dearth of literature concerning OEE prediction methodologies, with no literature in the context of semiconductor manufacturing. In this work, we propose Deep Learning-based Sequential Learning approaches for OEE estimations. Specifically, we employ the CEEMDAN-GRU model, a deep learning architecture that amalgamates modeling techniques with signal filtering...
2024
Proceeding of the 2024 10th International Conference on Control, Decision and Information Technologies (CoDIT)
10th International Conference on Control, Decision and Information Technologies, CoDIT 2024
9798350373974
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/3531201
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