GENTNER, NATALIE
GENTNER, NATALIE
Università di Padova
A Scalable Deep Learning-Based Approach for Anomaly Detection in Semiconductor Manufacturing
2021 Tedesco, S.; Susto, G. A.; Gentner, N.; Kyek, A.; Yang, Y.
DBAM: Making Virtual Metrology/Soft sensing with time series data scalable through Deep Learning
2021 Gentner, N.; Carletti, M.; Kyek, A.; Susto, G. A.; Yang, Y.
Deep Learning-based Sequence Modeling for Advanced Process Control in Semiconductor Manufacturing
2023 Zuanna, Filippo Dalla; Gentner, Natalie; Susto, Gian Antonio
Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation
2024 Boni, F.; De Monte, R.; Yang, Y.; Gentner, N.; Khim Low, J.; Susto, G. A.
Enhancing Scalability of Deep Learning Based Approaches in Semiconductor Manufacturing
2023 Gentner, Natalie
Enhancing Scalability of Virtual Metrology: A Deep Learning-Based Approach for Domain Adaptation
2020 Gentner, N.; Kyek, A.; Yang, Y.; Carletti, M.; Susto, G. A.
Exploiting 2D Coordinates as Bayesian Priors for Deep Learning Defect Classification of SEM Images
2021 Arena, S.; Bodrov, Y.; Carletti, M.; Gentner, N.; Maggipinto, M.; Yang, Y.; Beghi, A.; Kyek, A.; Susto, G. A.
Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS)
2024 Gentner, Natalie; Susto, Gian Antonio
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing
2020 Carletti, M.; Maggipinto, M.; Beghi, A.; Susto, G.; Gentner, N.; Yang, Y.; Kyek, A.
Predictive Maintenance in the Industry: A Comparative Study on Deep Learning-based Remaining Useful Life Estimation
2023 Lorenti, Luciano; Pezze, Davide Dalle; Andreoli, Jacopo; Masiero, Chiara; Gentner, Natalie; Yang, Yao; Susto, Gian Antonio