PERETTI, VANNI
PERETTI, VANNI
Characterization Issues and Charge Trapping Effects on RF-MEMS switches
2007 Tazzoli, Augusto; Peretti, Vanni; Meneghesso, Gaudenzio
Characterization Issues and ESD Sensitivity of RF-MEMS Switches
2006 Tazzoli, Augusto; Peretti, Vanni; D., Bozzato; Zanoni, Enrico; Meneghesso, Gaudenzio
Development of reliable RF-MEMS switches for antennas and space applications
2008 Peretti, Vanni
Electrostatic Discharge and Cycling effects on Ohmic and capacitive RF-MEMS Switches
2007 Tazzoli, Augusto; Peretti, Vanni; Meneghesso, Gaudenzio
EOS/ESD Sensitivity of Functional rf-MEMS Switches
2008 Tazzoli, Augusto; Peretti, Vanni; Autizi, Enrico; Meneghesso, Gaudenzio
Long Term Actuation Issues of Ohmic RF-MEMS Switches
2007 Tazzoli, Augusto; Peretti, Vanni; Meneghesso, Gaudenzio
Radiation Sensitivity of Ohmic RF-MEMS Switches for Spatial Applications
2009 Tazzoli, Augusto; Cellere, Giorgio; Autizi, Enrico; Peretti, Vanni; Paccagnella, Alessandro; Meneghesso, Gaudenzio
Reliability issues in RF-MEMS switches submitted to cycling and ESD test
2006 Tazzoli, Augusto; Peretti, Vanni; Gaddi, R.; Gnudi, A.; Zanoni, Enrico; Meneghesso, Gaudenzio
Resistive RF-MEMS Switches Characterization and Reliability
2005 Tazzoli, Augusto; A., Gnudi; R., Gaddi; Peretti, Vanni; Zanoni, Enrico; Meneghesso, Gaudenzio
RF-MEMS Switches Reliability for Long Term Spatial Applications
2007 Tazzoli, Augusto; Peretti, Vanni; Cellere, Giorgio; Meneghesso, Gaudenzio
Stiction Induced by Dielectric Breakdown on rf-MEMS Switches
2008 Tazzoli, Augusto; Autizi, Enrico; Peretti, Vanni; Meneghesso, Gaudenzio
Suspensions Shape Impact on the Reliability of RF-MEMS Redundancy Switches
2008 Tazzoli, Augusto; Peretti, Vanni; Autizi, Enrico; Meneghesso, Gaudenzio
Transmission line pulse (TLP) testing of radio frequency (RF) micro-machined micro-electromechanical systems (MEMS) switches
2006 Tazzoli, Augusto; Peretti, Vanni; Zanoni, Enrico; Meneghesso, Gaudenzio