Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

Aglieri Rinella, Gianluca;Alocco, Giacomo;Antonelli, Matias;Baccomi, Roberto;Beole, Stefania Maria;Blidaru, Mihail Bogdan;Buttwill, Bent Benedikt;Buschmann, Eric;Camerini, Paolo;Carnesecchi, Francesca;Chartier, Marielle;Choi, Yongjun;Colocci, Manuel;Contin, Giacomo;Dannheim, Dominik;De Gruttola, Daniele;Del Rio Viera, Manuel;Dubla, Andrea;di Mauro, Antonello;Donner, Maurice Calvin;Eberwein, Gregor Hieronymus;Egger, Jan;Fabbietti, Laura;Feindt, Finn;Gautam, Kunal;Gernhaeuser, Roman;Glover, James Julian;Gonella, Laura;Gran Grodaas, Karl;Gregor, Ingrid-Maria;Hillemanns, Hartmut;Huth, Lennart;Ilg, Armin;Isakov, Artem;Jones, Daniel Matthew;Junique, Antoine;Kaewjai, Jetnipit;Keil, Markus;Kim, Jiyoung;Kluge, Alex;Kobdaj, Chinorat;Kotliarov, Artem;Kittimanapun, Kritsada;Křížek, Filip;Kucharska, Gabriela;Kushpil, Svetlana;La Rocca, Paola;Laojamnongwong, Natthawut;Lautner, Lukas;Lemmon, Roy Crawford;Lemoine, Corentin;Li, Long;Librizzi, Francesco;Liu, Jian;Macchiolo, Anna;Mager, Magnus;Marras, Davide;Martinengo, Paolo;Masciocchi, Silvia;Mattiazzo, Serena;Menzel, Marius Wilm;Mulliri, Alice;Musta, Alexander;Mylne, Mia Rose;Piro, Francesco;Rachevski, Alexandre;Rasà, Marika;Rebane, Karoliina;Reidt, Felix;Ricci, Riccardo;Ruiz Daza, Sara;Saccà, Gaspare;Sanna, Isabella;Sarritzu, Valerio;Schlaadt, Judith;Schledewitz, David;Scioli, Gilda;Senyukov, Serhiy;Simancas, Adriana;Snoeys, Walter;Spannagel, Simon;Šuljić, Miljenko;Sturniolo, Alessandro;Tiltmann, Nicolas;Trifirò, Antonio;Usai, Gianluca;Vanat, Tomas;Van Beelen, Jacob Bastiaan;Varga, Laszlo;Verdoglia, Michele;Vignola, Gianpiero;Villani, Anna;Wennloef, Haakan;Witte, Jonathan;Wittwer, Rebekka Bettina

2024