This paper defines the latch-up failure mechanism in CMOS, analyzes methods and tools to detect it, including microscopy techniques capable of identify parasitic latch-up paths; test structures for the study of latch-up sensitivity and methods to prevent latch-up are also described.

Latch-up in CMOS integrated circuits

ZANONI, ENRICO
1989

Abstract

This paper defines the latch-up failure mechanism in CMOS, analyzes methods and tools to detect it, including microscopy techniques capable of identify parasitic latch-up paths; test structures for the study of latch-up sensitivity and methods to prevent latch-up are also described.
1989
Microelectronic reliability
0890063508
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2514574
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