Various inorganic films deposited on flat glass surfaces were analysed using large angle diffusion (Rutherford backscattering) of 1.8 MeV 4He+ ions, scanning electron microscopy, spectrophotometry, electron microprobe analysis, X-ray fluorescence and diffractometric analysis. The aim of the research was to establish the composition, thickness and homogeneity of coatings deposited under different experimental conditions. The results obtianed using the current or sophisticated techniques are compared and discussed. © 1981.
Analysis of coatings on flat glasses using combined techniques
BATTAGLIN, GIANCARLO;DELLA MEA, GIANANTONIO;DE MARCHI, GIOVANNA;MAZZOLDI, PAOLO;GUGLIELMI, MASSIMO
1981
Abstract
Various inorganic films deposited on flat glass surfaces were analysed using large angle diffusion (Rutherford backscattering) of 1.8 MeV 4He+ ions, scanning electron microscopy, spectrophotometry, electron microprobe analysis, X-ray fluorescence and diffractometric analysis. The aim of the research was to establish the composition, thickness and homogeneity of coatings deposited under different experimental conditions. The results obtianed using the current or sophisticated techniques are compared and discussed. © 1981.File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.




