Various inorganic films deposited on flat glass surfaces were analysed using large angle diffusion (Rutherford backscattering) of 1.8 MeV 4He+ ions, scanning electron microscopy, spectrophotometry, electron microprobe analysis, X-ray fluorescence and diffractometric analysis. The aim of the research was to establish the composition, thickness and homogeneity of coatings deposited under different experimental conditions. The results obtianed using the current or sophisticated techniques are compared and discussed. © 1981.

Analysis of coatings on flat glasses using combined techniques

BATTAGLIN, GIANCARLO;DELLA MEA, GIANANTONIO;DE MARCHI, GIOVANNA;MAZZOLDI, PAOLO;GUGLIELMI, MASSIMO
1981

Abstract

Various inorganic films deposited on flat glass surfaces were analysed using large angle diffusion (Rutherford backscattering) of 1.8 MeV 4He+ ions, scanning electron microscopy, spectrophotometry, electron microprobe analysis, X-ray fluorescence and diffractometric analysis. The aim of the research was to establish the composition, thickness and homogeneity of coatings deposited under different experimental conditions. The results obtianed using the current or sophisticated techniques are compared and discussed. © 1981.
1981
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2503608
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