A novel ESD protection implementation based on LIGBT component is presented for 0.35 mum Smart Power HV devices on SOI substrate. A Single Stage LIGBT was designed, characterized and simulated. SOA boundaries are investigated in TLP regime. ESD performances improvements achieved using LIGBT devices are highlighted and a comparison with NDRIFTMOS-based active clamps is presented.

Novel 190V LIGBT-based ESD protection for 0.35μm Smart Power technology realized on SOI substrate

TAZZOLI, AUGUSTO;MENEGHESSO, GAUDENZIO
2008

Abstract

A novel ESD protection implementation based on LIGBT component is presented for 0.35 mum Smart Power HV devices on SOI substrate. A Single Stage LIGBT was designed, characterized and simulated. SOA boundaries are investigated in TLP regime. ESD performances improvements achieved using LIGBT devices are highlighted and a comparison with NDRIFTMOS-based active clamps is presented.
2008
30th Electrical Overstress/Electrostatic Discharge Symposium Proc., EOS/ESD 200
9781585371464
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2448881
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