In this paper the immunity of a Kuijk bandgap towards Electromagnetic Interferences (EMI) superimposed to the supply voltage is investigated. The attention is focused on the bandgap cell itself, verifying that it is the main responsible of the voltage reference malfunction. The most important stray components, responsible for a correct device emulation in the presence of radio frequency noises, are highlighted. A simplified theoretical analyses is presented, demonstrating the main aspect responsible of the device wrong operation and suggesting a fast alternative way for bandgap immunity simulation. Finally some proposals are presented to reduce the voltage reference susceptibility towards interferences on power supply net.

Kuijk Bandgap Susceptibility to RF Interferences: Measurements, Modeling and Provisions

ORIETTI, ENRICO;MONTEMEZZO, NICOLA;BUSO, SIMONE;NEVIANI, ANDREA;MENEGHESSO, GAUDENZIO;SPIAZZI, GIORGIO
2006

Abstract

In this paper the immunity of a Kuijk bandgap towards Electromagnetic Interferences (EMI) superimposed to the supply voltage is investigated. The attention is focused on the bandgap cell itself, verifying that it is the main responsible of the voltage reference malfunction. The most important stray components, responsible for a correct device emulation in the presence of radio frequency noises, are highlighted. A simplified theoretical analyses is presented, demonstrating the main aspect responsible of the device wrong operation and suggesting a fast alternative way for bandgap immunity simulation. Finally some proposals are presented to reduce the voltage reference susceptibility towards interferences on power supply net.
2006
Proceedings 3rd EOS/ESD/EMI workshop
3rd EOS/ESD/EMI WORKSHOP, “Immunity of electronic applications to electrical (EOS/ESD) and electromagnetic (EMI) stresses: From system to chip level
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2433295
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